Language: English
Published by Cambridge University Press, 1998
ISBN 10: 0521352223 ISBN 13: 9780521352222
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Language: English
Published by Cambridge University Press, 1998
ISBN 10: 0521352223 ISBN 13: 9780521352222
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Hardcover. Condition: Very Good. No Jacket. Former library book; May have limited writing in cover pages. Pages are unmarked. ~ ThriftBooks: Read More, Spend Less.
Language: English
Published by Cambridge University Press, 2008
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Paperback. Condition: Wie neu. Revised ed. 216 S. Like new. Shrink wrapped. Sprache: Englisch Gewicht in Gramm: 455.
Language: English
Published by Cambridge University Press, 1998
ISBN 10: 052101753X ISBN 13: 9780521017534
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Add to basketSoft cover. Condition: Good. No Jacket. Condition : Good. Former university library copy with associated markings. Soft cover, no jacket. 198pp. No annotations or highlighting. Covered in protective laminate. Photo on request.
Language: English
Published by Cambridge University Press, 2005
ISBN 10: 052101753X ISBN 13: 9780521017534
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Language: English
Published by Cambridge University Press, 2005
ISBN 10: 052101753X ISBN 13: 9780521017534
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Language: English
Published by Cambridge University Press 2005-12, 2005
ISBN 10: 052101753X ISBN 13: 9780521017534
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Language: English
Published by Cambridge University Press, 2008
ISBN 10: 052101753X ISBN 13: 9780521017534
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Condition: New. The book describes the development of two powerful techniques for polymer surface studies. Series Editor(s): Clarke, D. R.; Suresh, S.; Ward, I. M. Series: Cambridge Solid State Science Series. Num Pages: 216 pages, 119 b/w illus. 19 tables. BIC Classification: TGM. Category: (P) Professional & Vocational. Dimension: 247 x 174 x 12. Weight in Grams: 350. . 2008. Revised ed. paperback. . . . .
Language: English
Published by Cambridge University Press, 2005
ISBN 10: 052101753X ISBN 13: 9780521017534
Seller: Kennys Bookstore, Olney, MD, U.S.A.
Condition: New. The book describes the development of two powerful techniques for polymer surface studies. Series Editor(s): Clarke, D. R.; Suresh, S.; Ward, I. M. Series: Cambridge Solid State Science Series. Num Pages: 216 pages, 119 b/w illus. 19 tables. BIC Classification: TGM. Category: (P) Professional & Vocational. Dimension: 247 x 174 x 12. Weight in Grams: 350. . 2008. Revised ed. paperback. . . . . Books ship from the US and Ireland.
Language: English
Published by Cambridge University Press, 2011
ISBN 10: 0521352223 ISBN 13: 9780521352222
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Condition: Gut. Zustand: Gut | Sprache: Englisch | Produktart: Bücher | The book describes the development of two powerful techniques for polymer surface studies.
Language: English
Published by Cambridge University Press, 2005
ISBN 10: 052101753X ISBN 13: 9780521017534
Seller: AHA-BUCH GmbH, Einbeck, Germany
Taschenbuch. Condition: Neu. Druck auf Anfrage Neuware - Printed after ordering - This in-depth treatment of the instrumentation, physical bases and applications of x-ray photoelectron spectroscopy (XPS) and static secondary ion mass spectroscopy (SSIMS) contains a specific focus on the subject of polymeric materials. XPS and SSIMS are widely accepted as the two most powerful techniques for polymer surface chemical analysis, particularly in the context of industrial research and problem solving. The author describes the techniques and applications of XPS and SSIMS. He also includes details of case studies, emphasizing the complementary and joint application of XPS and SSIMS in the investigation of polymer surface structure and its relationship to the properties of the material. This book will be of value to academic and industrial researchers interested in polymer surfaces and surface analysis.
Language: English
Published by Cambridge University Press, 2005
ISBN 10: 052101753X ISBN 13: 9780521017534
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Language: English
Published by Cambridge University Press, 1998
ISBN 10: 0521352223 ISBN 13: 9780521352222
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Language: English
Published by Cambridge University Press, 1998
ISBN 10: 0521352223 ISBN 13: 9780521352222
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Language: English
Published by Cambridge University Press, 1998
ISBN 10: 0521352223 ISBN 13: 9780521352222
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Language: English
Published by Cambridge University Press, 1998
ISBN 10: 0521352223 ISBN 13: 9780521352222
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Language: English
Published by Cambridge University Press, 1998
ISBN 10: 0521352223 ISBN 13: 9780521352222
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Language: English
Published by Cambridge University Press, 1998
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Language: English
Published by Cambridge University Press, 1998
ISBN 10: 0521352223 ISBN 13: 9780521352222
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Add to basketCondition: New. The book describes the development of two powerful techniques for polymer surface studies. Series Editor(s): Clarke, D. R.; Suresh, S.; Ward, I. M. Series: Cambridge Solid State Science Series. Num Pages: 214 pages, 119 b/w illus. 19 tables. BIC Classification: PNN; TG. Category: (P) Professional & Vocational. Dimension: 247 x 174 x 13. Weight in Grams: 605. . 1998. hardcover. . . . .
Language: English
Published by Cambridge University Press, 1998
ISBN 10: 0521352223 ISBN 13: 9780521352222
Seller: Kennys Bookstore, Olney, MD, U.S.A.
