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Defect Recognition Image Processing by Doneker Rechenberg (4 results)
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Defect Recognition and Image Processing in Semiconductors 1997: Proceedings of the seventh conference on Defect Recognition and Image Processing, . 160 (Institute of Physics Conference Series)
Language: English
Published by CRC Press 1998-01-01, 1998
ISBN 10: 0750305002 ISBN 13: 9780750305006
US$ 388.92
US$ 20.88 shipping
Ships from United Kingdom to U.S.A.Quantity: 5 available
Add to basketHardcover. Condition: New.
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Defect Recognition and Image Processing in Semiconductors 1997: Proceedings of the seventh conference on Defect Recognition and Image Processing, ... 1997 (Institute of Physics Conference Series)
Seller: Ria Christie Collections, Uxbridge, United Kingdom
Seller rating 5 out of 5 stars
US$ 482.85
US$ 16.15 shipping
Ships from United Kingdom to U.S.A.Quantity: Over 20 available
Add to basketCondition: New. In.
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Defect Recognition and Image Processing in Semiconductors 1997
Language: English
Published by Taylor & Francis Group, 1998
ISBN 10: 0750305002 ISBN 13: 9780750305006
Condition: New. pp. 548.
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US$ 390.46
US$ 57.89 shipping
Ships from Germany to U.S.A.Quantity: Over 20 available
Add to basketGebunden. Condition: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Doneker, J.Defect Recognition and Image Processing in Semiconductors 1997 provides a valuable overview of current techniques used to assess, monitor, and characterize defects from the atomic scale to inhomogeneities in complete silicon wafers. This .
