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High Resolution X Ray Scattering Thin by Pietsch Ullrich (27 results)
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hardcover. Condition: Good. Connecting readers with great books since 1972! Used textbooks may not include companion materials such as access codes, etc. May have some wear or writing/highlighting. We ship orders daily and Customer Service is our top priority!
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US$ 30.82
Convert currencyUS$ 18.77 shipping from Germany to U.S.A.Quantity: 1 available
Add to basketHardcover. 2nd ed. XVI, 408 Ex-library with stamp and library-signature. GOOD condition, some traces of use. Ehem. Bibliotheksexemplar mit Signatur und Stempel. GUTER Zustand, ein paar Gebrauchsspuren. C-05638 9780387400921 Sprache: Englisch Gewicht in Gramm: 550.
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US$ 52.74
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Add to baskethardcover. Condition: Very Good. High-Resolution X-Ray Scattering: From Thin Films to Lateral Nanostructures (Advanced Texts in Physics) This book is in very good condition and will be shipped within 24 hours of ordering. The cover may have some limited signs of wear but the pages are clean, intact and the spine remains undamaged. This book has clearly been well maintained and looked after thus far. Money back guarantee if you are not satisfied. See all our books here, order more than 1 book and get discounted shipping. .
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US$ 52.74
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Add to baskethardcover. Condition: Very Good. Shipped within 24 hours from our UK warehouse. Clean, undamaged book with no damage to pages and minimal wear to the cover. Spine still tight, in very good condition. Remember if you are not happy, you are covered by our 100% money back guarantee.
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US$ 31.06
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Add to basketHardcover. Ex-library with stamp and library-signature. GOOD condition, some traces of use. C-02760 9783540620297 Sprache: Englisch Gewicht in Gramm: 1050.
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High-Resolution X-Ray Scattering: From Thin Films to Lateral Nanostructures
Seller: Ria Christie Collections, Uxbridge, United Kingdom
Seller rating 5 out of 5 stars
US$ 63.34
Convert currencyUS$ 16.15 shipping from United Kingdom to U.S.A.Quantity: Over 20 available
Add to basketCondition: New. In English.
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Hardcover. Condition: new. Excellent Condition.Excels in customer satisfaction, prompt replies, and quality checks.
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US$ 52.23
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Add to basketHardcover. Condition: Very Good. 2. Auflage. Unread, some shelfwear. Immediately dispatched from Germany.
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Condition: New.
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US$ 106.55
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Condition: As New. Unread book in perfect condition.
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High-Resolution X-Ray Scattering: From Thin Films to Lateral Nanostructures (Advanced Texts in Physics)
Seller: Ria Christie Collections, Uxbridge, United Kingdom
Seller rating 5 out of 5 stars
US$ 109.85
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US$ 106.69
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Add to basketHardcover. Condition: New.
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High-Resolution X-Ray Scattering : From Thin Films to Lateral Nanostructures
Seller: GreatBookPricesUK, Woodford Green, United Kingdom
Seller rating 5 out of 5 stars
US$ 110.12
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Condition: New.
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US$ 109.99
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Add to basketPF. Condition: New.
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Condition: As New. Unread book in perfect condition.
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High-Resolution X-Ray Scattering : From Thin Films to Lateral Nanostructures
Seller: GreatBookPricesUK, Woodford Green, United Kingdom
Seller rating 5 out of 5 stars
US$ 116.71
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hardcover. Condition: New. In shrink wrap. Looks like an interesting title!
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US$ 148.22
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High-Resolution X-Ray Scattering: From Thin Films to Lateral Nanostructures (Advanced Texts in Physics)
Seller: Ria Christie Collections, Uxbridge, United Kingdom
Seller rating 5 out of 5 stars
US$ 164.40
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High-Resolution X-Ray Scattering : From Thin Films to Lateral Nanostructures
Published by Springer New York, Springer US, 2011
ISBN 10: 1441923071 ISBN 13: 9781441923073
Language: English
US$ 121.99
Convert currencyUS$ 74.19 shipping from Germany to U.S.A.Quantity: 1 available
Add to basketTaschenbuch. Condition: Neu. Druck auf Anfrage Neuware - Printed after ordering - During the last 20 years interest in high-resolution x-ray diffractometry and reflectivity has grown as a result of the development of the semiconductor industry and the increasing interest in material research of thin layers of magnetic, organic, and other materials. For example, optoelectronics requires a subsequent epitaxy of thin layers of different semiconductor materials. Here, the individuallayer thicknesses are scaled down to a few atomic layers in order to exploit quantum effects. For reasons of electronic and optical confinement, these thin layers are embedded within much thicker cladding layers or stacks of multilayers of slightly different chemical composition. It is evident that the interface quality of those quantum weHs is quite important for the function of devices. Thin metallic layers often show magnetic properties which do not ap pear for thick layers or in bulk material. The investigation of the mutual interaction of magnetic and non-magnetic layers leads to the discovery of colossal magnetoresistance, for example. This property is strongly related to the thickness and interface roughness of covered layers.
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US$ 163.38
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Add to basketPaperback. Condition: Brand New. 2nd edition. 410 pages. 9.00x6.00x1.00 inches. In Stock.
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High-Resolution X-Ray Scattering: From Thin Films to Lateral Nanostructures (Advanced Texts in Physics)
Seller: THE SAINT BOOKSTORE, Southport, United Kingdom
Seller rating 5 out of 5 stars
US$ 183.70
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Add to basketHardcover. Condition: New. This item is printed on demand. New copy - Usually dispatched within 5-9 working days.
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US$ 206.98
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Add to basketHardcover. Condition: Brand New. 2nd edition. 408 pages. 9.25x6.25x1.00 inches. In Stock. This item is printed on demand.