Condition: New. The book describes the development of two powerful techniques for polymer surface studies. Series Editor(s): Clarke, D. R.; Suresh, S.; Ward, I. M. Series: Cambridge Solid State Science Series. Num Pages: 214 pages, 119 b/w illus. 19 tables. BIC Classification: PNN; TG. Category: (P) Professional & Vocational. Dimension: 247 x 174 x 13. Weight in Grams: 605. . 1998. hardcover. . . . . Books ship from the US and Ireland.
Language: English
Published by Cambridge University Press, 1998
ISBN 10: 0521352223 ISBN 13: 9780521352222
Seller: AHA-BUCH GmbH, Einbeck, Germany
Buch. Condition: Neu. Druck auf Anfrage Neuware - Printed after ordering - This book provides an in-depth treatment of the instrumentation, physical bases and applications of X-ray photoelectron spectroscopy (XPS) and static secondary ion mass spectroscopy (SSIMS) with a specific focus on the subject of polymeric materials. XPS and SSIMS are widely accepted as the two most powerful techniques for polymer surface chemical analysis, particularly in the context of industrial research and problem solving. In this book, the techniques of XPS and SSIMS are described and in each case the author explains what type of information may be obtained. The book also includes details of case studies emphasising the complementary and joint application of XPS and SSIMS in the investigation of polymer surface structure and its relationship to the properties of the material. This book will be of value to academic and industrial researchers interested in polymer surfaces and surface analysis.
Language: English
Published by Cambridge University Press, Cambridge, 2005
ISBN 10: 052101753X ISBN 13: 9780521017534
Seller: Grand Eagle Retail, Bensenville, IL, U.S.A.
Paperback. Condition: new. Paperback. This book provides an in-depth treatment of the instrumentation, physical bases and applications of X-ray photoelectron spectroscopy (XPS) and static secondary ion mass spectroscopy (SSIMS) with a specific focus on the subject of polymeric materials. XPS and SSIMS are widely accepted as the two most powerful techniques for polymer surface chemical analysis, particularly in the context of industrial research and problem solving. In this book, the techniques of XPS and SSIMS are described and in each case the author explains what type of information may be obtained. The book also includes details of case studies emphasising the complementary and joint application of XPS and SSIMS in the investigation of polymer surface structure and its relationship to the properties of the material. This book will be of value to academic and industrial researchers interested in polymer surfaces and surface analysis. The book describes the development of two powerful techniques for polymer surface studies. This item is printed on demand. Shipping may be from multiple locations in the US or from the UK, depending on stock availability.
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Add to basketPaperback. Condition: Brand New. 198 pages. 9.75x6.75x0.75 inches. In Stock. This item is printed on demand.
Language: English
Published by Cambridge University Press, 2005
ISBN 10: 052101753X ISBN 13: 9780521017534
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Language: English
Published by Cambridge University Press CUP, 2005
ISBN 10: 052101753X ISBN 13: 9780521017534
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Language: English
Published by Cambridge University Press, 2005
ISBN 10: 052101753X ISBN 13: 9780521017534
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Language: English
Published by Cambridge University Press, 2005
ISBN 10: 052101753X ISBN 13: 9780521017534
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Language: English
Published by Cambridge University Press, Cambridge, 2005
ISBN 10: 052101753X ISBN 13: 9780521017534
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Add to basketPaperback. Condition: new. Paperback. This book provides an in-depth treatment of the instrumentation, physical bases and applications of X-ray photoelectron spectroscopy (XPS) and static secondary ion mass spectroscopy (SSIMS) with a specific focus on the subject of polymeric materials. XPS and SSIMS are widely accepted as the two most powerful techniques for polymer surface chemical analysis, particularly in the context of industrial research and problem solving. In this book, the techniques of XPS and SSIMS are described and in each case the author explains what type of information may be obtained. The book also includes details of case studies emphasising the complementary and joint application of XPS and SSIMS in the investigation of polymer surface structure and its relationship to the properties of the material. This book will be of value to academic and industrial researchers interested in polymer surfaces and surface analysis. The book describes the development of two powerful techniques for polymer surface studies. This item is printed on demand. Shipping may be from our UK warehouse or from our Australian or US warehouses, depending on stock availability.
Language: English
Published by Cambridge University Press, 2005
ISBN 10: 052101753X ISBN 13: 9780521017534
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Condition: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. The book describes the development of two powerful techniques for polymer surface studies.Inhaltsverzeichnis1. Introduction 2. X-ray photoelectron spectroscopy (XPS) 3. Information from polymer XPS 4. Static secondary ion mass sp.
Language: English
Published by Cambridge University Press, Cambridge, 2005
ISBN 10: 052101753X ISBN 13: 9780521017534
Seller: AussieBookSeller, Truganina, VIC, Australia
Paperback. Condition: new. Paperback. This book provides an in-depth treatment of the instrumentation, physical bases and applications of X-ray photoelectron spectroscopy (XPS) and static secondary ion mass spectroscopy (SSIMS) with a specific focus on the subject of polymeric materials. XPS and SSIMS are widely accepted as the two most powerful techniques for polymer surface chemical analysis, particularly in the context of industrial research and problem solving. In this book, the techniques of XPS and SSIMS are described and in each case the author explains what type of information may be obtained. The book also includes details of case studies emphasising the complementary and joint application of XPS and SSIMS in the investigation of polymer surface structure and its relationship to the properties of the material. This book will be of value to academic and industrial researchers interested in polymer surfaces and surface analysis. The book describes the development of two powerful techniques for polymer surface studies. This item is printed on demand. Shipping may be from our Sydney, NSW warehouse or from our UK or US warehouse, depending on stock availability.