Defect Recognition Image Processing by Doneker Rechenberg (4 results)
- Hardcover
Seller: Chiron Media, Wallingford, United KingdomChiron Media
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Hardcover. Condition: New. Brand new book, sourced directly from publisher. Dispatch time is 7-8 days from our warehouse. Book will be sent in robust, secure packaging to ensure it reaches you securely.
- Hardcover
Seller: California Books, Miami, FL, U.S.A.California Books
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Condition: New.
- Hardcover
Seller: Biblios, frankfurt am main, HESSE, GermanyBiblios
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Condition: New. pp. 548.
- Hardcover
- Print on Demand
Seller: moluna, Greven, Germanymoluna
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US$ 371.24
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Gebunden. Condition: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Doneker, J.Defect Recognition and Image Processing in Semiconductors 1997 provides a valuable overview of current techniques used to assess, monitor, and characterize defects from the atomic scale to inhomogeneities in complete silicon wafers. This .…
