Synopsis
This book, spanning semiconductor materials, process control, and device properties and measurements, presents innovative methods for characterizing these elements in the context of semiconductor fabrication. It is a trusted guidebook covering resistivity, carrier lifetime, and inhomogeneity measurements for semiconductor materials. The author also delves into wire bond evaluation, die attachment, thermal properties, and microwave device measurements, providing valuable insights for professionals in semiconductor manufacturing and research. The measurement and characterization techniques explored in this book pave the way for improved device performance and reliability, making it an essential resource for advancing semiconductor technology.
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Methods of Measurement for Semiconductor Materials, Process Control, and Devices: Quarterly Report; January 1 to March 31, 1971 (Classic Reprint)
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HRD. Condition: New. New Book. Shipped from UK. Established seller since 2000. Seller Inventory # LX-9780260813602
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Methods of Measurement for Semiconductor Materials, Process Control, and Devices: Quarterly Report; January 1 to March 31, 1971 (Classic Reprint)
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HRD. Condition: New. New Book. Shipped from UK. Established seller since 2000. Seller Inventory # LX-9780260813602
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