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High Resolution X Ray Diffractometry by Bowen D K (23 results)
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Condition: As New. Unread book in perfect condition.
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Hardcover. Condition: Very Good. Gift inscription by Author to fly leaf. This book is in very good condition; no remainder marks. It does have some cover shelfwear. Inside pages are clean. ; 24.6 X 17.4 X 1.56 centimeters; 264 pages.
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Condition: New.
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US$ 102.24
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Ships from United Kingdom to U.S.A.Quantity: 3 available
Add to basketCondition: New. pp. 264.
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High Resolution X-ray Diffractometry and Topography
Seller: GreatBookPricesUK, Woodford Green, United Kingdom
Seller rating 5 out of 5 stars
US$ 102.46
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Ships from United Kingdom to U.S.A.Quantity: 10 available
Add to basketCondition: As New. Unread book in perfect condition.
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Condition: New. pp. 264.
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High Resolution X-ray Diffractometry and Topography
Seller: GreatBookPricesUK, Woodford Green, United Kingdom
Seller rating 5 out of 5 stars
US$ 109.40
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Ships from United Kingdom to U.S.A.Quantity: 10 available
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High Resolution X-Ray Diffractometry And Topography
Seller: Ria Christie Collections, Uxbridge, United Kingdom
Seller rating 5 out of 5 stars
US$ 118.28
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Condition: New. pp. 264.
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US$ 153.54
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Add to basketPaperback. Condition: Brand New. 264 pages. 9.69x6.85x0.70 inches. In Stock.
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US$ 146.89
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Add to basketPaperback. Condition: New. NEW. SHIPS FROM MULTIPLE LOCATIONS. book.
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Hardcover. Condition: New. In shrink wrap. Looks like an interesting title!
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High Resolution X-Ray Diffractometry And Topography
Seller: Ria Christie Collections, Uxbridge, United Kingdom
Seller rating 5 out of 5 stars
US$ 325.82
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US$ 325.64
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Add to basketHardcover. Condition: Like New. LIKE NEW. SHIPS FROM MULTIPLE LOCATIONS. book.
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US$ 419.33
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Add to basketHardcover. Condition: Brand New. 1st edition. 252 pages. 10.25x7.00x0.75 inches. In Stock.
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PAP. Condition: New. New Book. Shipped from UK. THIS BOOK IS PRINTED ON DEMAND. Established seller since 2000.
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High Resolution X-Ray Diffractometry And Topography
Seller: PBShop.store UK, Fairford, GLOS, United Kingdom
Seller rating 5 out of 5 stars
US$ 120.07
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Add to basketPAP. Condition: New. New Book. Delivered from our UK warehouse in 4 to 14 business days. THIS BOOK IS PRINTED ON DEMAND. Established seller since 2000.
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Condition: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Bowen, D.K. Tanner, Brian K.The study and application of electronic materials has created an increasing demand for sophisticated and reliable techniques for examining and characterizing these materials. This comprehensive book looks at the area of x-ra.
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Taschenbuch. Condition: Neu. nach der Bestellung gedruckt Neuware - Printed after ordering - The rapid growth in the applications of electronic materials has created an increasing demand for reliable techniques for examining and characterizing these materials. This book explores the area of x-ray diffraction and the techniques available for deployment in research, development, and production. It maps the theoretical and practical background necessary to study single crystal materials using high resolution x-ray diffraction and topography. It combines mathematical formalism with graphical explanations and hands-on advice for interpreting data, thus providing the theoretical and practical background for applying these techniques in scientific and industrial materials characterization.
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Ships from Germany to U.S.A.Quantity: Over 20 available
Add to basketCondition: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Bowen, D.K. Tanner, Brian K.The study and application of electronic materials has created an increasing demand for sophisticated and reliable techniques for examining and characterizing these materials. This comprehensive book looks at the area of .
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HRD. Condition: New. New Book. Shipped from UK. THIS BOOK IS PRINTED ON DEMAND. Established seller since 2000.
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High Resolution X-Ray Diffractometry And Topography
Seller: PBShop.store UK, Fairford, GLOS, United Kingdom
Seller rating 5 out of 5 stars
US$ 331.88
US$ 6.75 shipping
Ships from United Kingdom to U.S.A.Quantity: Over 20 available
Add to basketHRD. Condition: New. New Book. Delivered from our UK warehouse in 4 to 14 business days. THIS BOOK IS PRINTED ON DEMAND. Established seller since 2000.
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Buch. Condition: Neu. nach der Bestellung gedruckt Neuware - Printed after ordering - The study and application of electronic materials has created an increasing demand for sophisticated and reliable techniques for examining and characterizing these materials. This comprehensive book looks at the area of x-ray diffraction and the modern techniques available for deployment in research, development, and production. It provides the theoretical and practical background for applying these techniques in scientific and industrial materials characterization. The main aim of the book is to map the theoretical and practical background necessary to the study of single crystal materials by means of high-resolution x-ray diffraction and topography. It combines mathematical formalisms with graphical explanations and hands-on practical advice for interpreting data.
