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Ibe Eishi (34 results)
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TERRESTRIAL NEUTRON-INDUCED SOFT ERROR IN ADVANCED MEMORY DEVICES
Language: English
Published by World Scientific Publishing Comp, 2008
ISBN 10: 9812778810 ISBN 13: 9789812778819
hardcover. Condition: Very Good. Fast Shipping - Safe and Secure 7 days a week!
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Terrestrial Neutron-Induced Soft Errors in Advanced Memory Devices.
Language: English
Published by World Scientific Publishing Company., 2008
ISBN 10: 9812778810 ISBN 13: 9789812778819
Seller: Universitätsbuchhandlung Herta Hold GmbH, Berlin, Germany
Association Member: GIAQ ILAB VDA
Seller rating 4 out of 5 stars
15 x 23 cm. 368 pages. Hardcover. Versand aus Deutschland / We dispatch from Germany via Air Mail. Einband bestoßen, daher Mängelexemplar gestempelt, sonst sehr guter Zustand. Imperfect copy due to slightly bumped cover, apart from this in very good condition. Stamped. Sprache: Englisch.
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Terrestrial Neutron-Induced Soft Errors in Advanced Memory Devices
Language: English
Published by World Scientific Publishing Company, 2008
ISBN 10: 9812778810 ISBN 13: 9789812778819
Condition: New. This is a Brand-new US Edition. This Item may be shipped from US or any other country as we have multiple locations worldwide.
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Terrestrial Neutron-Induced Soft Errors in Advanced Memory Devices
Language: English
Published by World Scientific Publishing Company, Incorporated, 2008
ISBN 10: 9812778810 ISBN 13: 9789812778819
Condition: Used. pp. xxii + 343 Index.
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Terrestrial Neutron-Induced Soft Errors in Advanced Memory Devices
Language: English
Published by World Scientific Publishing Company, Incorporated, 2008
ISBN 10: 9812778810 ISBN 13: 9789812778819
US$ 124.43
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Add to basketCondition: Used. pp. xxii + 343 Figures, Illus.
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Terrestrial Neutron-Induced Soft Errors in Advanced Memory Devices
Language: English
Published by World Scientific Publishing Company, Incorporated, 2008
ISBN 10: 9812778810 ISBN 13: 9789812778819
Condition: Used. pp. xxii + 343.
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Dependability in Electronic Systems: Mitigation of Hardware Failures, Soft Errors, and Electro-Magnetic Disturbances
Seller: Ria Christie Collections, Uxbridge, United Kingdom
Seller rating 5 out of 5 stars
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Dependability in Electronic Systems: Mitigation of Hardware Failures, Soft Errors, and Electro-Magnetic Disturbances
Seller: Ria Christie Collections, Uxbridge, United Kingdom
Seller rating 5 out of 5 stars
US$ 133.66
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Dependability in Electronic Systems : Mitigation of Hardware Failures, Soft Errors, and Electro-magnetic Disturbances
Seller: GreatBookPricesUK, Woodford Green, United Kingdom
Seller rating 5 out of 5 stars
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Condition: New. pp. 232.
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Condition: New. pp. 232.
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Terrestrial Radiation Effects in ULSI Devices and Electronic Systems
Seller: GreatBookPricesUK, Woodford Green, United Kingdom
Seller rating 5 out of 5 stars
US$ 176.57
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US$ 165.55
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Add to basketHardcover. Condition: Like New. LIKE NEW. SHIPS FROM MULTIPLE LOCATIONS. book.
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Condition: As New. Unread book in perfect condition.
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Terrestrial Radiation Effects in ULSI Devices and Electronic Systems
Seller: GreatBookPricesUK, Woodford Green, United Kingdom
Seller rating 5 out of 5 stars
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Condition: Sehr gut. Zustand: Sehr gut | Sprache: Englisch | Produktart: Bücher | Dependability in Electronic Systems: Mitigation of Hardware Failures, Soft Errors, and Electro-Magnetic Disturbancesby: Nobuyasu Kanekawa Eishi H. IbeTakashi Suga Yutaka Uematsu The importance of "dependability" in electronic systems is obvious, especially in safety-critical or mission-critical applications. Dependability hinges on matters such as failure causes and countermeasures for soft/hard -errors in semiconductor devices, electro-magnetic interferences, power integration, and system architecture.This book covers the practical application of dependable electronic systems in real industry, such as space, train control and automotive control systems, and network servers/routers. The impact from intermittent errors caused by environmental radiation (neutrons and alpha particles) and EMI (Electro-Magnetic Interference) are introduced together with their most advanced countermeasures. Power Integration is included as one of the most important bases of dependability in electronic systems. Fundamental technical background is provided, along with practical design examples.Readers will obtain an overall picture of dependability from failure causes to countermeasures for their relevant systems or products, and therefore, will be able to select the best choice for maximum dependability. żProvides a set of valuable techniques to design dependability into embedded systems;żOffers fault mitigation techniques widely applicable in general control systems in space and ground-based transportation systems; żPresents fundamentals of soft-errors in semiconductor devices and their impacts and countermeasures in electronic systems such as network servers and routers;żDescribes fundamentals of electro-magnetic interference and practical countermeasures in many industrial applications;żDiscusses vulnerability in power supply systems and how power integration is accomplished.
