Atomic Force Microscopy Applications (84 results)
- Hardcover
Seller: ThriftBooks-Dallas, Dallas, TX, U.S.A.ThriftBooks-Dallas
Contact seller5-star sellerCondition: Used - Very good
US$ 19.77
Free ShippingShips within U.S.A.Quantity: 1 available
Hardcover. Condition: Very Good. No Jacket. Former library book; May have limited writing in cover pages. Pages are unmarked. ~ ThriftBooks: Read More, Spend Less.
- Hardcover
Seller: Bingo Books 2, Vancouver, WA, U.S.A.Bingo Books 2
Contact seller4-star sellerCondition: Used - Good
US$ 27.50
US$ 6.29 shippingShips within U.S.A.Quantity: 1 available
Hardcover. Condition: Good. 2nd Edition. REVISED HARDBACK BOOK IN GOOD TO VERY GOOD CONDITION,BOOK IS SLIGHTLY TWISTED.
- More images
- Hardcover
Seller: Don's Book Store, Albuquerque, NM, U.S.A.Don's Book Store
Contact seller5-star sellerCondition: Used - Very good
US$ 45.00
Free ShippingShips within U.S.A.Quantity: 1 available
Hard Back. Condition: Very Good. No Dust Jacket. Revised Edition - Third Printing. 263 Pages Indexed. Solid book in great condition. High interest and major advances in the technology of scanning force microscopy that have taken place since the 1991 release has made this Revised Edition necessary. The tenth anniversary of Scanni…ng Tunneling Microscopy, celebrated at the Sixth International Conference on Scanning Tunneling Microscopy in Interlaken, Switzerland August 12-16, 1991, with more than one thousand participants, produced three volumes of papers that attest to the ever-growing interest in this technology. As the field of scanning force microscopy has matured, a gradual shift in gears has taken place, from activities involving the development of instruments to their use as probes in a large rainbow of disciplines. Therefore, this new print, which includes all the material contained in the first print, additionally has the latest available list of new references that deal with electric, magnetic, and atomic force microscopy. It should also be noted that several scanning force microscopy related reviews have appeared, some of which present detailed information on specialized topics. Contents in 13 Chapters: Mechanical Properties of Levers, Resonance Enhancement, Sources of Noise, Tuneling Detection System, Capacitance Detection System, Homodyne Detection System, Heterodyne Detection System, Laser-Diode Feedback Detection System, Polarization Detection System, Deflection System, Electric Force Microscopy, Magnetic Force Microscopy, and Atomic Force Microscopy.
- Hardcover
Seller: Anybook.com, Lincoln, United KingdomAnybook.com
Contact seller5-star sellerCondition: Used - Fair
US$ 27.17
US$ 18.12 shippingShips from United Kingdom to U.S.A.Quantity: 1 available
Condition: Fair. This is an ex-library book and may have the usual library/used-book markings inside.This book has hardback covers. Clean from markings. In fair condition, suitable as a study copy. Please note the Image in this listing is a stock photo and may not match the covers of the actual item,800grams, ISBN:019509204X.
- Hardcover
Seller: Anybook.com, Lincoln, United KingdomAnybook.com
Contact seller5-star sellerCondition: Used - Good
US$ 28.39
US$ 18.12 shippingShips from United Kingdom to U.S.A.Quantity: 1 available
Condition: Good. This is an ex-library book and may have the usual library/used-book markings inside.This book has hardback covers. In good all round condition. Please note the Image in this listing is a stock photo and may not match the covers of the actual item,650grams, ISBN:9780195092042.
- Hardcover
Seller: Once Upon A Time Books, Siloam Springs, AR, U.S.A.Once Upon A Time Books
Contact seller4-star sellerCondition: Used - Good
US$ 43.51
US$ 3.95 shippingShips within U.S.A.Quantity: 1 available
hardcover. Condition: Good. This is a used book in good condition and may show some signs of use or wear . This is a used book in good condition and may show some signs of use or wear .
