A FORTRAN Program for Analysis of Ellipsometer Measurements and Calculation of Reflection Coefficients from Thin Films (Classic Reprint) - Hardcover
Synopsis
Understand how ellipsometry data is turned into film thickness and refractive index with a proven Fortran program.
This edition presents a Fortran program that calculates reflection coefficients for both single and multiple thin films, including absorbing films, and helps determine film thickness and refractive index from ellipsometer readings. It also covers how measurements can be corrected for instrument factors and how films on substrates are modeled, whether or not the film is homogeneous.
The text explains how ellipsometer readings relate to the optical constants of a surface and its films, and shows practical steps for inputting data and interpreting results. It provides guidance on using the program to analyze real measurements and to perform inverse calculations such as finding the film’s index of refraction or thickness from observed data.
- Compute ellipsometer readings and reflection coefficients for a film-covered surface.
- Determine film thickness from measurements for a given film and substrate.
- Extract the film’s refractive index from ellipsometer data when possible.
- Handle multiple films and absorbing materials, with options to correct for instrument effects.
Ideal for readers working with ellipsometry, thin films, and optical design who want a practical computational approach using Fortran.
"synopsis" may belong to another edition of this title.
