Design Testability Test Optimization by Lan Deng· (1 results)
- Softcover
Seller: liu xing, Nanjing, JS, Chinaliu xing
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paperback. Condition: New. Language:Chinese.Paperback. Pub Date: 2024-06 Publisher: China Machine Press Testing is a method used to ensure the stability and effectiveness of integrated circuits. and is an indispensable and important means throughout all aspects of integrated circuit manufacturing. The particularity of the TSV-ba…sed 3D stacked integrated circuit structure and the variability of the design process bring new problems and challenges to the testing process. This book first discusses the basic concepts. basi.
