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Defect Oriented Testing Cmos by Sachdev Manoj (19 results)
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hardcover. Condition: Very Good. Connecting readers with great books since 1972! Used books may not include companion materials, and may have some shelf wear or limited writing. We ship orders daily and Customer Service is our top priority!
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Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits
Published by New Age International Publisher, 2010
ISBN 10: 8184894295 ISBN 13: 9788184894295
Language: English
US$ 32.17
Convert currencyFree shipping from Australia to U.S.A.Quantity: 1 available
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Condition: very_good. This books is in Very good condition. There may be a few flaws like shelf wear and some light wear.
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Hardcover. Condition: Good. Connecting readers with great books since 1972! Used textbooks may not include companion materials such as access codes, etc. May have some wear or writing/highlighting. We ship orders daily and Customer Service is our top priority!
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US$ 40.18
Convert currencyUS$ 122.88 shipping from Germany to U.S.A.Quantity: 1 available
Add to basketCondition: Sehr gut. Zustand: Sehr gut | Sprache: Englisch | Produktart: Bücher.
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Condition: New. pp. 352 2nd Edition.
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Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits (Frontiers in Electronic Testing, 34)
Seller: Ria Christie Collections, Uxbridge, United Kingdom
Seller rating 5 out of 5 stars
US$ 186.98
Convert currencyUS$ 16.21 shipping from United Kingdom to U.S.A.Quantity: Over 20 available
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US$ 202.29
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Add to basketCondition: New. pp. 352 52:B&W 6.14 x 9.21in or 234 x 156mm (Royal 8vo) Case Laminate on White w/Gloss Lam.
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Condition: New. SUPER FAST SHIPPING.
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Condition: New. SUPER FAST SHIPPING.
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US$ 230.23
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US$ 230.69
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Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits (Frontiers in Electronic Testing, 34)
Seller: Ria Christie Collections, Uxbridge, United Kingdom
Seller rating 5 out of 5 stars
US$ 266.57
Convert currencyUS$ 16.21 shipping from United Kingdom to U.S.A.Quantity: Over 20 available
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US$ 260.69
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Add to basketHardcover. Condition: Like New. Like New. book.
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US$ 349.21
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Add to basketPaperback. Condition: Brand New. 2nd edition. 349 pages. 9.10x6.10x0.90 inches. In Stock.
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US$ 352.23
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Add to basketHardcover. Condition: Brand New. 2nd edition. 328 pages. 9.25x6.25x0.75 inches. In Stock.
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US$ 217.06
Convert currencyUS$ 57.33 shipping from Germany to U.S.A.Quantity: Over 20 available
Add to basketCondition: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Wide coverage of topics in test engineeringUnique defect-oriented focus of the materialsIntroduction to yield engineering common practicesThe 2nd edition of defect oriented testing has been extensively updated. New cha.
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US$ 217.06
Convert currencyUS$ 57.33 shipping from Germany to U.S.A.Quantity: Over 20 available
Add to basketCondition: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Wide coverage of topics in test engineeringUnique defect-oriented focus of the materialsIntroduction to yield engineering common practicesThe 2nd edition of defect oriented testing has been extensively updated. New cha.
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US$ 364.44
Convert currencyUS$ 11.64 shipping from Germany to U.S.A.Quantity: 4 available
Add to basketCondition: New. PRINT ON DEMAND pp. 352.