- More images
- Softcover
Seller: GreatBookPrices, Columbia, MD, U.S.A.GreatBookPrices
Contact seller5-star sellerCondition: New
US$ 74.55
US$ 2.64 shippingShips within U.S.A.Quantity: Over 20 available
Condition: New.
Language: English
Published by VDM Verlag Dr. Mueller e.K. 2008-06-19, 2008
- Softcover
Seller: Chiron Media, Wallingford, United KingdomChiron Media
Contact seller5-star sellerCondition: New
US$ 71.52
US$ 20.64 shippingShips from United Kingdom to U.S.A.Quantity: 10 available
Paperback. Condition: New.
- Softcover
Seller: Ria Christie Collections, Uxbridge, United KingdomRia Christie Collections
Contact seller5-star sellerCondition: New
US$ 75.89
US$ 15.96 shippingShips from United Kingdom to U.S.A.Quantity: Over 20 available
Condition: New. In.
- More images
- Softcover
Seller: GreatBookPricesUK, Woodford Green, United KingdomGreatBookPricesUK
Contact seller5-star sellerCondition: New
US$ 74.93
US$ 19.98 shippingShips from United Kingdom to U.S.A.Quantity: Over 20 available
Condition: New.
- Hardcover
Seller: BennettBooksLtd, Los Angeles, CA, U.S.A.BennettBooksLtd
Contact seller5-star sellerCondition: New
US$ 89.24
US$ 6.95 shippingShips within U.S.A.Quantity: 1 available
hardcover. Condition: New. In shrink wrap. Looks like an interesting title.
Atomic Force Microscopy Fundamentals and Applications
Mishra, Dr. Pramita/ Solanki, Dr. Vanarajsinh/ Dasadiya, Dr. Abhay
- Softcover
Seller: Revaluation Books, Exeter, United KingdomRevaluation Books
Contact seller5-star sellerCondition: New
US$ 84.91
US$ 13.32 shippingShips from United Kingdom to U.S.A.Quantity: 1 available
Paperback. Condition: Brand New. 60 pages. 8.66x5.91x0.14 inches. In Stock.
- More images
- Softcover
Seller: preigu, Osnabrück, Germanypreigu
Contact seller5-star sellerCondition: New
US$ 42.59
US$ 79.63 shippingShips from Germany to U.S.A.Quantity: 5 available
Taschenbuch. Condition: Neu. Atomic Force Microscopy Fundamentals and Applications | Vanarajsinh Solanki (u. a.) | Taschenbuch | 60 S. | Englisch | 2019 | LAP LAMBERT Academic Publishing | EAN 9786200247247 | Verantwortliche Person für die EU: preigu GmbH & Co. KG, Lengericher Landstr. 19, 49078 Osnabrück, mail[at]preigu[dot]de…| Anbieter: preigu.
Language: English
Published by Secaucus, New Jersey, U.S.A.: Springer Verlag, 2002
- Hardcover
Seller: Bingo Books 2, Vancouver, WA, U.S.A.Bingo Books 2
Contact seller4-star sellerCondition: Used - Fine
US$ 120.00
US$ 6.29 shippingShips within U.S.A.Quantity: 1 available
Hardcover. Condition: Fine. hardback book in fine condition.
- Softcover
Seller: Ria Christie Collections, Uxbridge, United KingdomRia Christie Collections
Contact seller5-star sellerCondition: New
US$ 130.94
US$ 15.96 shippingShips from United Kingdom to U.S.A.Quantity: Over 20 available
Condition: New. In.
- Hardcover
Seller: Buchpark, Trebbin, GermanyBuchpark
Contact seller5-star sellerCondition: Used - Fine
US$ 33.50
US$ 119.45 shippingShips from Germany to U.S.A.Quantity: 1 available
Condition: Sehr gut. Zustand: Sehr gut | Seiten: 284 | Sprache: Englisch | Produktart: Bücher | This revised edition has been updated to include important new research in scanning force microscopy since the publication of the original edition in 1991. The bibliography has been thoroughly revised. Basic theory, instrumentation an…d applications are discussed.
