Baba Mamoru (6 results)
TERRESTRIAL NEUTRON-INDUCED SOFT ERROR IN ADVANCED MEMORY DEVICES
Nakamura, Takashi,Ibe, Eishi,Baba, Mamoru,Yahagi, Yasuo,Kameyama, Hideaki
- Hardcover
Seller: suffolkbooks, center moriches, NY, U.S.A.suffolkbooks
Contact seller5-star sellerCondition: Used - Very good
US$ 37.62
US$ 3.99 shippingShips within U.S.A.Quantity: 2 available
hardcover. Condition: Very Good. Fast Shipping - Safe and Secure 7 days a week.
Terrestrial Neutron-Induced Soft Errors in Advanced Memory Devices.
Nakamura, Takashi/Ibe, Eishi/Baba, Mamoru/Yahagi, Yasuo/Kameyama, Hideaki
- Hardcover
Seller: Universitätsbuchhandlung Herta Hold GmbH, Berlin, GermanyUniversitätsbuchhandlung Herta Hold GmbH
Contact seller4-star sellerCondition: Used
US$ 24.70
US$ 34.26 shippingShips from Germany to U.S.A.Quantity: 1 available
15 x 23 cm. 368 pages. Hardcover. Versand aus Deutschland / We dispatch from Germany via Air Mail. Einband bestoßen, daher Mängelexemplar gestempelt, sonst sehr guter Zustand. Imperfect copy due to slightly bumped cover, apart from this in very good condition. Stamped. Sprache: Englisch.
Terrestrial Neutron-Induced Soft Errors in Advanced Memory Devices
Nakamura, Takashi; Ibe, Eishi; Baba, Mamoru; Yahagi, Yasuo; Kameyama, Hideaki
- Hardcover
Seller: Romtrade Corp., STERLING HEIGHTS, MI, U.S.A.Romtrade Corp.
Contact seller5-star sellerCondition: New
US$ 116.25
Free ShippingShips within U.S.A.Quantity: 1 available
Condition: New. This is a Brand-new US Edition. This Item may be shipped from US or any other country as we have multiple locations worldwide.
Terrestrial Neutron-Induced Soft Errors in Advanced Memory Devices
Hideaki Kameyama Yasuo Yahagi Eishi Ibe Mamoru Baba Takashi Nakamura
Language: English
Published by World Scientific Publishing Company, Incorporated, 2008
- Hardcover
Seller: Books Puddle, New York, NY, U.S.A.Books Puddle
Contact seller4-star sellerCondition: Used
US$ 122.75
US$ 3.99 shippingShips within U.S.A.Quantity: 1 available
Condition: Used. pp. xxii + 343 Index.
Terrestrial Neutron-Induced Soft Errors in Advanced Memory Devices
Kameyama Hideaki Yahagi Yasuo Ibe Eishi Baba Mamoru Nakamura Takashi
Language: English
Published by World Scientific Publishing Company, Incorporated, 2008
- Hardcover
Seller: Majestic Books, Hounslow, United KingdomMajestic Books
Contact seller4-star sellerCondition: Used
US$ 124.43
US$ 8.71 shippingShips from United Kingdom to U.S.A.Quantity: 1 available
Condition: Used. pp. xxii + 343 Figures, Illus.
Terrestrial Neutron-Induced Soft Errors in Advanced Memory Devices
Kameyama Hideaki Yahagi Yasuo Ibe Eishi Baba Mamoru Nakamura Takashi
Language: English
Published by World Scientific Publishing Company, Incorporated, 2008
- Hardcover
Seller: Biblios, frankfurt am main, HESSE, GermanyBiblios
Contact seller4-star sellerCondition: Used
US$ 133.46
US$ 11.36 shippingShips from Germany to U.S.A.Quantity: 1 available
Condition: Used. pp. xxii + 343.