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Dependability in Electronic Systems : Mitigation of Hardware Failures, Soft Errors, and Electro-magnetic Disturbances
Seller: GreatBookPricesUK, Woodford Green, United Kingdom
Seller rating 5 out of 5 stars
US$ 212.44
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US$ 201.41
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Condition: As New. Unread book in perfect condition.
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US$ 233.80
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Add to basketHardcover. Condition: Brand New. 268 pages. 9.50x6.75x1.00 inches. In Stock.
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Terrestrial Radiation Effects in ULSI Devices and Electronic Systems (Hardcover)
Language: English
Published by John Wiley & Sons Inc, New York, 2015
ISBN 10: 1118479297 ISBN 13: 9781118479292
First Edition
US$ 204.16
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Add to basketHardcover. Condition: new. Hardcover. This book provides the reader with knowledge on a wide variety of radiation fields and their effects on the electronic devices and systems. The author covers faults and failures in ULSI devices induced by a wide variety of radiation fields, including electrons, alpha-rays, muons, gamma rays, neutrons and heavy ions. Readers will learn how to make numerical models from physical insights, to determine the kind of mathematical approaches that should be implemented to analyze radiation effects. A wide variety of prediction, detection, characterization and mitigation techniques against soft-errors are reviewed and discussed. The author shows how to model sophisticated radiation effects in condensed matter in order to quantify and control them, and explains how electronic systems including servers and routers are shut down due to environmental radiation. Provides an understanding of how electronic systems are shut down due to environmental radiation by constructing physical models and numerical algorithmsCovers both terrestrial and avionic-level conditionsLogically presented with each chapter explaining the background physics to the topic followed by various modelling techniques, and chapter summaryWritten by a widely-recognized authority in soft-errors in electronic devicesCode samples available for download from the Companion Website This book is targeted at researchers and graduate students in nuclear and space radiation, semiconductor physics and electron devices, as well as other areas of applied physics modelling. Researchers and students interested in how a variety of physical phenomena can be modelled and numerically treated will also find this book to present helpful methods. This book provides the reader with knowledge on a wide variety of radiation fields and their effects on the electronic devices and systems. The author covers faults and failures in ULSI devices induced by a wide variety of radiation fields, including electrons, alpha-rays, muons, gamma rays, neutrons and heavy ions. Shipping may be from our UK warehouse or from our Australian or US warehouses, depending on stock availability.
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Condition: As New. Unread book in perfect condition.
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Buch. Condition: Neu. Neuware - This book provides the reader with knowledge on a wide variety of radiation fields and their effects on the electronic devices and systems. The author covers faults and failures in ULSI devices induced by a wide variety of radiation fields, including electrons, alpha-rays, muons, gamma rays, neutrons and heavy ions. Readers will learn how to make numerical models from physical insights, to determine the kind of mathematical approaches that should be implemented to analyze radiation effects. A wide variety of prediction, detection, characterization and mitigation techniques against soft-errors are reviewed and discussed. The author shows how to model sophisticated radiation effects in condensed matter in order to quantify and control them, and explains how electronic systems including servers and routers are shut down due to environmental radiation.\* Provides an understanding of how electronic systems are shut down due to environmental radiation by constructing physical models and numerical algorithms\* Covers both terrestrial and avionic-level conditions\* Logically presented with each chapter explaining the background physics to the topic followed by various modelling techniques, and chapter summary\* Written by a widely-recognized authority in soft-errors in electronic devices\* Code samples available for download from the Companion WebsiteThis book is targeted at researchers and graduate students in nuclear and space radiation, semiconductor physics and electron devices, as well as other areas of applied physics modelling. Researchers and students interested in how a variety of physical phenomena can be modelled and numerically treated will also find this book to present helpful methods.
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US$ 109.41
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Add to basketCondition: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Provides a set of valuable techniques to design dependability into embedded systemsDescribes fundamentals of electro-magnetic interference and practical countermeasures in many industrial applicationsDiscusses vulnerability in power supply systems and how.
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US$ 118.10
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Ships from Germany to U.S.A.Quantity: Over 20 available
Add to basketCondition: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Provides a set of valuable techniques to design dependability into embedded systemsDescribes fundamentals of electro-magnetic interference and practical countermeasures in many industrial applicationsDiscusses vulnerability in power supply systems and how.
