Order Total (1 Item Items):
Shipping Destination:
Thilo Glatzel (52 results)
Skip to main search results
Search filters
Product Type
- All Product Types
- Books (52)
- Magazines & Periodicals (No further results match this refinement)
- Comics (No further results match this refinement)
- Sheet Music (No further results match this refinement)
- Art, Prints & Posters (No further results match this refinement)
- Photographs (No further results match this refinement)
- Maps (No further results match this refinement)
- Manuscripts & Paper Collectibles (No further results match this refinement)
Condition Learn more
- New (45)
- As New, Fine or Near Fine (5)
- Very Good or Good (1)
- Fair or Poor (No further results match this refinement)
- As Described (1)
Binding
Collectible Attributes
- First Edition (No further results match this refinement)
- Signed (No further results match this refinement)
- Dust Jacket (No further results match this refinement)
- Seller-Supplied Images (23)
- Not Print on Demand (30)
Language (1)
Free Shipping
- Free Shipping to U.S.A. (No further results match this refinement)
Seller Location
Seller Rating
-
Springer Series in Surface Sciences - 65: Kelvin Probe Force Microscopy: From Single Charge Detection to Device Characterization
Book 24 of 30: Springer Series in Surface SciencesUS$ 73.86
US$ 24.01 shipping
Ships from Czech Republic to U.S.A.Quantity: 1 available
Add to basketHardcover. Condition: Fine. Leichte Kratzer / Abnutzungen / Druckstellen; Abnutzung / Risse - leicht; Gebrochener Buchrücken / Seiten oder Softcover umgeknickt. This book provides a comprehensive introduction to the methods and variety of Kelvin probe force microscopy, including technical details. It also offers an overview of the recent developments and numerous applications, ranging from semiconductor materials, nanostructures and devices to sub-molecular and atomic scale electrostatics. In the last 25 years, Kelvin probe force microscopy has developed from a specialized technique applied by a few scanning probe microscopy experts into a tool used by numerous research and development groups around the globe. This sequel to the editors' previous volume "Kelvin Probe Force Microscopy: Measuring and Compensating Electrostatic Forces," presents new and complementary topics. It is intended for a broad readership, from undergraduate students to lab technicians and scanning probe microscopy experts who are new to the field.
-
Kelvin Probe Force Microscopy: Measuring and Compensating Electrostatic Forces (Springer Series in Surface Sciences, 48)
Book 2 of 30: Springer Series in Surface SciencesSeller: Ria Christie Collections, Uxbridge, United Kingdom
Seller rating 5 out of 5 stars
US$ 133.26
US$ 16.00 shipping
Ships from United Kingdom to U.S.A.Quantity: Over 20 available
Add to basketCondition: New. In.
-
-
Condition: New. pp. 348.
-
Kelvin Probe Force Microscopy : Measuring and Compensating Electrostatic Forces
Book 2 of 30: Springer Series in Surface SciencesSeller: GreatBookPricesUK, Woodford Green, United Kingdom
Seller rating 5 out of 5 stars
US$ 142.19
US$ 20.03 shipping
Ships from United Kingdom to U.S.A.Quantity: Over 20 available
Add to basketCondition: New.
-
Kelvin Probe Force Microscopy
Book 2 of 30: Springer Series in Surface SciencesLanguage: English
Published by Springer Berlin Heidelberg, 2013
ISBN 10: 3642271138 ISBN 13: 9783642271137
US$ 108.72
US$ 56.04 shipping
Ships from Germany to U.S.A.Quantity: Over 20 available
Add to basketCondition: New.
-
Kelvin Probe Force Microscopy
Book 2 of 30: Springer Series in Surface SciencesLanguage: English
Published by Springer Berlin Heidelberg, 2011
ISBN 10: 3642225659 ISBN 13: 9783642225659
US$ 108.72
US$ 56.04 shipping
Ships from Germany to U.S.A.Quantity: Over 20 available
Add to basketCondition: New.
-
Condition: New. pp. 348.
-
Kelvin Probe Force Microscopy: Measuring and Compensating Electrostatic Forces (Springer Series in Surface Sciences, 48)
Book 2 of 30: Springer Series in Surface SciencesSeller: Ria Christie Collections, Uxbridge, United Kingdom
Seller rating 5 out of 5 stars
US$ 175.51
US$ 16.00 shipping
Ships from United Kingdom to U.S.A.Quantity: Over 20 available
Add to basketCondition: New. In.
