Syntactic Structural Pattern Recognition (162 results)
Structural, Syntactic, and Statistical Pattern Recognition : Joint Iapr International Workshops, S+sspr 2020, Padua, Italy, January 21?22, 2021, Proceedings
Torsello, Andrea (EDT); Rossi, Luca (EDT); Pelillo, Marcello (EDT); Biggio, Battista (EDT); Robles-kelly, Antonio (EDT)
Language: English
Published by Springer, 2021
- Softcover
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Structural, Syntactic, and Statistical Pattern Recognition : Joint Iapr International Workshop, S+sspr 2014, Joensuu, Finland, August 20-22, 2014, Proceedings
Fränti, Pasi (EDT); Brown, Gavin (EDT); Loog, Marco (EDT); Escolano, Francisco (EDT); Pelillo, Marcello (EDT)
- Softcover
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Structural, Syntactic, and Statistical Pattern Recognition : Joint Iapr International Workshop, S+sspr 2016, Mérida, Mexico, November 29 - December 2, 2016, Proceedings
Robles-kelly, Antonio (EDT); Loog, Marco (EDT); Biggio, Battista (EDT); Escolano, Francisco (EDT); Wilson, Richard (EDT)
- Softcover
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Structural, Syntactic, and Statistical Pattern Recognition : Joint Iapr International Workshop, S+sspr 2018, Beijing, China, August 17?19, 2018, Proceedings
Bai, Xiao (EDT); Hancock, Edwin R. (EDT); Ho, Tin Kam (EDT); Wilson, Richard C. (EDT); Biggio, Battista (EDT)
Language: English
Published by Springer, 2018
- Softcover
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Syntactic and Structural Pattern Recognition
Ferrate, Gabriel (EDT); Pavlidis, Theo (EDT); Sanfeliu, Alberto (EDT); Bunke, Horst (EDT)
- Softcover
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Seller: Wissenschaftl. Antiquariat Th. Haker e.K, Klettgau, GermanyWissenschaftl. Antiquariat Th. Haker e.K
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hardcover. Condition: Wie neu. 486 p. Like new. ISBN: 9783540192091 Sprache: Englisch Gewicht in Gramm: 1026.
Structural, Syntactic, and Statistical Pattern Recognition : Joint Iapr International Workshop, Sspr & Spr 2012, Hiroshima, Japan, November 7-9, 2012, Proceedings
Gimel'Farb, Georgy (EDT); Hancock, Edwin (EDT); Imiya, Atsushi (EDT); Kuijper, Arjan (EDT); Kudo, Mineichi (EDT)
- Softcover
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- Softcover
Seller: BargainBookStores, Grand Rapids, MI, U.S.A.BargainBookStores
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Paperback or Softback. Condition: New. Structural, Syntactic, and Statistical Pattern Recognition: Joint IAPR International Workshop, SSPR & SPR 2012, Hiroshima, Japan, November 7-9, 2012. Book.
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Language: English
Published by Springer, 2021
- Softcover
Seller: California Books, Miami, FL, U.S.A.California Books
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Structural, Syntactic, and Statistical Pattern Recognition : Joint Iapr International Workshops, S+sspr 2020, Padua, Italy, January 21?22, 2021, Proceedings
Torsello, Andrea (EDT); Rossi, Luca (EDT); Pelillo, Marcello (EDT); Biggio, Battista (EDT); Robles-kelly, Antonio (EDT)
Language: English
Published by Springer, 2021
- Softcover
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Structural, Syntactic, and Statistical Pattern Recognition : Joint Iapr International Workshop, S+sspr 2014, Joensuu, Finland, August 20-22, 2014, Proceedings
Fränti, Pasi (EDT); Brown, Gavin (EDT); Loog, Marco (EDT); Escolano, Francisco (EDT); Pelillo, Marcello (EDT)
- Softcover
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Structural, Syntactic, and Statistical Pattern Recognition : Joint Iapr International Workshop, S+sspr 2018, Beijing, China, August 17?19, 2018, Proceedings
Bai, Xiao (EDT); Hancock, Edwin R. (EDT); Ho, Tin Kam (EDT); Wilson, Richard C. (EDT); Biggio, Battista (EDT)
Language: English
Published by Springer, 2018
- Softcover
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- Softcover
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Structural, Syntactic and Statistical Pattern Recognition : Joint Iapr International Workshops, S+sspr 2024, Venice, Italy, September 9?10, 2024, Revised Selected Papers
Torsello, Andrea (EDT); Rossi, Luca (EDT); Cosmo, Luca (EDT); Minello, Giorgia (EDT)
- Softcover
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Structural, Syntactic, and Statistical Pattern Recognition : Joint Iapr International Workshop, S+sspr 2014, Joensuu, Finland, August 20-22, 2014, Proceedings
Fränti, Pasi (EDT); Brown, Gavin (EDT); Loog, Marco (EDT); Escolano, Francisco (EDT); Pelillo, Marcello (EDT)
