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Hierarchical Modeling Vlsi Circuit Testing by Bhattacharya Debashis Hayes John (14 results)
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Hierarchical Modeling for VLSI Circuit Testing (The Springer International Series in Engineering and Computer Science, 89)
Seller: Goodwill of Silicon Valley, SAN JOSE, CA, U.S.A.
Seller rating 4 out of 5 stars
Condition: very_good. Supports Goodwill of Silicon Valley job training programs. The cover and pages are in very good condition! The cover and any other included accessories are also in very good condition showing some minor use. The spine is straight, there are no rips tears or creases on the cover or the pages.
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Hardcover. Condition: New. US SELLER SHIPS FAST FROM USA.
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US$ 48.92
Convert currencyUS$ 45.13 shipping from Germany to U.S.A.Quantity: 1 available
Add to basketHardcover. 1990. 160 Seiten Ehem. Bibliotheksexemplar mit üblichen Merkmalen wie Signatur und Stempel. Moderate Lager- und Gebrauchsspuren. Text bis auf selten mögliche Anstreichungen sauber. Insgesamt guter Zustand. Sprache: englisch. Ex library book with stamps and signature. Slight signs of use. Good condition. Language: english. 9780792390589 Sprache: Englisch Gewicht in Gramm: 939.
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US$ 116.06
Convert currencyUS$ 3.99 shipping within U.S.A.Quantity: Over 20 available
Add to basketCondition: New.
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US$ 116.44
Convert currencyUS$ 3.99 shipping within U.S.A.Quantity: Over 20 available
Add to basketCondition: New.
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Hierarchical Modeling for VLSI Circuit Testing (The Springer International Series in Engineering and Computer Science, 89)
Seller: Ria Christie Collections, Uxbridge, United Kingdom
Seller rating 5 out of 5 stars
US$ 134.93
Convert currencyUS$ 16.08 shipping from United Kingdom to U.S.A.Quantity: Over 20 available
Add to basketCondition: New. In.
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Hierarchical Modeling for VLSI Circuit Testing (The Springer International Series in Engineering and Computer Science)
Seller: Ria Christie Collections, Uxbridge, United Kingdom
Seller rating 5 out of 5 stars
US$ 134.93
Convert currencyUS$ 16.08 shipping from United Kingdom to U.S.A.Quantity: Over 20 available
Add to basketCondition: New. In.
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Condition: New. pp. 176.
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US$ 137.87
Convert currencyUS$ 55.27 shipping from Germany to U.S.A.Quantity: Over 20 available
Add to basketGebunden. Condition: New. Test generation is one of the most difficult tasks facing the designer of complex VLSI-based digital systems. Much of this difficulty is attributable to the almost universal use in testing of low, gate-level circuit and fault models that predate integrated .
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US$ 189.36
Convert currencyUS$ 33.55 shipping from United Kingdom to U.S.A.Quantity: 1 available
Add to basketPaperback. Condition: Like New. Like New. book.
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Hierarchical Modeling for VLSI Circuit Testing
Seller: Celler Versandantiquariat, Eicklingen, Germany
Association Member: GIAQ
Seller rating 5 out of 5 stars
US$ 23.24
Convert currencyUS$ 42.87 shipping from Germany to U.S.A.Quantity: 1 available
Add to basketKluwer, Boston, 1990. X, 159 pages with some graphics, hard cover---Verlag: Kluwer Verlag: Kluwer -former library book in good condition- 460 Gramm.
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US$ 108.07
Convert currencyUS$ 55.27 shipping from Germany to U.S.A.Quantity: Over 20 available
Add to basketCondition: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Test generation is one of the most difficult tasks facing the designer of complex VLSI-based digital systems. Much of this difficulty is attributable to the almost universal use in testing of low, gate-level circuit and fault models that predate integrated .
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US$ 179.25
Convert currencyUS$ 8.72 shipping from United Kingdom to U.S.A.Quantity: 4 available
Add to basketCondition: New. Print on Demand pp. 176 49:B&W 6.14 x 9.21 in or 234 x 156 mm (Royal 8vo) Perfect Bound on White w/Gloss Lam.
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US$ 193.36
Convert currencyUS$ 11.23 shipping from Germany to U.S.A.Quantity: 4 available
Add to basketCondition: New. PRINT ON DEMAND pp. 176.
