This book presents an in-depth study of methods for measuring semiconductors, process control, and devices. Written by the author as an expansion of a quarterly report to project sponsors, the book covers the development of methods for improving semiconductor performance, interchangeability, and reliability. The author provides an easily applicable guide to the measurement of material properties. This book is a useful resource for engineers and researchers working with semiconductors.
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Paperback. Condition: New. Print on Demand. This book presents an in-depth study of methods for measuring semiconductors, process control, and devices. Written by the author as an expansion of a quarterly report to project sponsors, the book covers the development of methods for improving semiconductor performance, interchangeability, and reliability. The author provides an easily applicable guide to the measurement of material properties. This book is a useful resource for engineers and researchers working with semiconductors. This book is a reproduction of an important historical work, digitally reconstructed using state-of-the-art technology to preserve the original format. In rare cases, an imperfection in the original, such as a blemish or missing page, may be replicated in the book. print-on-demand item. Seller Inventory # 9780365160144_0
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Seller: PBShop.store US, Wood Dale, IL, U.S.A.
PAP. Condition: New. New Book. Shipped from UK. Established seller since 2000. Seller Inventory # LW-9780365160144
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Seller: PBShop.store UK, Fairford, GLOS, United Kingdom
PAP. Condition: New. New Book. Shipped from UK. Established seller since 2000. Seller Inventory # LW-9780365160144
Quantity: 15 available