Structural Syntactic Statistical Pattern (161 results)

Structural, Syntactic, and Statistical Pattern Recognition : Joint Iapr International Workshops, S+sspr 2020, Padua, Italy, January 21?22, 2021, Proceedings
Torsello, Andrea (EDT); Rossi, Luca (EDT); Pelillo, Marcello (EDT); Biggio, Battista (EDT); Robles-kelly, Antonio (EDT)
Language: English
Published by Springer, 2021
Series: Lecture Notes in Computer Science, Book 88 of 129. Book 88 of 129 - Lecture Notes in Computer Science
- Softcover
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Structural, Syntactic, and Statistical Pattern Recognition : Joint Iapr International Workshop, S+sspr 2014, Joensuu, Finland, August 20-22, 2014, Proceedings
Fränti, Pasi (EDT); Brown, Gavin (EDT); Loog, Marco (EDT); Escolano, Francisco (EDT); Pelillo, Marcello (EDT)
- Softcover
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Structural, Syntactic, and Statistical Pattern Recognition : Joint Iapr International Workshop, S+sspr 2016, Mérida, Mexico, November 29 - December 2, 2016, Proceedings
Robles-kelly, Antonio (EDT); Loog, Marco (EDT); Biggio, Battista (EDT); Escolano, Francisco (EDT); Wilson, Richard (EDT)
- Softcover
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Structural, Syntactic, and Statistical Pattern Recognition : Joint Iapr International Workshop, S+sspr 2018, Beijing, China, August 17?19, 2018, Proceedings
Bai, Xiao (EDT); Hancock, Edwin R. (EDT); Ho, Tin Kam (EDT); Wilson, Richard C. (EDT); Biggio, Battista (EDT)
Language: English
Published by Springer, 2018
Series: Lecture Notes in Computer Science, Book 18 of 300. Book 18 of 300 - Lecture Notes in Computer Science
- Softcover
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Structural, Syntactic, and Statistical Pattern Recognition : Joint Iapr International Workshop, Sspr & Spr 2012, Hiroshima, Japan, November 7-9, 2012, Proceedings
Gimel'Farb, Georgy (EDT); Hancock, Edwin (EDT); Imiya, Atsushi (EDT); Kuijper, Arjan (EDT); Kudo, Mineichi (EDT)
- Softcover
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Language: English
Published by Springer, 2021
Series: Lecture Notes in Computer Science, Book 88 of 129. Book 88 of 129 - Lecture Notes in Computer Science
- Softcover
Seller: California Books, Miami, FL, U.S.A.California Books
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Structural, Syntactic, and Statistical Pattern Recognition : Joint Iapr International Workshops, S+sspr 2020, Padua, Italy, January 21?22, 2021, Proceedings
Torsello, Andrea (EDT); Rossi, Luca (EDT); Pelillo, Marcello (EDT); Biggio, Battista (EDT); Robles-kelly, Antonio (EDT)
Language: English
Published by Springer, 2021
Series: Lecture Notes in Computer Science, Book 88 of 129. Book 88 of 129 - Lecture Notes in Computer Science
- Softcover
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Structural, Syntactic, and Statistical Pattern Recognition : Joint Iapr International Workshop, S+sspr 2014, Joensuu, Finland, August 20-22, 2014, Proceedings
Fränti, Pasi (EDT); Brown, Gavin (EDT); Loog, Marco (EDT); Escolano, Francisco (EDT); Pelillo, Marcello (EDT)
- Softcover
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Structural, Syntactic, and Statistical Pattern Recognition : Joint Iapr International Workshop, S+sspr 2018, Beijing, China, August 17?19, 2018, Proceedings
Bai, Xiao (EDT); Hancock, Edwin R. (EDT); Ho, Tin Kam (EDT); Wilson, Richard C. (EDT); Biggio, Battista (EDT)
Language: English
Published by Springer, 2018
Series: Lecture Notes in Computer Science, Book 18 of 300. Book 18 of 300 - Lecture Notes in Computer Science
- Softcover
Seller: GreatBookPrices, Columbia, MD, U.S.A.GreatBookPrices
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Language: English
Published by Springer, 2021
Series: Lecture Notes in Computer Science, Book 88 of 129. Book 88 of 129 - Lecture Notes in Computer Science
- Softcover
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Language: English
Published by Springer, 2018
Series: Lecture Notes in Computer Science, Book 18 of 300. Book 18 of 300 - Lecture Notes in Computer Science
- Softcover
Seller: Ria Christie Collections, Uxbridge, United KingdomRia Christie Collections
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Structural, Syntactic, and Statistical Pattern Recognition: Joint IAPR International Workshop, S+SSPR 2014, Joensuu, Finland, August 20-22, 2014, Proceedings (Lecture Notes in Computer Science)
Pasi Fr�nti, Francisco Escolano, Marcello Pelillo, Marco Loog, Gavin Brown
- Softcover
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Structural, Syntactic, and Statistical Pattern Recognition: Joint IAPR International Workshop, S+SSPR 2018, Beijing, China, August 17-19, 2018, Proceedings (Lecture Notes in Computer Science)
