Methods of Measurement for Semiconductor Materials, Process Control, and Devices: Quarterly Report, October 1 to December 31, 1970 (Classic Reprint) - Softcover
Synopsis
This book presents the results of the tenth reporting period in a series of studies focused on methods of measurement for semiconductor materials, process control, and devices. The Joint Program on Methods of Measurement for Semiconductor Materials, Process Control, and Devices was undertaken in 1968 to focus NBS efforts to enhance the performance, interchangeability, and reliability of discrete semiconductor devices and integrated circuits through improvements in methods of measurement. The program is supported by the National Bureau of Standards, the Defense Atomic Support Agency, the U.S. Navy Strategic Systems Project Office, the U.S. Navy Electronics Systems Command, the Atomic Energy Commission, and the National Aeronautics and Space Administration. Through this research, the author has made significant contributions to the development of new measurement methods and the improvement of existing ones in the field of semiconductor materials, process control, and devices. The book discusses the long term objectives of the program, as well as its accomplishments and plans for the immediate future. The research detailed in this text will be valuable to semiconductor researchers, manufacturers, and users, as well as to standards organizations and government agencies.
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Methods of Measurement for Semiconductor Materials, Process Control, and
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Paperback. Condition: New. Print on Demand. This book presents the results of the tenth reporting period in a series of studies focused on methods of measurement for semiconductor materials, process control, and devices. The Joint Program on Methods of Measurement for Semiconductor Materials, Process Control, and Devices was undertaken in 1968 to focus NBS efforts to enhance the performance, interchangeability, and reliability of discrete semiconductor devices and integrated circuits through improvements in methods of measurement. The program is supported by the National Bureau of Standards, the Defense Atomic Support Agency, the U.S. Navy Strategic Systems Project Office, the U.S. Navy Electronics Systems Command, the Atomic Energy Commission, and the National Aeronautics and Space Administration. Through this research, the author has made significant contributions to the development of new measurement methods and the improvement of existing ones in the field of semiconductor materials, process control, and devices. The book discusses the long term objectives of the program, as well as its accomplishments and plans for the immediate future. The research detailed in this text will be valuable to semiconductor researchers, manufacturers, and users, as well as to standards organizations and government agencies. This book is a reproduction of an important historical work, digitally reconstructed using state-of-the-art technology to preserve the original format. In rare cases, an imperfection in the original, such as a blemish or missing page, may be replicated in the book. print-on-demand item. Seller Inventory # 9780365779025_0
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Methods of Measurement for Semiconductor Materials, Process Control, and Devices
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Methods of Measurement for Semiconductor Materials, Process Control, and Devices
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