Synopsis
This book presents an in-depth study of methods for measuring semiconductors, process control, and devices. Written by the author as an expansion of a quarterly report to project sponsors, the book covers the development of methods for improving semiconductor performance, interchangeability, and reliability. The author provides an easily applicable guide to the measurement of material properties. This book is a useful resource for engineers and researchers working with semiconductors.
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Methods of Measurement for Semiconductor Materials, Process Control, and Devices Quarterly Report, October 1 to December 31, 1969 Classic Reprint
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Methods of Measurement for Semiconductor Materials, Process Control, and Devices Quarterly Report, October 1 to December 31, 1969 Classic Reprint
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HRD. Condition: New. New Book. Shipped from UK. Established seller since 2000. Seller Inventory # LX-9780365160168
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