Advanced Test Methods Srams by Bosio Alberto (23 results)
Advanced Test Methods for SRAMs: Effective Solutions for Dynamic Fault Detection in Nanoscaled Technologies
Bosio, Alberto; Dilillo, Luigi; Girard, Patrick; Pravossoudovitch, Serge; Virazel, Arnaud
- Softcover
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- Softcover
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Advanced Test Methods for SRAMs: Effective Solutions for Dynamic Fault Detection in Nanoscaled Technologies
Bosio, Alberto; Dilillo, Luigi; Girard, Patrick; Pravossoudovitch, Serge; Virazel, Arnaud
- Hardcover
Seller: Ria Christie Collections, Uxbridge, United KingdomRia Christie Collections
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Advanced Test Methods for SRAMs : Effective Solutions for Dynamic Fault Detection in Nanoscaled Technologies
Bosio, Alberto; Dilillo, Luigi; Girard, Patrick; Pravossoudovitch, Serge; Virazel, Arnaud
- Hardcover
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Advanced Test Methods for SRAMs : Effective Solutions for Dynamic Fault Detection in Nanoscaled Technologies
Bosio, Alberto; Dilillo, Luigi; Girard, Patrick; Pravossoudovitch, Serge; Virazel, Arnaud
- Hardcover
Seller: GreatBookPricesUK, Woodford Green, United KingdomGreatBookPricesUK
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- Hardcover
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Advanced Test Methods for SRAMs: Effective Solutions for.
Bosio, Alberto; Dilillo, Luigi; Girard, Patrick; Pravossoudovitch, Serge; Virazel, Arnaud
- Softcover
Seller: Books Puddle, New York, NY, U.S.A.Books Puddle
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More images- Softcover
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Taschenbuch. Condition: Neu. Advanced Test Methods for SRAMs | Effective Solutions for Dynamic Fault Detection in Nanoscaled Technologies | Alberto Bosio (u. a.) | Taschenbuch | xv | Englisch | 2014 | Humana | EAN 9781489983145 | Verantwortliche Person für die EU: Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg, juerge…n[dot]hartmann[at]springer[dot]com | Anbieter: preigu.
- Softcover
Seller: AHA-BUCH GmbH, Einbeck, GermanyAHA-BUCH GmbH
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Taschenbuch. Condition: Neu. Druck auf Anfrage Neuware - Printed after ordering - Modern electronics depend on nanoscaled technologies that present new challenges in terms of testing and diagnostics. Memories are particularly prone to defects since they exploit the technology limits to get the highest density. This book is an in…valuable guide to the testing and diagnostics of the latest generation of SRAM, one of the most widely applied types of memory. Classical methods for testing memory are designed to handle the so-called 'static faults,' but these test solutions are not sufficient for faults that are emerging in the latest Very Deep Sub-Micron (VDSM) technologies. These new fault models, referred to as 'dynamic faults', are not covered by classical test solutions and require the dedicated test sequences presented in this book.
- Hardcover
Seller: AHA-BUCH GmbH, Einbeck, GermanyAHA-BUCH GmbH
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Buch. Condition: Neu. Druck auf Anfrage Neuware - Printed after ordering - Modern electronics depend on nanoscaled technologies that present new challenges in terms of testing and diagnostics. Memories are particularly prone to defects since they exploit the technology limits to get the highest density. This book is an invaluabl…e guide to the testing and diagnostics of the latest generation of SRAM, one of the most widely applied types of memory. Classical methods for testing memory are designed to handle the so-called 'static faults,' but these test solutions are not sufficient for faults that are emerging in the latest Very Deep Sub-Micron (VDSM) technologies. These new fault models, referred to as 'dynamic faults', are not covered by classical test solutions and require the dedicated test sequences presented in this book.
Advanced Test Methods for SRAMs : Effective Solutions for Dynamic Fault Detection in Nanoscaled Technologies
Bosio, Alberto; Dilillo, Luigi; Girard, Patrick; Pravossoudovitch, Serge; Virazel, Arnaud
- Hardcover
Seller: GreatBookPricesUK, Woodford Green, United KingdomGreatBookPricesUK
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Advanced Test Methods for SRAMs: Effective Solutions for Dynamic Fault Detection in Nanoscaled Technologies
Bosio, Alberto, Dilillo, Luigi, Girard, Patrick, Pravossoudo
- Hardcover
Seller: Mispah books, Redhill, SURRE, United KingdomMispah books
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Hardcover. Condition: Like New. Like New. book.
Advanced Test Methods for SRAMs : Effective Solutions for Dynamic Fault Detection in Nanoscaled Technologies
Bosio, Alberto; Dilillo, Luigi; Girard, Patrick; Pravossoudovitch, Serge; Virazel, Arnaud
- Hardcover
Seller: GreatBookPrices, Columbia, MD, U.S.A.GreatBookPrices
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Condition: As New. Unread book in perfect condition.
