Paul Predecki (83 results)

Advances in X-Ray Analysis, Vol. 29
Barrett, Charles S. & Paul K. Predecki & Donald E. Leyden, John C. Russ & John Faber, Jr., & Ron Jenkins, Editors
- Hardcover
- First Edition
Seller: Reader's Corner, Inc., Raleigh, U.S.A.Reader's Corner, Inc.
Contact seller5-star sellerCondition: Used - Fine
US$ 15.00
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Hardcover. Condition: Fine. Dust Jacket Condition: Fine. First Edition. Previous owner's blindstamp, otherwise a fine hardcover copy in a fine mylar protected DJ, white spine.
Published by J Applied Physics 1970
- Softcover
- Periodical
Seller: Larry W Price Books, Portland, U.S.A.Larry W Price Books
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Add to basketPamphlet. Condition: Very Good. Vol 41, No 11, pp. 4342-4346, Illus, 4to, Extracted from orig vol, begins with title page, trimmed & stapled, thus is like a pamphlet, else VG.
Published by J Applied Physics 1966
- Softcover
- Periodical
Seller: Larry W Price Books, Portland, U.S.A.Larry W Price Books
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US$ 7.90
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Add to basketPamphlet. Condition: Very Good. Vol 37, No 11, pp. 4053-4059, Illus, 4to, Extracted from orig vol, begins with title page, trimmed & stapled, thus is like a pamphlet else VG.

Advances in X-Ray Analysis, Vol. 31
Barrett, Charles S. & Paul K. Predecki & Donald E. Leyden, John C. Russ & Ron Jenkins & John V. Gilfrich,, Editors
- Hardcover
- First Edition
Seller: Reader's Corner, Inc., Raleigh, U.S.A.Reader's Corner, Inc.
Contact seller5-star sellerCondition: Used - Fine
US$ 25.00
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Hardcover. Condition: Fine. Dust Jacket Condition: Fine. First Edition. This is a fine hardcover copy in a fine mylar protected DJ, white spine.

Advances in X-Ray Analysis, Vol. 30
Barrett, Charles S. & Paul K. Predecki & Donald E. Leyden, John C. Russ & Ron Jenkins & John V. Gilfrich,, Editors
- Hardcover
- First Edition
Seller: Reader's Corner, Inc., Raleigh, U.S.A.Reader's Corner, Inc.
Contact seller5-star sellerCondition: Used - Fine
US$ 25.00
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Hardcover. Condition: Fine. Dust Jacket Condition: Fine. First Edition. This is a fine hardcover copy in a fine mylar protected DJ, white spine.

Advances in X-Ray Analysis, Vol. 27
Barrett, Charles S. & Paul K. Predecki & Donald E. Leyden & John C. Russ & Jerome B. Cohen, Editors
- Hardcover
- First Edition
Seller: Reader's Corner, Inc., Raleigh, U.S.A.Reader's Corner, Inc.
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US$ 55.00
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Hardcover. Condition: Fine. Dust Jacket Condition: Fine. First Edition. Previous owner's blindstamp, otherwise a fine hardcover copy in a fine mylar protected DJ, white spine.

- Hardcover
Seller: Zubal-Books, Since 1961, Cleveland, U.S.A.Zubal-Books, Since 1961
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Condition: Good. *Price HAS BEEN REDUCED by 10% until Monday, June 8 (weekend SALE item)* 2 Volumes, 1334 pp., hardcover, ex library, else text and bindings clean and tight. - If you are reading this, this item is actually (physically) in our stock and ready for shipment once ordered. We are not bookjackers. Buyer is responsible… for any additional duties, taxes, or fees required by recipient's country.

- Hardcover
Seller: Majestic Books, Hounslow, United KingdomMajestic Books
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Condition: New. pp. 1334.

- Hardcover
Seller: Books Puddle, New York, U.S.A.Books Puddle
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Condition: New. pp. 1334 1st Edition.

- Hardcover
Seller: Romtrade Corp., STERLING HEIGHTS, U.S.A.Romtrade Corp.
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Condition: New. This is a Brand-new US Edition. This Item may be shipped from US or any other country as we have multiple locations worldwide.

- Hardcover
Seller: Basi6 International, Irving, U.S.A.Basi6 International
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- Hardcover
Seller: Biblios, frankfurt am main, GermanyBiblios
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Condition: New. pp. 1334.

- Softcover
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Condition: New. In.

- Softcover
Seller: Ria Christie Collections, Uxbridge, United KingdomRia Christie Collections
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Condition: New. In.

- Softcover
Seller: Chiron Media, Wallingford, United KingdomChiron Media
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PF. Condition: New.

- Softcover
Seller: Chiron Media, Wallingford, United KingdomChiron Media
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PF. Condition: New.

- Softcover
Seller: SMASS Sellers, IRVING, U.S.A.SMASS Sellers
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Condition: New. Brand New, Softcover edition. This item may ship from the US or our Overseas warehouse depending on your location and stock availability.

- Softcover
Seller: Books Puddle, New York, U.S.A.Books Puddle
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Condition: New. pp. 412 Index.