Xiao Bai, Edwin R. Hancock, Tin Kam Ho, Richard C. Wilson, Battista Biggio, Antonio Robles-Kelly
Language: English
Published by Springer 2018-08-02, 2018
Series: Lecture Notes in Computer Science, Book 18 of 300. Book 18 of 300 - Lecture Notes in Computer Science
- Softcover
Seller: Chiron Media, Wallingford, United KingdomChiron Media
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Structural, Syntactic, and Statistical Pattern Recognition : Joint Iapr International Workshop, S+sspr 2018, Beijing, China, August 17?19, 2018, Proceedings
Bai, Xiao (EDT); Hancock, Edwin R. (EDT); Ho, Tin Kam (EDT); Wilson, Richard C. (EDT); Biggio, Battista (EDT)
Language: English
Published by Springer, 2018
Series: Lecture Notes in Computer Science, Book 18 of 300. Book 18 of 300 - Lecture Notes in Computer Science
- Softcover
Seller: GreatBookPricesUK, Woodford Green, United KingdomGreatBookPricesUK
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Structural, Syntactic, and Statistical Pattern Recognition : Joint Iapr International Workshops, S+sspr 2020, Padua, Italy, January 21?22, 2021, Proceedings
Torsello, Andrea (EDT); Rossi, Luca (EDT); Pelillo, Marcello (EDT); Biggio, Battista (EDT); Robles-kelly, Antonio (EDT)
Language: English
Published by Springer, 2021
Series: Lecture Notes in Computer Science, Book 88 of 129. Book 88 of 129 - Lecture Notes in Computer Science
- Softcover
Seller: GreatBookPricesUK, Woodford Green, United KingdomGreatBookPricesUK
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Structural, Syntactic, and Statistical Pattern Recognition : Joint Iapr International Workshop, S+sspr 2016, Mérida, Mexico, November 29 - December 2, 2016, Proceedings
Robles-kelly, Antonio (EDT); Loog, Marco (EDT); Biggio, Battista (EDT); Escolano, Francisco (EDT); Wilson, Richard (EDT)
- Softcover
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Structural, Syntactic, and Statistical Pattern Recognition : Joint Iapr International Workshop, S+sspr 2014, Joensuu, Finland, August 20-22, 2014, Proceedings
Fränti, Pasi (EDT); Brown, Gavin (EDT); Loog, Marco (EDT); Escolano, Francisco (EDT); Pelillo, Marcello (EDT)
- Softcover
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Structural, Syntactic, and Statistical Pattern Recognition : Joint Iapr International Workshop, Sspr & Spr 2012, Hiroshima, Japan, November 7-9, 2012, Proceedings
Gimel'Farb, Georgy (EDT); Hancock, Edwin (EDT); Imiya, Atsushi (EDT); Kuijper, Arjan (EDT); Kudo, Mineichi (EDT)
- Softcover
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Language: English
Published by Springer, 2021
Series: Lecture Notes in Computer Science, Book 88 of 129. Book 88 of 129 - Lecture Notes in Computer Science
- Softcover
Seller: Books Puddle, New York, NY, U.S.A.Books Puddle
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Structural, Syntactic, and Statistical Pattern Recognition : Joint Iapr International Workshop, S+sspr 2014, Joensuu, Finland, August 20-22, 2014, Proceedings
Fränti, Pasi (EDT); Brown, Gavin (EDT); Loog, Marco (EDT); Escolano, Francisco (EDT); Pelillo, Marcello (EDT)
- Softcover
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Structural, Syntactic, and Statistical Pattern Recognition : Joint Iapr International Workshops, S+sspr 2020, Padua, Italy, January 21?22, 2021, Proceedings
Torsello, Andrea (EDT); Rossi, Luca (EDT); Pelillo, Marcello (EDT); Biggio, Battista (EDT); Robles-kelly, Antonio (EDT)
Language: English
Published by Springer, 2021
Series: Lecture Notes in Computer Science, Book 88 of 129. Book 88 of 129 - Lecture Notes in Computer Science
- Softcover
Seller: GreatBookPricesUK, Woodford Green, United KingdomGreatBookPricesUK
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Structural, Syntactic, and Statistical Pattern Recognition : Joint Iapr International Workshop, S+sspr 2018, Beijing, China, August 17?19, 2018, Proceedings
Bai, Xiao (EDT); Hancock, Edwin R. (EDT); Ho, Tin Kam (EDT); Wilson, Richard C. (EDT); Biggio, Battista (EDT)
Language: English
Published by Springer, 2018
Series: Lecture Notes in Computer Science, Book 18 of 300. Book 18 of 300 - Lecture Notes in Computer Science
- Softcover
Seller: GreatBookPricesUK, Woodford Green, United KingdomGreatBookPricesUK
Contact seller5-star sellerCondition: Used - As new
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Language: English
Published by Springer, 2018
Series: Lecture Notes in Computer Science, Book 18 of 300. Book 18 of 300 - Lecture Notes in Computer Science
- Softcover
Seller: Books Puddle, New York, NY, U.S.A.Books Puddle
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Condition: New. 1st ed. 2018 edition NO-PA16APR2015-KAP.