- Softcover
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Structural, Syntactic, and Statistical Pattern Recognition : Joint Iapr International Workshop, S+sspr 2018, Beijing, China, August 17?19, 2018, Proceedings
Bai, Xiao (EDT); Hancock, Edwin R. (EDT); Ho, Tin Kam (EDT); Wilson, Richard C. (EDT); Biggio, Battista (EDT)
Language: English
Published by Springer, 2018
- Softcover
Seller: GreatBookPricesUK, Woodford Green, United KingdomGreatBookPricesUK
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Structural, Syntactic, and Statistical Pattern Recognition : Joint Iapr International Workshop, S+sspr 2016, Mérida, Mexico, November 29 - December 2, 2016, Proceedings
Robles-kelly, Antonio (EDT); Loog, Marco (EDT); Biggio, Battista (EDT); Escolano, Francisco (EDT); Wilson, Richard (EDT)
- Softcover
Seller: GreatBookPricesUK, Woodford Green, United KingdomGreatBookPricesUK
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Structural, Syntactic, and Statistical Pattern Recognition : Joint Iapr International Workshop, Sspr & Spr 2012, Hiroshima, Japan, November 7-9, 2012, Proceedings
Gimel'Farb, Georgy (EDT); Hancock, Edwin (EDT); Imiya, Atsushi (EDT); Kuijper, Arjan (EDT); Kudo, Mineichi (EDT)
- Softcover
Seller: GreatBookPricesUK, Woodford Green, United KingdomGreatBookPricesUK
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Structural, Syntactic and Statistical Pattern Recognition : Joint Iapr International Workshops, S+sspr 2024, Venice, Italy, September 9?10, 2024, Revised Selected Papers
Torsello, Andrea (EDT); Rossi, Luca (EDT); Cosmo, Luca (EDT); Minello, Giorgia (EDT)
- Softcover
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Structural, Syntactic, and Statistical Pattern Recognition : Joint Iapr International Workshops, S+sspr 2020, Padua, Italy, January 21?22, 2021, Proceedings
Torsello, Andrea (EDT); Rossi, Luca (EDT); Pelillo, Marcello (EDT); Biggio, Battista (EDT); Robles-kelly, Antonio (EDT)
Language: English
Published by Springer, 2021
- Softcover
Seller: GreatBookPricesUK, Woodford Green, United KingdomGreatBookPricesUK
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Structural, Syntactic, and Statistical Pattern Recognition : Joint Iapr International Workshop, S+sspr 2018, Beijing, China, August 17?19, 2018, Proceedings
Bai, Xiao (EDT); Hancock, Edwin R. (EDT); Ho, Tin Kam (EDT); Wilson, Richard C. (EDT); Biggio, Battista (EDT)
Language: English
Published by Springer, 2018
- Softcover
Seller: GreatBookPricesUK, Woodford Green, United KingdomGreatBookPricesUK
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Structural, Syntactic, and Statistical Pattern Recognition : Joint Iapr International Workshops, S+sspr 2020, Padua, Italy, January 21?22, 2021, Proceedings
Torsello, Andrea (EDT); Rossi, Luca (EDT); Pelillo, Marcello (EDT); Biggio, Battista (EDT); Robles-kelly, Antonio (EDT)
Language: English
Published by Springer, 2021
- Softcover
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Structural, Syntactic, and Statistical Pattern Recognition : Joint Iapr International Workshop, S+sspr 2014, Joensuu, Finland, August 20-22, 2014, Proceedings
Fränti, Pasi (EDT); Brown, Gavin (EDT); Loog, Marco (EDT); Escolano, Francisco (EDT); Pelillo, Marcello (EDT)
- Softcover
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Language: English
Published by Springer, 2021
- Softcover
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Language: English
Published by Springer, 2018
- Softcover
Seller: Books Puddle, Woodside, NY, U.S.A.Books Puddle
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Condition: New. 1st ed. 2018 edition NO-PA16APR2015-KAP.
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Condition: New. pp. 492.
Language: English
Published by Springer-Nature New York Inc, 2021
- Softcover
Seller: Revaluation Books, Exeter, United KingdomRevaluation Books
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Paperback. Condition: Brand New. 390 pages. 9.25x6.10x0.94 inches. In Stock.
Structural, Syntactic and Statistical Pattern Recognition: Joint Iapr International Workshops, S+sspr 2024, Venice, Italy, September 910, 2024, Revised Selected Papers
Torsello, Andrea (Editor)/ Rossi, Luca (Editor)/ Cosmo, Luca (Editor)/ Minello, Giorgia (Editor)
- Softcover
Seller: Revaluation Books, Exeter, United KingdomRevaluation Books
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Paperback. Condition: Brand New. 212 pages. 9.25x6.10x9.21 inches. In Stock.
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Paperback. Condition: Brand New. 2014 edition. 500 pages. 9.00x6.00x1.00 inches. In Stock.
