Syntactic Structural Pattern Recognition (168 results)
Language: English
Published by Springer-Verlag Berlin and Heidelberg GmbH & Co. K, 1988
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Seller: Ammareal, Morangis, FranceAmmareal
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Hardcover. Condition: Très bon. Ancien livre de bibliothèque. Edition 1988. Ammareal reverse jusqu'à 15% du prix net de cet article à des organisations caritatives. ENGLISH DESCRIPTION Book Condition: Used, Very good. Former library book. Edition 1988. Ammareal gives back up to 15% of this item's net price to charity organizatio…ns.
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Condition: Good. *Price HAS BEEN REDUCED by 10% until Monday, Aug. 3 (weekend sale item)* 467 pp., hardcover, ex library else text clean & binding tight. - If you are reading this, this item is actually (physically) in our stock and ready for shipment once ordered. We are not bookjackers. Buyer is responsible for any additional…duties, taxes, or fees required by recipient's country.
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Structural, Syntactic, and Statistical Pattern Recognition : Joint Iapr International Workshop, S+sspr 2014, Joensuu, Finland, August 20-22, 2014, Proceedings
Fränti, Pasi (EDT); Brown, Gavin (EDT); Loog, Marco (EDT); Escolano, Francisco (EDT); Pelillo, Marcello (EDT)
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Structural, Syntactic, and Statistical Pattern Recognition : Joint Iapr International Workshops, S+sspr 2020, Padua, Italy, January 21?22, 2021, Proceedings
Torsello, Andrea (EDT); Rossi, Luca (EDT); Pelillo, Marcello (EDT); Biggio, Battista (EDT); Robles-kelly, Antonio (EDT)
Language: English
Published by Springer, 2021
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Structural, Syntactic, and Statistical Pattern Recognition : Joint Iapr International Workshop, S+sspr 2016, Mérida, Mexico, November 29 - December 2, 2016, Proceedings
Robles-kelly, Antonio (EDT); Loog, Marco (EDT); Biggio, Battista (EDT); Escolano, Francisco (EDT); Wilson, Richard (EDT)
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Structural, Syntactic, and Statistical Pattern Recognition : Joint Iapr International Workshop, S+sspr 2018, Beijing, China, August 17?19, 2018, Proceedings
Bai, Xiao (EDT); Hancock, Edwin R. (EDT); Ho, Tin Kam (EDT); Wilson, Richard C. (EDT); Biggio, Battista (EDT)
Language: English
Published by Springer, 2018
- Softcover
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Structural, Syntactic, and Statistical Pattern Recognition : Joint Iapr International Workshop, Sspr & Spr 2012, Hiroshima, Japan, November 7-9, 2012, Proceedings
Gimel'Farb, Georgy (EDT); Hancock, Edwin (EDT); Imiya, Atsushi (EDT); Kuijper, Arjan (EDT); Kudo, Mineichi (EDT)
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Seller: Wissenschaftl. Antiquariat Th. Haker e.K, Klettgau, GermanyWissenschaftl. Antiquariat Th. Haker e.K
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hardcover. Condition: Wie neu. 486 p. Like new. ISBN: 9783540192091 Sprache: Englisch Gewicht in Gramm: 1026.
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Language: English
Published by Springer, 2021
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Structural, Syntactic, and Statistical Pattern Recognition : Joint Iapr International Workshops, S+sspr 2020, Padua, Italy, January 21?22, 2021, Proceedings
Torsello, Andrea (EDT); Rossi, Luca (EDT); Pelillo, Marcello (EDT); Biggio, Battista (EDT); Robles-kelly, Antonio (EDT)
Language: English
Published by Springer, 2021
- Softcover
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Structural, Syntactic, and Statistical Pattern Recognition : Joint Iapr International Workshop, S+sspr 2014, Joensuu, Finland, August 20-22, 2014, Proceedings
Fränti, Pasi (EDT); Brown, Gavin (EDT); Loog, Marco (EDT); Escolano, Francisco (EDT); Pelillo, Marcello (EDT)
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Structural, Syntactic, and Statistical Pattern Recognition : Joint Iapr International Workshop, S+sspr 2018, Beijing, China, August 17?19, 2018, Proceedings
Bai, Xiao (EDT); Hancock, Edwin R. (EDT); Ho, Tin Kam (EDT); Wilson, Richard C. (EDT); Biggio, Battista (EDT)
Language: English
Published by Springer, 2018
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Language: English
Published by Springer, 2021
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Seller: Ria Christie Collections, Uxbridge, United KingdomRia Christie Collections
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Language: English
Published by Springer, 2018
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Structural, Syntactic, and Statistical Pattern Recognition: Joint IAPR International Workshop, S+SSPR 2014, Joensuu, Finland, August 20-22, 2014, Proceedings (Lecture Notes in Computer Science)
Pasi Fr�nti, Francisco Escolano, Marcello Pelillo, Marco Loog, Gavin Brown
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Structural, Syntactic, and Statistical Pattern Recognition: Joint IAPR International Workshop, S+SSPR 2018, Beijing, China, August 17-19, 2018, Proceedings (Lecture Notes in Computer Science)
Xiao Bai, Edwin R. Hancock, Tin Kam Ho, Richard C. Wilson, Battista Biggio, Antonio Robles-Kelly
Language: English
Published by Springer 2018-08-02, 2018
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Structural, Syntactic, and Statistical Pattern Recognition : Joint Iapr International Workshop, S+sspr 2018, Beijing, China, August 17?19, 2018, Proceedings
Bai, Xiao (EDT); Hancock, Edwin R. (EDT); Ho, Tin Kam (EDT); Wilson, Richard C. (EDT); Biggio, Battista (EDT)
Language: English
Published by Springer, 2018
- Softcover
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Structural, Syntactic, and Statistical Pattern Recognition : Joint Iapr International Workshop, S+sspr 2016, Mérida, Mexico, November 29 - December 2, 2016, Proceedings
Robles-kelly, Antonio (EDT); Loog, Marco (EDT); Biggio, Battista (EDT); Escolano, Francisco (EDT); Wilson, Richard (EDT)
- Softcover
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Structural, Syntactic, and Statistical Pattern Recognition : Joint Iapr International Workshop, S+sspr 2014, Joensuu, Finland, August 20-22, 2014, Proceedings
Fränti, Pasi (EDT); Brown, Gavin (EDT); Loog, Marco (EDT); Escolano, Francisco (EDT); Pelillo, Marcello (EDT)
- Softcover
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Structural, Syntactic, and Statistical Pattern Recognition : Joint Iapr International Workshops, S+sspr 2020, Padua, Italy, January 21?22, 2021, Proceedings
Torsello, Andrea (EDT); Rossi, Luca (EDT); Pelillo, Marcello (EDT); Biggio, Battista (EDT); Robles-kelly, Antonio (EDT)
Language: English
Published by Springer, 2021
- Softcover
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Structural, Syntactic, and Statistical Pattern Recognition : Joint Iapr International Workshop, Sspr & Spr 2012, Hiroshima, Japan, November 7-9, 2012, Proceedings
Gimel'Farb, Georgy (EDT); Hancock, Edwin (EDT); Imiya, Atsushi (EDT); Kuijper, Arjan (EDT); Kudo, Mineichi (EDT)
- Softcover
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