- Hardcover
Seller: California Books, Miami, FL, U.S.A.California Books
Contact seller4-star sellerCondition: New
US$ 154.00
Free ShippingShips within U.S.A.Quantity: Over 20 available
Condition: New.
- Softcover
Seller: Anybook.com, Lincoln, United KingdomAnybook.com
Contact seller5-star sellerCondition: Used - Fair
US$ 116.64
US$ 41.83 shippingShips from United Kingdom to U.S.A.Quantity: 1 available
Condition: Fair. This is an ex-library book and may have the usual library/used-book markings inside.This book has soft covers. In fair condition, suitable as a study copy. Please note the Image in this listing is a stock photo and may not match the covers of the actual item,700grams, ISBN:9781489939319.
- Softcover
Seller: Rarewaves.com UK, London, United KingdomRarewaves.com UK
Contact seller5-star sellerCondition: New
US$ 75.13
US$ 86.60 shippingShips from United Kingdom to U.S.A.Quantity: Over 20 available
Book. Condition: New.
- Hardcover
Seller: Brook Bookstore On Demand, Napoli, NA, ItalyBrook Bookstore On Demand
Contact seller5-star sellerCondition: New
US$ 159.82
US$ 9.10 shippingShips from Italy to U.S.A.Quantity: Over 20 available
Condition: new.
- Hardcover
Seller: Ria Christie Collections, Uxbridge, United KingdomRia Christie Collections
Contact seller5-star sellerCondition: New
US$ 152.80
US$ 15.96 shippingShips from United Kingdom to U.S.A.Quantity: Over 20 available
Condition: New. In.
- More images
- Hardcover
Seller: GreatBookPrices, Columbia, MD, U.S.A.GreatBookPrices
Contact seller5-star sellerCondition: New
US$ 164.94
US$ 2.64 shippingShips within U.S.A.Quantity: Over 20 available
Condition: New.
- More images
Language: English
Published by VDM Verlag Dr. Müller, VDM Verlag Dr. Müller E.K., 2008
- Softcover
Seller: AHA-BUCH GmbH, Einbeck, GermanyAHA-BUCH GmbH
Contact seller5-star sellerCondition: New
US$ 99.62
US$ 69.85 shippingShips from Germany to U.S.A.Quantity: 2 available
Taschenbuch. Condition: Neu. Neuware - The atomic force microscope (AFM) was originally utilised for its imaging capabilities. The full potential of the AFM as a three-dimensional force profiling instrument is only now being realised in an increasingly broad range of fields. One of the key requirements for AFM measurements is th…e quantification of both in-plane and out-of-plane forces acting between the tip and the sample. In this book the procedure for calibration and the various factors to consider when undertaking such studies is outlined with a focus on force-versus-distance and frictional measurements. Examples of surface property analyses, based on the quantification of forces, are shown, with examples ranging from living animal cells to polymeric materials. This book is designed for researchers and students who are interested in carrying out nano scale force measurements in the biological, physical and chemical sciences on a range of systems.
- More images
- Hardcover
Seller: GreatBookPricesUK, Woodford Green, United KingdomGreatBookPricesUK
Contact seller5-star sellerCondition: New
US$ 167.83
US$ 19.98 shippingShips from United Kingdom to U.S.A.Quantity: Over 20 available
Condition: New.
- More images
- Hardcover
Seller: GreatBookPrices, Columbia, MD, U.S.A.GreatBookPrices
Contact seller5-star sellerCondition: Used - As new
US$ 186.82
US$ 2.64 shippingShips within U.S.A.Quantity: Over 20 available
Condition: As New. Unread book in perfect condition.
- More images
- Hardcover
Seller: GreatBookPrices, Columbia, MD, U.S.A.GreatBookPrices
Contact seller5-star sellerCondition: New
US$ 187.62
US$ 2.64 shippingShips within U.S.A.Quantity: Over 20 available
Condition: New.
