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An Introduction to Methods and Models in Ecology, Evolution, and Conservation Biology
Language: English
Published by Princeton University Press, 2010, 2010
ISBN 10: 0691127247 ISBN 13: 9780691127248
Seller: Virginia Martin, aka bookwitch, Concord, CA, U.S.A.
Seller rating 5 out of 5 stars
First Edition
Soft cover. Condition: New. Lorraine Betz Doneker (illustrator). 1st Edition. Quarto, softcover, new in brown and black pictorial wraps. 261 pp. inluding glossary and index plus list of contributors. introduces undergraduate students to quantitative models and methods in ecology, behavioral ecology, evolutionary biology, and conservation. It explores the core concepts shared by these related fields using tools and practical skills such as experimental design, generating phylogenies, basic statistical inference, and persuasive grant writing. --- featuring a collaborative "active learning" approach that emphasizes hands-on learning. Every chapter has exercises that enable students to work directly with the material at their own pace and in small groups.
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Defect Recognition and Image Processing in Semiconductors 1997: Proceedings of the seventh conference on Defect Recognition and Image Processing, . 160 (Institute of Physics Conference Series)
Language: English
Published by CRC Press 1998-01-01, 1998
ISBN 10: 0750305002 ISBN 13: 9780750305006
US$ 384.53
US$ 20.65 shipping
Ships from United Kingdom to U.S.A.Quantity: 5 available
Add to basketHardcover. Condition: New.
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Defect Recognition and Image Processing in Semiconductors 1997
Language: English
Published by Taylor & Francis Group, 1998
ISBN 10: 0750305002 ISBN 13: 9780750305006
Condition: New. pp. 548.
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Defect Recognition and Image Processing in Semiconductors 1997: Proceedings of the seventh conference on Defect Recognition and Image Processing, ... 1997 (Institute of Physics Conference Series)
Seller: Ria Christie Collections, Uxbridge, United Kingdom
Seller rating 5 out of 5 stars
US$ 485.06
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Defect Recognition and Image Processing in Semiconductors 1997
Language: English
Published by Taylor & Francis Group, 1998
ISBN 10: 0750305002 ISBN 13: 9780750305006
Condition: New. pp. 548.
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US$ 384.08
US$ 56.94 shipping
Ships from Germany to U.S.A.Quantity: Over 20 available
Add to basketGebunden. Condition: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Doneker, J.Defect Recognition and Image Processing in Semiconductors 1997 provides a valuable overview of current techniques used to assess, monitor, and characterize defects from the atomic scale to inhomogeneities in complete silicon wafers. This .
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Defect Recognition and Image Processing in Semiconductors 1997
Language: English
Published by Taylor & Francis Group, 1998
ISBN 10: 0750305002 ISBN 13: 9780750305006
US$ 440.21
US$ 8.66 shipping
Ships from United Kingdom to U.S.A.Quantity: 3 available
Add to basketCondition: New. pp. 548 52:B&W 6.14 x 9.21in or 234 x 156mm (Royal 8vo) Case Laminate on White w/Gloss Lam This item is printed on demand.
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Defect Recognition and Image Processing in Semiconductors 1997
Seller: PBShop.store UK, Fairford, GLOS, United Kingdom
Seller rating 5 out of 5 stars
US$ 486.29
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Ships from United Kingdom to U.S.A.Quantity: Over 20 available
Add to basketHRD. Condition: New. New Book. Delivered from our UK warehouse in 4 to 14 business days. THIS BOOK IS PRINTED ON DEMAND. Established seller since 2000.
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HRD. Condition: New. New Book. Shipped from UK. THIS BOOK IS PRINTED ON DEMAND. Established seller since 2000.
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Buch. Condition: Neu. nach der Bestellung gedruckt Neuware - Printed after ordering - Defect Recognition and Image Processing in Semiconductors 1997 provides a valuable overview of current techniques used to assess, monitor, and characterize defects from the atomic scale to inhomogeneities in complete silicon wafers. This volume addresses advances in defect analyzing techniques and instrumentation and their application to substrates, epilayers, and devices. The book discusses the merits and limits of characterization techniques; standardization; correlations between defects and device performance, including degradation and failure analysis; and the adaptation and application of standard characterization techniques to new materials. It also examines the impressive advances made possible by the increase in the number of nanoscale scanning techniques now available. The book investigates defects in layers and devices, and examines the problems that have arisen in characterizing gallium nitride and silicon carbide.
