Transmission Electron Microscopy Diffractometry by Fultz Brent (33 results)

- Hardcover
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hardcover. Condition: Befriedigend. 778 Seiten; 9783540738855.4 Gewicht in Gramm: 2.

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Hardcover. Condition: Very Good. No Jacket. May have limited writing in cover pages. Pages are unmarked. ~ ThriftBooks: Read More, Spend Less.

Language: English
Published by Springer, 2014
- Softcover
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Language: English
Published by Springer, 2014
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Language: English
Published by Springer 2014-11-09, 2014
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Language: English
Published by Springer, 2014
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Language: English
Published by Springer, 2014
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Language: English
Published by Springer, 2014
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Language: English
Published by Springer, 2012
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Language: English
Published by Springer, 2012
- Hardcover
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Language: English
Published by Springer Auflage: 3rd ed. 2008. Corr. 2nd printing 2009, 2008
- Hardcover
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Hardcover. Condition: gut. This hugely successful and highly acclaimed text is designed to meet the needs of materials scientists at all levels. In this third edition readers get a fully updated and revised text, too. Fultz and Howe explain concepts of transmission electron microscopy (TEM) and x-ray diffractometry (XRD) that ar…e important for the characterization of materials. The edition has been updated to cover important technical developments, including the remarkable recent improvement in resolution of the TEM, and all chapters have been updated and revised for clarity. A new chapter on high resolution STEM methods has been added. Each chapter includes a set of problems to illustrate principles, and the extensive Appendix includes laboratory exercises. In englischer Sprache. 758 pages. 3,3 x 16 x 23,3 cm Auflage: 3rd ed. 2008. Corr. 2nd printing 2009.

- Hardcover
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More imagesLanguage: English
Published by Springer, 2014
- Softcover
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Taschenbuch. Condition: Neu. Transmission Electron Microscopy and Diffractometry of Materials | Brent Fultz (u. a.) | Taschenbuch | Graduate Texts in Physics | xx | Englisch | 2014 | Springer | EAN 9783642433153 | Verantwortliche Person für die EU: Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg, juergen[dot]hartmann[a…t]springer[dot]com | Anbieter: preigu.

Language: English
Published by Springer, 2014
- Softcover
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Language: English
Published by Springer, 2012
- Softcover
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Paperback. Condition: Brand New. 4th edition. 784 pages. 9.25x6.10x1.65 inches. In Stock.

Language: English
Published by Springer, 2014
- Softcover
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Language: English
Published by Springer, 2014
- Softcover
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Language: English
Published by Springer Spektrum, 2012
- Hardcover
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Buch. Condition: Neu. Druck auf Anfrage Neuware - Printed after ordering - This book explains concepts of transmission electron microscopy (TEM) and x-ray diffractometry (XRD) that are important for the characterization of materials. The fourth edition adds important new techniques of TEM such as electron tomography, nanobeam di…ffraction, and geometric phase analysis. A new chapter on neutron scattering completes the trio of x-ray, electron and neutron diffraction. All chapters were updated and revised for clarity. The book explains the fundamentals of how waves and wavefunctions interact with atoms in solids, and the similarities and differences of using x-rays, electrons, or neutrons for diffraction measurements. Diffraction effects of crystalline order, defects, and disorder in materials are explained in detail. Both practical and theoretical issues are covered. The book can be used in an introductory-level or advanced-level course, since sections are identified by difficulty. Each chapter includes a set of problems to illustrate principles, and the extensive Appendix includes laboratory exercises.

Language: English
Published by Springer, 2012
- Hardcover
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- Hardcover
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Language: English
Published by Springer, 2014
- Softcover
- Print on Demand
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Language: English
Published by Springer, 2012
- Hardcover
- Print on Demand
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Language: English
Published by Springer Berlin Heidelberg, 2014
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Condition: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. New edition of successful, well-reviewed textbook Provides an integrated coverage of transmission electron microscopy and x-ray diffractometry Shows how wave radiation probes the structure of materials Supports learni…ng and teaching .

Language: English
Published by Springer, 2014
- Softcover
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Language: English
Published by Springer, 2014
- Softcover
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