- Softcover
- Print on Demand
Seller: THE SAINT BOOKSTORE, Southport, United KingdomTHE SAINT BOOKSTORE
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Paperback / softback. Condition: New. This item is printed on demand. New copy - Usually dispatched within 5-9 working days.
- Hardcover
- Print on Demand
Seller: BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, GermanyBuchWeltWeit Ludwig Meier e.K.
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Buch. Condition: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -Modern electronics depend on nanoscaled technologies that present new challenges in terms of testing and diagnostics. Memories are particularly prone to defects since they exploit the technology limits to get the highest density. This book… is an invaluable guide to the testing and diagnostics of the latest generation of SRAM, one of the most widely applied types of memory. Classical methods for testing memory are designed to handle the so-called 'static faults,' but these test solutions are not sufficient for faults that are emerging in the latest Very Deep Sub-Micron (VDSM) technologies. These new fault models, referred to as 'dynamic faults', are not covered by classical test solutions and require the dedicated test sequences presented in this book. 171 pp. Englisch.
- Softcover
- Print on Demand
Seller: BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, GermanyBuchWeltWeit Ludwig Meier e.K.
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Taschenbuch. Condition: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -Modern electronics depend on nanoscaled technologies that present new challenges in terms of testing and diagnostics. Memories are particularly prone to defects since they exploit the technology limits to get the highest density. Th…is book is an invaluable guide to the testing and diagnostics of the latest generation of SRAM, one of the most widely applied types of memory. Classical methods for testing memory are designed to handle the so-called 'static faults,' but these test solutions are not sufficient for faults that are emerging in the latest Very Deep Sub-Micron (VDSM) technologies. These new fault models, referred to as 'dynamic faults', are not covered by classical test solutions and require the dedicated test sequences presented in this book. 188 pp. Englisch.
Advanced Test Methods for SRAMs
Alberto Bosio|Luigi Dilillo|Patrick Girard|Serge Pravossoudovitch|Arnaud Virazel
- Softcover
- Print on Demand
Seller: moluna, Greven, Germanymoluna
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Condition: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. First book to present complete, state-of-the-art coverage of dynamic fault memory testingPresents content using a bottom-up approach, from the electrical causes of malfunction up to the generation of smart test strate…giesIncludes case stu.
Advanced Test Methods for SRAMs
Alberto Bosio|Luigi Dilillo|Patrick Girard|Serge Pravossoudovitch|Arnaud Virazel
- Hardcover
- Print on Demand
Seller: moluna, Greven, Germanymoluna
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Gebunden. Condition: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. First book to present complete, state-of-the-art coverage of dynamic fault memory testingPresents content using a bottom-up approach, from the electrical causes of malfunction up to the generation of smart t…est strategiesIncludes case stu.
- Hardcover
- Print on Demand
Seller: Majestic Books, Hounslow, United KingdomMajestic Books
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Condition: New. Print on Demand pp. 188 52:B&W 6.14 x 9.21in or 234 x 156mm (Royal 8vo) Case Laminate on White w/Gloss Lam.
Advanced Test Methods for SRAMs: Effective Solutions for.
Bosio, Alberto; Dilillo, Luigi; Girard, Patrick; Pravossoudovitch, Serge; Virazel, Arnaud
- Softcover
- Print on Demand
Seller: Majestic Books, Hounslow, United KingdomMajestic Books
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Condition: New. Print on Demand pp. 188.
- Hardcover
- Print on Demand
Seller: Biblios, frankfurt am main, HESSE, GermanyBiblios
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Condition: New. PRINT ON DEMAND pp. 188.
Advanced Test Methods for SRAMs: Effective Solutions for.
Bosio, Alberto; Dilillo, Luigi; Girard, Patrick; Pravossoudovitch, Serge; Virazel, Arnaud
- Softcover
- Print on Demand
Seller: Biblios, frankfurt am main, HESSE, GermanyBiblios
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Condition: New. PRINT ON DEMAND pp. 188.
Language: English
Published by Springer US, Springer New York Sep 2014 2014
- Softcover
- Print on Demand
Seller: buchversandmimpf2000, Emtmannsberg, BAYE, Germanybuchversandmimpf2000
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Taschenbuch. Condition: Neu. This item is printed on demand - Print on Demand Titel. Neuware -Modern electronics depend on nanoscaled technologies that present new challenges in terms of testing and diagnostics. Memories are particularly prone to defects since they exploit the technology limits to get the highest density. This b…ook is an invaluable guide to the testing and diagnostics of the latest generation of SRAM, one of the most widely applied types of memory. Classical methods for testing memory are designed to handle the so-called 'static faults,' but these test solutions are not sufficient for faults that are emerging in the latest Very Deep Sub-Micron (VDSM) technologies. These new fault models, referred to as 'dynamic faults', are not covered by classical test solutions and require the dedicated test sequences presented in this book.Springer-Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg 188 pp. Englisch.