- Hardcover
Seller: Majestic Books, Hounslow, United KingdomMajestic Books
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Condition: New. pp. 932 68:B&W 7 x 10 in or 254 x 178 mm Case Laminate on White w/Gloss Lam.

- Softcover
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Condition: New. pp. 648.

- Hardcover
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Condition: New. pp. 932.

- Hardcover
Seller: Zubal-Books, Since 1961, Cleveland, U.S.A.Zubal-Books, Since 1961
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Condition: Very Good. *Price HAS BEEN REDUCED by 10% until Monday, June 8 (weekend SALE item)* 813 pp., hardcover, minor library markings else text clean & binding tight (lacks dust jacket). - If you are reading this, this item is actually (physically) in our stock and ready for shipment once ordered. We are not bookjackers. Buy…er is responsible for any additional duties, taxes, or fees required by recipient's country. Photos available upon request.

- Hardcover
Seller: Biblios, frankfurt am main, GermanyBiblios
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US$ 96.60
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Condition: New. pp. 932.

- Hardcover
- International Edition
Seller: UK BOOKS STORE, London, United KingdomUK BOOKS STORE
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Condition: New. Brand New ! Fast Delivery "International Edition " and ship within 24-48 hours. Deliver by FedEx and Dhl, & Aramex, UPS, & USPS and we do accept APO and PO BOX Addresses. Order can be delivered worldwide within 4-6 Working days .and we do have flat rate for up to 2LB. Extra shipping charges will be requested This… Item May be shipped from India, United states & United Kingdom. Depending on your location and availability.

- Hardcover
Seller: Ria Christie Collections, Uxbridge, United KingdomRia Christie Collections
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US$ 117.30
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Condition: New. In.
More images- Softcover
Seller: preigu, Osnabrück, Germanypreigu
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Taschenbuch. Condition: Neu. Advances in X-Ray Analysis | Volume 28 | Paul K. Predecki (u. a.) | Taschenbuch | Einband - flex.(Paperback) | Englisch | 2011 | Springer US | EAN 9781461294993 | Verantwortliche Person für die EU: Springer Heidelberg, Tiergartenstr. 17, 69121 Heidelberg, buchhandel-buch[at]springer[dot]com | Anbiete…r: preigu.
More images- Softcover
Seller: preigu, Osnabrück, Germanypreigu
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Taschenbuch. Condition: Neu. Advances in X-Ray Analysis | Volume 35B | C. S. Barrett (u. a.) | Taschenbuch | iv | Englisch | 2012 | Springer | EAN 9781461365327 | Verantwortliche Person für die EU: Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg, juergen[dot]hartmann[at]springer[dot]com | Anbieter: preigu.

- Softcover
Seller: AHA-BUCH GmbH, Einbeck, GermanyAHA-BUCH GmbH
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Taschenbuch. Condition: Neu. Druck auf Anfrage Neuware - Printed after ordering - The 33rd Annual Denver Conference on Applications of X-Ray Analysis was held July 30-August 3. 1984. on the campus of the University of Denver. Following the recent tradition of alternating plenary lecture topics between X-ray diffraction and X-ray… fluorescence at the confer ence. the plenary sessions dealt with topics of X-ray fluorescence. Prof. H. Aiginger presented a plenary lect~re on TOTAL REFLECTANCE X-RAY SPECTROMETRY which admirably described this relatively new technique. J. C. Russ discussed XRF AND OTHER SURFACE ANALYTICAL TECHNIQUES which gave an excellent overview of the role XRF plays in a modern analytical laboratory. J. E. Taggart. Jr. described THE ROLE OF XRF IN A MODERN GEOCHEMICAL LABORATORY and presented many case histories of the configura tion of analytical equipment in several geochemical laboratories. The plenary lectures demonstrated both the dynamic nature of research in X-ray fluorescence. and the important role X-ray spectrom etry plays in the arsenal of analytical methods found in modern labora tories. Total reflectance X-ray spectrometry takes advantage of con sideration of the geometry of the X-ray optics. Potentially. new sample types may be considered as X-ray fluorescence specimens using this technique.

- Softcover
Seller: AHA-BUCH GmbH, Einbeck, GermanyAHA-BUCH GmbH
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Taschenbuch. Condition: Neu. Druck auf Anfrage Neuware - Printed after ordering - Whole Pattern Fitting, Rietveld Analysis, and Calculated Diffraction Patterns. Quantitative Phase Analysis by XRay Diffraction (XRD). Thin Film and Surface Characterization by XRD. Lattice Defects and XRay Topography. Texture Analysis by XRD. XRD I…nstrumentation, Techniques, and Reference Materials. Stress Determination by Diffraction Methods. XRD Profile Fitting, Crystallite Size and Strain Determination. XRD Applications: Detection Limits, Superconductors, Organics, Minerals. Mathematical Methods in XRay Spectrometry (XRS). Thin Film and Surface Characterization by XRS and XPS. Total Reflection XRS. XRS Techniques and Instrumentation. XRS Applications. XRay Imaging and Tomography. 161 articles. Index.

- Softcover
Seller: Mispah books, Redhill, United KingdomMispah books
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Paperback. Condition: Like New. LIKE NEW. SHIPS FROM MULTIPLE LOCATIONS. book.