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Methods of Measurement for Semiconductor Materials, Process Control, and Devices: Quarterly Report, July 1 to September 30, 1972 (Classic Reprint) - Hardcover

 
9780332767666: Methods of Measurement for Semiconductor Materials, Process Control, and Devices: Quarterly Report, July 1 to September 30, 1972 (Classic Reprint)

Synopsis

This book approaches semiconductor device fabrication, process control, and testing from a unique engineering perspective that emphasises the importance of materials characterisation and quality control to overall device performance. The author draws extensively on his own research in the Joint Program on Methods of Measurement for Semiconductor Materials, Process Control, and Devices to explore key concepts in device testing, particularly thermal properties, lifetime, defects, and bonding integrity. These methodologies are integral to the production of reliable devices, and their exploration makes up the main body of the work. The author draws attention to the importance of standardisation and collaboration between academics, researchers, and policymakers, highlighting the role played by ASTM and other similar international organizations in establishing measurement standards for semiconductor materials and processes. A significant reference work summarising and synthesising the author's research in a field where he is an undoubted global authority.

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W. Murray Bullis
Published by Forgotten Books, 2019
ISBN 10: 0332767663 ISBN 13: 9780332767666
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Stock Image

W. Murray Bullis
Published by Forgotten Books, 2019
ISBN 10: 0332767663 ISBN 13: 9780332767666
New Hardcover

Seller: PBShop.store UK, Fairford, GLOS, United Kingdom

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