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Fey Goerschwin (45 results)
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Paperback. Condition: Good. No Jacket. Pages can have notes/highlighting. Spine may show signs of wear. ~ ThriftBooks: Read More, Spend Less.
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paperback. Condition: Good. Connecting readers with great books since 1972! Used textbooks may not include companion materials such as access codes, etc. May have some wear or writing/highlighting. We ship orders daily and Customer Service is our top priority!
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Debug Automation from Pre-Silicon to Post-Silicon.
Seller: Universitätsbuchhandlung Herta Hold GmbH, Berlin, Germany
Association Member: GIAQ ILAB VDA
Seller rating 4 out of 5 stars
XIV, 171 p. Hardcover. Versand aus Deutschland / We dispatch from Germany via Air Mail. Einband bestoßen, daher Mängelexemplar gestempelt, sonst sehr guter Zustand. Imperfect copy due to slightly bumped cover, apart from this in very good condition. Stamped. Stamped. Sprache: Englisch.
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Debug Automation from Pre-Silicon to Post-Silicon
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Condition: New. This is a Brand-new US Edition. This Item may be shipped from US or any other country as we have multiple locations worldwide.
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Condition: Brand New. New. US edition. Expediting shipping for all USA and Europe orders excluding PO Box. Excellent Customer Service.
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Add to basketHardcover. Condition: Brand New. 2015 edition. 171 pages. 9.25x6.25x0.75 inches. In Stock.
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Condition: New. This is a Brand-new US Edition. This Item may be shipped from US or any other country as we have multiple locations worldwide.
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Debug Automation from Pre-Silicon to Post-Silicon
Language: English
Published by Springer International Publishing, 2016
ISBN 10: 3319356100 ISBN 13: 9783319356105
Taschenbuch. Condition: Neu. Druck auf Anfrage Neuware - Printed after ordering - This book describes automated debugging approaches for the bugs and the faults which appear in different abstraction levels of a hardware system. The authors employ a transaction-based debug approach to systems at the transaction-level, asserting the correct relation of transactions. The automated debug approach for design bugs finds the potential fault candidates at RTL and gate-level of a circuit. Debug techniques for logic bugs and synchronization bugs are demonstrated, enabling readers to localize the most difficult bugs. Debug automation for electrical faults (delay faults)finds the potentially failing speedpaths in a circuit at gate-level. The various debug approaches described achieve high diagnosis accuracy and reduce the debugging time, shortening the IC development cycle and increasing the productivity of designers.Describes a unified framework for debug automation used at both pre-silicon and post-silicon stages;Provides approaches for debug automation of a hardware system at different levels of abstraction, i.e., chip, gate-level, RTL and transaction level;Includes techniques for debug automation of design bugs and electrical faults, as well as an infrastructure to debug NoC-based multiprocessor SoCs.
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Debug Automation from Pre-Silicon to Post-Silicon
Language: English
Published by Springer International Publishing, 2014
ISBN 10: 3319093088 ISBN 13: 9783319093086
Buch. Condition: Neu. Druck auf Anfrage Neuware - Printed after ordering - This book describes automated debugging approaches for the bugs and the faults which appear in different abstraction levels of a hardware system. The authors employ a transaction-based debug approach to systems at the transaction-level, asserting the correct relation of transactions. The automated debug approach for design bugs finds the potential fault candidates at RTL and gate-level of a circuit. Debug techniques for logic bugs and synchronization bugs are demonstrated, enabling readers to localize the most difficult bugs. Debug automation for electrical faults (delay faults)finds the potentially failing speedpaths in a circuit at gate-level. The various debug approaches described achieve high diagnosis accuracy and reduce the debugging time, shortening the IC development cycle and increasing the productivity of designers.Describes a unified framework for debug automation used at both pre-silicon and post-silicon stages;Provides approaches for debug automation of a hardware system at different levels of abstraction, i.e., chip, gate-level, RTL and transaction level;Includes techniques for debug automation of design bugs and electrical faults, as well as an infrastructure to debug NoC-based multiprocessor SoCs.
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Robustness and Usability in Modern Design Flows
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Robustness and Usability in Modern Design Flows
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Advanced BDD Optimization
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Taschenbuch. Condition: Neu. Robustness and Usability in Modern Design Flows | Görschwin Fey (u. a.) | Taschenbuch | xviii | Englisch | 2010 | Springer | EAN 9789048176625 | Verantwortliche Person für die EU: Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg, juergen[dot]hartmann[at]springer[dot]com | Anbieter: preigu.
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Advanced BDD Optimization
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Buch. Condition: Neu. Druck auf Anfrage Neuware - Printed after ordering - The size of technically producible integrated circuits increases continuously. But the ability to design and verify these circuits does not keep up with this development. Therefore, today's design ow has to be improved to achieve a higher productivity. In this book the current design methodology and ver- cation methodology are analyzed, a number of de ciencies are identi ed, and solutions are suggested. Improvements in the methodology as well as in the underlying algorithms are proposed. An in-depth presentation of preliminary concepts makes the book self-contained. Based on this foundation major - sign problems are targeted. In particular, a complete tool ow for Synthesis for Testability of SystemC descriptions is presented. The resulting circuits are completely testable and test pattern generation in polynomial time is possible. Veri cation issues are covered in even more detail. A whole new paradigm for formal design veri cation is suggested. This is based upon design und- standing, the automatic generation of properties, and powerful tool support for debugging failures. All these new techniques are empirically evaluated and - perimental results are provided. As a result, an enhanced design ow is created that provides more automation (i.e. better usability) and reduces the probability of introducing conceptual errors (i.e. higher robustness). Acknowledgments We would like to thank all members of the research group for computer arc- tecture in Bremen for the helpful discussions and the great atmosphere during work and research.
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Condition: As New. Unread book in perfect condition.
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Test digitaler Schaltkreise (German Edition)
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Paperback. Condition: New. Eingebettete Systeme übernehmen zentrale Steueraufgaben im täglichen Leben. In der Energieversorgung oder im Transportwesen würde ein Ausfall der Systeme fatale Auswirkungen haben. Der Nutzer verlässt sich aber auf ein fehlerfreies Funktionieren des Systems. Die Funktionstüchtigkeit der Schaltkreise zu garantieren, ist das Ziel des Testens - und das mit geringen Kosten, da jeder Chip nach der Produktion separat getestet werden muss.
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Condition: new.
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Test Digitaler Schaltkreise -Language: german
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Test Digitaler Schaltkreise -Language: german
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Test Digitaler Schaltkreise
Language: German
Published by Oldenbourg Wissenschaftsverlag, 2014
ISBN 10: 3486720139 ISBN 13: 9783486720136
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Add to basketPaperback. Condition: Brand New. 238 pages. German language. 9.45x6.69x0.55 inches. In Stock.
