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Nanometer Scale Defect Detection Using by Dahoo Pierre Richard (20 results)
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US$ 37.41
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Nanometer-scale Defect Detection Using Polarized Light
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Nanometer-scale Defect Detection Using Polarized Light
Seller: GreatBookPricesUK, Woodford Green, United Kingdom
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Nanometer-scale Defect Detection Using Polarized Light (Mechanical Engineering and Solid Mechanics: Reliability of Multiphysical Systems, 2)
Seller: Ria Christie Collections, Uxbridge, United Kingdom
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US$ 198.12
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Nanometer-scale Defect Detection Using Polarized Light (Mechanical Engineering and Solid Mechanics: Reliability of Multiphysical Systems)
Published by ISTE Ltd. 2016-08-12, 2016
ISBN 10: 1848219369 ISBN 13: 9781848219366
Language: English
US$ 194.11
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Nanometer-scale Defect Detection Using Polarized Light
Published by ISTE Ltd and John Wiley & Sons Inc, 2016
ISBN 10: 1848219369 ISBN 13: 9781848219366
Language: English
Seller: THE SAINT BOOKSTORE, Southport, United Kingdom
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US$ 214.66
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Nanometer-Scale Defect Detection Using Polarized Light
Published by ISTE Ltd and John Wiley & Sons Inc, 2016
ISBN 10: 1848219369 ISBN 13: 9781848219366
Language: English
Seller: Kennys Bookshop and Art Galleries Ltd., Galway, GY, Ireland
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First Edition
US$ 216.97
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Add to basketCondition: New. This book describes the methods used to detect material defects at the nanoscale. The authors present different theories, polarization states and interactions of light with matter, in particular optical techniques using polarized light. Num Pages: 316 pages, black & white illustrations. BIC Classification: TBN; TGMT; TTB. Category: (P) Professional & Vocational. Dimension: 242 x 164 x 22. Weight in Grams: 622. . 2016. 1st Edition. Hardcover. . . . .
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Nanometer-scale Defect Detection Using Polarized Light
Published by ISTE Ltd and John Wiley and Sons Inc, GB, 2016
ISBN 10: 1848219369 ISBN 13: 9781848219366
Language: English
Seller: Rarewaves.com USA, London, LONDO, United Kingdom
Seller rating 5 out of 5 stars
US$ 235.34
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Add to basketHardback. Condition: New. This book describes the methods used to detect material defects at the nanoscale. The authors present different theories, polarization states and interactions of light with matter, in particular optical techniques using polarized light. Combining experimental techniques of polarized light analysis with techniques based on theoretical or statistical models to study faults or buried interfaces of mechatronic systems, the authors define the range of validity of measurements of carbon nanotube properties. The combination of theory and pratical methods presented throughout this book provide the reader with an insight into the current understanding of physicochemical processes affecting the properties of materials at the nanoscale.
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US$ 208.06
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Add to basketBuch. Condition: Neu. Neuware - This book describes the methods used to detect material defects at the nanoscale. The authors present different theories, polarization states and interactions of light with matter, in particular optical techniques using polarized light.
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Nanometer-Scale Defect Detection Using Polarized Light
Published by John Wiley & Sons, Ltd., 2015
ISBN 10: 1848219369 ISBN 13: 9781848219366
Language: English
US$ 199.28
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Add to basketCondition: New. This book describes the methods used to detect material defects at the nanoscale. The authors present different theories, polarization states and interactions of light with matter, in particular optical techniques using polarized light.Klappentext.
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Nanometer-scale Defect Detection Using Polarized Light
Published by Iste/Hermes Science Pub, 2016
ISBN 10: 1848219369 ISBN 13: 9781848219366
Language: English
US$ 255.41
Convert currencyUS$ 13.44 shipping from United Kingdom to U.S.A.Quantity: 2 available
Add to basketHardcover. Condition: Brand New. 200 pages. 10.00x6.50x1.00 inches. In Stock.
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Nanometer-Scale Defect Detection Using Polarized Light
Published by ISTE Ltd and John Wiley & Sons Inc, 2016
ISBN 10: 1848219369 ISBN 13: 9781848219366
Language: English
Condition: New. This book describes the methods used to detect material defects at the nanoscale. The authors present different theories, polarization states and interactions of light with matter, in particular optical techniques using polarized light. Num Pages: 316 pages, black & white illustrations. BIC Classification: TBN; TGMT; TTB. Category: (P) Professional & Vocational. Dimension: 242 x 164 x 22. Weight in Grams: 622. . 2016. 1st Edition. Hardcover. . . . . Books ship from the US and Ireland.
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Nanometer-scale Defect Detection Using Polarized Light
Published by ISTE Ltd and John Wiley and Sons Inc, GB, 2016
ISBN 10: 1848219369 ISBN 13: 9781848219366
Language: English
US$ 227.80
Convert currencyUS$ 87.38 shipping from United Kingdom to U.S.A.Quantity: 1 available
Add to basketHardback. Condition: New. This book describes the methods used to detect material defects at the nanoscale. The authors present different theories, polarization states and interactions of light with matter, in particular optical techniques using polarized light. Combining experimental techniques of polarized light analysis with techniques based on theoretical or statistical models to study faults or buried interfaces of mechatronic systems, the authors define the range of validity of measurements of carbon nanotube properties. The combination of theory and pratical methods presented throughout this book provide the reader with an insight into the current understanding of physicochemical processes affecting the properties of materials at the nanoscale.
-
Nanometer-scale Defect Detection Using Polarized Light
Published by Iste/Hermes Science Pub, 2016
ISBN 10: 1848219369 ISBN 13: 9781848219366
Language: English
US$ 241.56
Convert currencyUS$ 13.44 shipping from United Kingdom to U.S.A.Quantity: 2 available
Add to basketHardcover. Condition: Brand New. 200 pages. 10.00x6.50x1.00 inches. In Stock. This item is printed on demand.
