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Atomic Force Microscopy, Scanning Nearfield Optical Microscopy and Nanoscratching. Application to Rough and Natural Surfaces.
Seller: Universitätsbuchhandlung Herta Hold GmbH, Berlin, Germany
Association Member: GIAQ ILAB VDA
Seller rating 4 out of 5 stars
239 Fig., 7 Tabl., XII, 292 p. Hardcover. Versand aus Deutschland / We dispatch from Germany via Air Mail. Einband bestoßen, daher Mängelexemplar gestempelt, sonst sehr guter Zustand. Imperfect copy due to slightly bumped cover, apart from this in very good condition. Stamped. Stamped. NanoScience and Technology. Sprache: Englisch.
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Atomic Force Microscopy, Scanning Nearfield Optical Microscopy and Nanoscratching: Application to Rough and Natural Surfaces (NanoScience and Technology)
Seller: Ria Christie Collections, Uxbridge, United Kingdom
Seller rating 5 out of 5 stars
US$ 187.41
US$ 15.81 shipping
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Atomic Force Microscopy, Scanning Nearfield Optical Microscopy and Nanoscratching
Seller: PBShop.store UK, Fairford, GLOS, United Kingdom
Seller rating 5 out of 5 stars
US$ 205.72
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Add to basketPAP. Condition: New. New Book. Shipped from UK. Established seller since 2000.
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PAP. Condition: New. New Book. Shipped from UK. Established seller since 2000.
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Atomic Force Microscopy, Scanning Nearfield Optical Microscopy and Nanoscratching : Application to Rough and Natural Surfaces
Seller: GreatBookPricesUK, Woodford Green, United Kingdom
Seller rating 5 out of 5 stars
US$ 203.97
US$ 19.80 shipping
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Condition: As New. Unread book in perfect condition.
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US$ 183.90
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Atomic Force Microscopy, Scanning Nearfield Optical Microscopy and Nanoscratching : Application to Rough and Natural Surfaces
Seller: GreatBookPricesUK, Woodford Green, United Kingdom
Seller rating 5 out of 5 stars
US$ 235.69
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Atomic Force Microscopy, Scanning Nearfield Optical Microscopy and Nanoscratching
Language: English
Published by Springer-Verlag Berlin and Heidelberg GmbH and Co. KG, DE, 2010
ISBN 10: 3642066631 ISBN 13: 9783642066634
Seller: Rarewaves.com USA, London, LONDO, United Kingdom
Seller rating 5 out of 5 stars
Paperback. Condition: New. 1st ed. Softcover of orig. ed. 2006.
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Atomic Force Microscopy, Scanning Nearfield Optical Microscopy and Nanoscratching: Application to Rough and Natural Surfaces (NanoScience and Technology)
Seller: Ria Christie Collections, Uxbridge, United Kingdom
Seller rating 5 out of 5 stars
US$ 257.02
US$ 15.81 shipping
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Taschenbuch. Condition: Neu. Atomic Force Microscopy, Scanning Nearfield Optical Microscopy and Nanoscratching | Application to Rough and Natural Surfaces | Gerd Kaupp | Taschenbuch | xii | Englisch | 2010 | Springer | EAN 9783642066634 | Verantwortliche Person für die EU: Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg, juergen[dot]hartmann[at]springer[dot]com | Anbieter: preigu.
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Atomic Force Microscopy, Scanning Nearfield Optical Microscopy and Nanoscratching
Language: English
Published by Springer Berlin Heidelberg, 2010
ISBN 10: 3642066631 ISBN 13: 9783642066634
Condition: New. Presents the full range of application of nano-optic methods to studies in physics, chemistry, materials science, biology and medicineMaking a clear distinction is made between nano- and micro-mechanical testing for physical reasons, this monograph d.
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Condition: New. pp. 308.
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Condition: New. pp. 308.
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Atomic Force Microscopy, Scanning Nearfield Optical Microscopy and Nanoscratching : