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Transmission Electron Microscopy Physics Image by Ludwig Reimer (26 results)
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Transmission electron microscopy: Physics of image formation and microanalysis (Springer series in optical sciences)
Seller: Tim's Used Books Provincetown Mass., Provincetown, MA, U.S.A.
Seller rating 5 out of 5 stars
Hardcover. Condition: Very Good. No marks in text. Not a library book. Ships in a cardboard enclosure. Thank you from Tim's Used Books, open shop in Provincetown, Massachusetts, founded 1991 on the idea of good books that don't have to cost a lot. 12 26 23.
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Transmission Electron Microscopy: Physics of Image Formation and Microanalysis
Seller: Ria Christie Collections, Uxbridge, United Kingdom
Seller rating 5 out of 5 stars
US$ 62.39
Convert currencyUS$ 15.91 shipping from United Kingdom to U.S.A.Quantity: Over 20 available
Add to basketCondition: New. In.
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Transmission Electron Microscopy: Physics of Image Formation and Microanalysis
Seller: Ria Christie Collections, Uxbridge, United Kingdom
Seller rating 5 out of 5 stars
US$ 62.39
Convert currencyUS$ 15.91 shipping from United Kingdom to U.S.A.Quantity: Over 20 available
Add to basketCondition: New. In.
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Transmission Electron Microscopy: Physics of Image Formation and Microanalysis
Seller: Ria Christie Collections, Uxbridge, United Kingdom
Seller rating 5 out of 5 stars
US$ 62.39
Convert currencyUS$ 15.91 shipping from United Kingdom to U.S.A.Quantity: Over 20 available
Add to basketCondition: New. In.
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Transmission Electron Microscopy: Physics of Image Formation and Microanalysis
Seller: Ria Christie Collections, Uxbridge, United Kingdom
Seller rating 5 out of 5 stars
US$ 62.39
Convert currencyUS$ 15.91 shipping from United Kingdom to U.S.A.Quantity: Over 20 available
Add to basketCondition: New. In.
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US$ 40.96
Convert currencyUS$ 46.37 shipping from Germany to U.S.A.Quantity: 1 available
Add to basketSoftcover. 545 p. Ehemaliges Bibliotheksexemplar mit Signatur und Stempel. Buch in akzeptablen Zustand mit mittlere Gebrauchsspuren. Buchblock Beschädigt! 9783540568490 Sprache: Englisch Gewicht in Gramm: 930.
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Hardcover. Condition: Fine. 4th Edition. EXCELLENT Unmarked PAGES And BINDING And COVER. Hardback. . No dust Jacket, as issued. Previous owner name on flyleaf. Published/printed by Springer, 1997. Fourth Edition. Approximately 6 X 9 ½. 584 pages.
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paperback. Condition: Good. Connecting readers with great books since 1972! Used textbooks may not include companion materials such as access codes, etc. May have some wear or writing/highlighting. We ship orders daily and Customer Service is our top priority!
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US$ 146.22
Convert currencyUS$ 11.59 shipping from Germany to U.S.A.Quantity: 1 available
Add to basketCondition: good. Befriedigend/Good: Durchschnittlich erhaltenes Buch bzw. Schutzumschlag mit Gebrauchsspuren, aber vollständigen Seiten. / Describes the average WORN book or dust jacket that has all the pages present.
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Transmission Electron Microscopy: Physics of Image Formation and Microanalysis
Published by Springer-Verlag Berlin and Heide, 1989
ISBN 10: 3540504990 ISBN 13: 9783540504993
Language: English
Seller: Books From California, Simi Valley, CA, U.S.A.
Seller rating 5 out of 5 stars
paperback. Condition: Very Good.
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Transmission Electron Microscopy: Physics of Image Formation and Microanalysis (Springer Series in Optical Sciences)
Published by Springer Nature, 1989
ISBN 10: 0387504990 ISBN 13: 9780387504995
Paperback. Condition: Good. Connecting readers with great books since 1972! Used textbooks may not include companion materials such as access codes, etc. May have some wear or writing/highlighting. We ship orders daily and Customer Service is our top priority!
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Transmission Electron Microscopy: Physics of Image Formation and Microanalysis. 4. ed.
Published by Berlin, Springer 1997., 1997
Seller: Antiquariat Löcker, Wien, Austria
Association Member: GIAQ ILAB VDA VDAO
Seller rating 5 out of 5 stars
US$ 81.19
Convert currencyUS$ 34.78 shipping from Austria to U.S.A.Quantity: 1 available
Add to basketXVI, 545 S. Mit graph. Darst. u. Literaturverz. OKst., wie neu. "(= Springer series in optical sciences ; Vol. 36)".