-
Taschenbuch. Condition: Neu. Kelvin Probe Force Microscopy | Measuring and Compensating Electrostatic Forces | Sascha Sadewasser (u. a.) | Taschenbuch | Springer Series in Surface Sciences | xiv | Englisch | 2013 | Springer | EAN 9783642271137 | Verantwortliche Person für die EU: Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg, juergen[dot]hartmann[at]springer[dot]com | Anbieter: preigu.
-
Kelvin Probe Force Microscopy: Measuring and Compensating Electrostatic Forces (Springer Series in Surface Sciences)
Book 2 of 30: Springer Series in Surface SciencesUS$ 177.55
US$ 16.69 shipping
Ships from United Kingdom to U.S.A.Quantity: 2 available
Add to basketPaperback. Condition: Brand New. 2012 edition. 290 pages. 9.25x6.10x0.79 inches. In Stock.
-
Kelvin Probe Force Microscopy: Measuring and Compensating Electrostatic Forces
Book 2 of 30: Springer Series in Surface SciencesUS$ 179.25
US$ 16.69 shipping
Ships from United Kingdom to U.S.A.Quantity: 2 available
Add to basketHardcover. Condition: Brand New. 2012 edition. 345 pages. 9.25x6.25x1.00 inches. In Stock.
-
Taschenbuch. Condition: Neu. Druck auf Anfrage Neuware - Printed after ordering - Over the nearly 20 years of Kelvin probe force microscopy, an increasing interest in the technique and its applications has developed. This book gives a concise introduction into the method and describes various experimental techniques. Surface potential studies on semiconductor materials, nanostructures and devices are described, as well as application to molecular and organic materials. The current state of surface potential at the atomic scale is also considered. This book presents an excellent introduction for the newcomer to this field, as much as a valuable resource for the expert.
-
Kelvin Probe Force Microscopy : Measuring and Compensating Electrostatic Forces
Book 2 of 30: Springer Series in Surface SciencesLanguage: English
Published by Springer Vieweg, Springer, 2011
ISBN 10: 3642225659 ISBN 13: 9783642225659
Buch. Condition: Neu. Druck auf Anfrage Neuware - Printed after ordering - Over the nearly 20 years of Kelvin probe force microscopy, an increasing interest in the technique and its applications has developed. This book gives a concise introduction into the method and describes various experimental techniques. Surface potential studies on semiconductor materials, nanostructures and devices are described, as well as application to molecular and organic materials. The current state of surface potential at the atomic scale is also considered. This book presents an excellent introduction for the newcomer to this field, as much as a valuable resource for the expert.
-
Kelvin Probe Force Microscopy : Measuring and Compensating Electrostatic Forces
Book 2 of 30: Springer Series in Surface SciencesSeller: GreatBookPricesUK, Woodford Green, United Kingdom
Seller rating 5 out of 5 stars
US$ 225.56
US$ 20.03 shipping
Ships from United Kingdom to U.S.A.Quantity: Over 20 available
Add to basketCondition: As New. Unread book in perfect condition.
-
Kelvin Probe Force Microscopy: From Single Charge Detection to Device Characterization (Springer Series in Surface Sciences, 65)
Book 24 of 30: Springer Series in Surface SciencesSeller: Ria Christie Collections, Uxbridge, United Kingdom
Seller rating 5 out of 5 stars
US$ 231.85
US$ 16.00 shipping
Ships from United Kingdom to U.S.A.Quantity: Over 20 available
Add to basketCondition: New. In.
-
Kelvin Probe Force Microscopy: From Single Charge Detection to Device Characterization (Springer Series in Surface Sciences, 65)
Book 24 of 30: Springer Series in Surface SciencesSeller: Ria Christie Collections, Uxbridge, United Kingdom
Seller rating 5 out of 5 stars
US$ 231.85
US$ 16.00 shipping
Ships from United Kingdom to U.S.A.Quantity: Over 20 available
Add to basketCondition: New. In English.
-
Kelvin Probe Force Microscopy: Measuring and Compensating Electrostatic Forces (Springer Series in Surface Sciences, 48)
Book 2 of 30: Springer Series in Surface SciencesUS$ 214.57
US$ 33.39 shipping
Ships from United Kingdom to U.S.A.Quantity: 1 available
Add to basketHardcover. Condition: Like New. LIKE NEW. SHIPS FROM MULTIPLE LOCATIONS. book.
-
Kelvin Probe Force Microscopy: Measuring and Compensating Electrostatic Forces (Springer Series in Surface Sciences (48))
Book 2 of 30: Springer Series in Surface SciencesUS$ 213.20
US$ 33.39 shipping
Ships from United Kingdom to U.S.A.Quantity: 1 available
Add to basketPaperback. Condition: Like New. LIKE NEW. SHIPS FROM MULTIPLE LOCATIONS. book.
