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High Resolution X Ray Scattering Thin by Pietsch Ullrich (23 results)
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Hardcover. 2nd ed. XVI, 408 Ex-library with stamp and library-signature. GOOD condition, some traces of use. Ehem. Bibliotheksexemplar mit Signatur und Stempel. GUTER Zustand, ein paar Gebrauchsspuren. C-05638 9780387400921 Sprache: Englisch Gewicht in Gramm: 550.
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High-Resolution X-Ray Scattering: From Thin Films to Lateral Nanostructures
Seller: Ria Christie Collections, Uxbridge, United Kingdom
Seller rating 5 out of 5 stars
US$ 60.80
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Ships from United Kingdom to U.S.A.Quantity: Over 20 available
Add to basketCondition: New. In English.
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Hardcover. Ex-library with stamp and library-signature. GOOD condition, some traces of use. C-02760 9783540620297 Sprache: Englisch Gewicht in Gramm: 1050.
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Hardcover. Condition: new. Excellent Condition.Excels in customer satisfaction, prompt replies, and quality checks.
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Hardcover. Condition: Very Good. 2. Auflage. Unread, some shelfwear. Immediately dispatched from Germany.
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US$ 84.95
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High-Resolution X-Ray Scattering : From Thin Films to Lateral Nanostructures
Seller: GreatBookPricesUK, Woodford Green, United Kingdom
Seller rating 5 out of 5 stars
US$ 86.63
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High-Resolution X-Ray Scattering: From Thin Films to Lateral Nanostructures (Advanced Texts in Physics)
Seller: Ria Christie Collections, Uxbridge, United Kingdom
Seller rating 5 out of 5 stars
US$ 108.84
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US$ 108.73
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hardcover. Condition: New. In shrink wrap. Looks like an interesting title!
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High-Resolution X-Ray Scattering: From Thin Films to Lateral Nanostructures (Advanced Texts in Physics)
Seller: Ria Christie Collections, Uxbridge, United Kingdom
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US$ 156.88
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US$ 163.14
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Add to basketPaperback. Condition: Brand New. 2nd edition. 410 pages. 9.00x6.00x1.00 inches. In Stock.
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Taschenbuch. Condition: Neu. High-Resolution X-Ray Scattering | From Thin Films to Lateral Nanostructures | Ullrich Pietsch (u. a.) | Taschenbuch | xvi | Englisch | 2011 | Springer | EAN 9781441923073 | Verantwortliche Person für die EU: Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg, juergen[dot]hartmann[at]springer[dot]com | Anbieter: preigu.
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High-Resolution X-Ray Scattering : From Thin Films to Lateral Nanostructures
Seller: GreatBookPricesUK, Woodford Green, United Kingdom
Seller rating 5 out of 5 stars
US$ 170.17
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US$ 159.21
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Add to basketHardcover. Condition: Like New. Like New. book.
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High-Resolution X-Ray Scattering : From Thin Films to Lateral Nanostructures
Published by Springer New York, Springer US, 2011
ISBN 10: 1441923071 ISBN 13: 9781441923073
Language: English
Taschenbuch. Condition: Neu. Druck auf Anfrage Neuware - Printed after ordering - During the last 20 years interest in high-resolution x-ray diffractometry and reflectivity has grown as a result of the development of the semiconductor industry and the increasing interest in material research of thin layers of magnetic, organic, and other materials. For example, optoelectronics requires a subsequent epitaxy of thin layers of different semiconductor materials. Here, the individuallayer thicknesses are scaled down to a few atomic layers in order to exploit quantum effects. For reasons of electronic and optical confinement, these thin layers are embedded within much thicker cladding layers or stacks of multilayers of slightly different chemical composition. It is evident that the interface quality of those quantum weHs is quite important for the function of devices. Thin metallic layers often show magnetic properties which do not ap pear for thick layers or in bulk material. The investigation of the mutual interaction of magnetic and non-magnetic layers leads to the discovery of colossal magnetoresistance, for example. This property is strongly related to the thickness and interface roughness of covered layers.
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Condition: As New. Unread book in perfect condition.
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High-Resolution X-Ray Scattering from Thin Films and Multilayers (Springer Tracts in Modern Physics)
Book 59 of 227: Springer Tracts in Modern PhysicsUS$ 288.22
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Add to basketHardcover. Condition: Like New. LIKE NEW. SHIPS FROM MULTIPLE LOCATIONS. book.
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High-Resolution X-Ray Scattering: From Thin Films to Lateral Nanostructures (Advanced Texts in Physics)
Seller: THE SAINT BOOKSTORE, Southport, United Kingdom
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US$ 181.61
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Add to basketHardcover. Condition: New. This item is printed on demand. New copy - Usually dispatched within 5-9 working days.
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US$ 206.45
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Add to basketHardcover. Condition: Brand New. 2nd edition. 408 pages. 9.25x6.25x1.00 inches. In Stock. This item is printed on demand.