- More images
- Softcover
Seller: AHA-BUCH GmbH, Einbeck, GermanyAHA-BUCH GmbH
Contact seller5-star sellerCondition: New
US$ 125.36
US$ 69.67 shippingShips from Germany to U.S.A.Quantity: 1 available
Taschenbuch. Condition: Neu. Druck auf Anfrage Neuware - Printed after ordering - This book is intended for scientists and engineers in the field of micro- and nano electro-mechanical systems (MEMS and NEMS) and introduces the development of cantilever-based sensor systems using CMOS-compatible micromachining from the design con…cepts and simulations to the prototype. It is also a useful resource for researchers on cantilever sensors and resonant sensors in general The reader will become familiar with the potential of the combination of two technological approaches: IC fabrication technology, notably CMOS technology, and silicon micromachining and the resulting microstructures such as cantilever beams. It was recognized early that these two technologies should be merged in order to make the microstructures smart and devise integrated microsystems with on-chip driving and signal conditioning circuitry - now known as CMOS MEMS or, with the arrival of nanostructures, CMOS NEMS. One way to achieve the merger is the post-processing micro- or nano- machining of finished CMOS wafers, some of which is described in this book. The book introduces this approach based on work carried out at the Physical Electronics Laboratory of ETH Zurich on arrays of cantilever transducers with on-chip driving and signal conditioning circuitry. These cantilevers are familiar from Scanning Probe Microscopy (SPM) and allow the sensitive detection of phys ical quantities such as forces and mass changes. The book is divided into three parts. First, general aspects of cantilever resona tors are introduced, e. g. their resonant behavior and possible driving and sensing mechanisms.
- Hardcover
Seller: Ria Christie Collections, Uxbridge, United KingdomRia Christie Collections
Contact seller5-star sellerCondition: New
US$ 184.34
US$ 15.96 shippingShips from United Kingdom to U.S.A.Quantity: Over 20 available
Condition: New. In.
- Hardcover
Seller: ThriftBooks-Dallas, Dallas, TX, U.S.A.ThriftBooks-Dallas
Contact seller5-star sellerCondition: Used - As new
US$ 199.99
Free ShippingShips within U.S.A.Quantity: 1 available
Hardcover. Condition: As New. No Jacket. Pages are clean and are not marred by notes or folds of any kind. ~ ThriftBooks: Read More, Spend Less.
- More images
Language: English
Published by Springer, 2002
- Hardcover
Seller: AHA-BUCH GmbH, Einbeck, GermanyAHA-BUCH GmbH
Contact seller5-star sellerCondition: New
US$ 132.13
US$ 70.58 shippingShips from Germany to U.S.A.Quantity: 1 available
Buch. Condition: Neu. Druck auf Anfrage Neuware - Printed after ordering - This book is intended for scientists and engineers in the field of micro- and nano electro-mechanical systems (MEMS and NEMS) and introduces the development of cantilever-based sensor systems using CMOS-compatible micromachining from the design concepts a…nd simulations to the prototype. It is also a useful resource for researchers on cantilever sensors and resonant sensors in general The reader will become familiar with the potential of the combination of two technological approaches: IC fabrication technology, notably CMOS technology, and silicon micromachining and the resulting microstructures such as cantilever beams. It was recognized early that these two technologies should be merged in order to make the microstructures smart and devise integrated microsystems with on-chip driving and signal conditioning circuitry - now known as CMOS MEMS or, with the arrival of nanostructures, CMOS NEMS. One way to achieve the merger is the post-processing micro- or nano- machining of finished CMOS wafers, some of which is described in this book. The book introduces this approach based on work carried out at the Physical Electronics Laboratory of ETH Zurich on arrays of cantilever transducers with on-chip driving and signal conditioning circuitry. These cantilevers are familiar from Scanning Probe Microscopy (SPM) and allow the sensitive detection of phys ical quantities such as forces and mass changes. The book is divided into three parts. First, general aspects of cantilever resona tors are introduced, e. g. their resonant behavior and possible driving and sensing mechanisms.