-
Condition: As New. Unread book in perfect condition.
-
Hardcover. xxiv, 521 S. Ehem. Bibliotheksexemplar mit Signatur und Stempel. GUTER Zustand, ein paar Gebrauchsspuren. Ex-library in GOOD condition with library-signature and stamp(s). Some traces of use. R-16212 9783319756868 Sprache: Englisch Gewicht in Gramm: 1050.
-
Taschenbuch. Condition: Neu. Kelvin Probe Force Microscopy | From Single Charge Detection to Device Characterization | Sascha Sadewasser (u. a.) | Taschenbuch | xxiv | Englisch | 2019 | Springer | EAN 9783030092986 | Verantwortliche Person für die EU: Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg, juergen[dot]hartmann[at]springer[dot]com | Anbieter: preigu.
-
Condition: New. 1st ed. 2018 edition NO-PA16APR2015-KAP.
-
-
Springer Series in Surface Sciences - 65: Kelvin Probe Force Microscopy: From Single Charge Detection to Device Characterization Sascha Sadewasser
Book 24 of 30: Springer Series in Surface SciencesSeller: BUCHSERVICE / ANTIQUARIAT Lars Lutzer, Wahlstedt, Germany
Seller rating 5 out of 5 stars
Hardcover. Condition: gut. 2018. Springer Series in Surface Sciences - 65: Kelvin Probe Force Microscopy: From Single Charge Detection to Device Characterization pages.
-
Kelvin Probe Force Microscopy : From Single Charge Detection to Device Characterization
Book 24 of 30: Springer Series in Surface SciencesLanguage: English
Published by Springer International Publishing, Springer Nature Switzerland, 2019
ISBN 10: 3030092984 ISBN 13: 9783030092986
Taschenbuch. Condition: Neu. Druck auf Anfrage Neuware - Printed after ordering - This book provides a comprehensive introduction to the methods and variety of Kelvin probe force microscopy, including technical details. It also offers an overview of the recent developments and numerous applications, ranging from semiconductor materials, nanostructures and devices to sub-molecular and atomic scale electrostatics.In the last 25 years, Kelvin probe force microscopy has developed from a specialized technique applied by a few scanning probe microscopy experts into a tool used by numerous research and development groups around the globe. This sequel to the editors' previous volume 'Kelvin Probe Force Microscopy: Measuring and Compensating Electrostatic Forces,' presents new and complementary topics.It is intended for a broad readership, from undergraduate students to lab technicians and scanning probe microscopy experts who are new to the field.
-
Buch. Condition: Neu. Druck auf Anfrage Neuware - Printed after ordering - This book provides a comprehensive introduction to the methods and variety of Kelvin probe force microscopy, including technical details. It also offers an overview of the recent developments and numerous applications, ranging from semiconductor materials, nanostructures and devices to sub-molecular and atomic scale electrostatics.In the last 25 years, Kelvin probe force microscopy has developed from a specialized technique applied by a few scanning probe microscopy experts into a tool used by numerous research and development groups around the globe. This sequel to the editors' previous volume 'Kelvin Probe Force Microscopy: Measuring and Compensating Electrostatic Forces,' presents new and complementary topics.It is intended for a broad readership, from undergraduate students to lab technicians and scanning probe microscopy experts who are new to the field.
-
Kelvin Probe Force Microscopy: From Single Charge Detection to Device Characterization (Springer Series in Surface Sciences (65))
Book 24 of 30: Springer Series in Surface SciencesUS$ 365.87
US$ 33.39 shipping
Ships from United Kingdom to U.S.A.Quantity: 1 available
Add to basketHardcover. Condition: New. New. book.
-
Kelvin Probe Force Microscopy: From Single Charge Detection to Device Characterization
Book 24 of 30: Springer Series in Surface SciencesUS$ 401.35
US$ 46.74 shipping
Ships from United Kingdom to U.S.A.Quantity: 2 available
Add to basketHardcover. Condition: Brand New. 521 pages. 9.50x6.25x1.25 inches. In Stock.
-
Kelvin Probe Force Microscopy: From Single Charge Detection to Device Characterization (Springer Series in Surface Sciences, 65)
Book 24 of 30: Springer Series in Surface SciencesUS$ 419.52
US$ 33.39 shipping
Ships from United Kingdom to U.S.A.Quantity: 1 available
Add to basketPaperback. Condition: New. NEW. SHIPS FROM MULTIPLE LOCATIONS. book.
