Synopsis
This book encompasses the latest research assembly in methods of measurement for semiconductor materials, process control, and devices, collected by researchers from many fields. Its aim is to provide new insights into improving the performance, reliability, and interchangeability of discrete semiconductor devices and integrated circuits. Beginning with chapters on resistivity and carrier lifetime, this book covers a broad range of semiconductor-related topics, such as inhomogeneities, infrared methods, Hall effect, deep-level studies, gold doped silicon, high field effects, and more. Ultimately, the book concludes with an exploration of germanium and silicon nuclear radiation detectors. This book is an excellent resource for engineers, applied scientists, and researchers in the semiconductor industry, providing valuable information for professionals looking to enhance measurement methods within the field.
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Methods of Measurement for Semiconductor Materials, Process Control, and Devices: Quarterly Report; April 1 to June 30, 1969 (Classic Reprint)
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Methods of Measurement for Semiconductor Materials, Process Control, and Devices: Quarterly Report; April 1 to June 30, 1969 (Classic Reprint)
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HRD. Condition: New. New Book. Shipped from UK. Established seller since 2000. Seller Inventory # LX-9780331408737
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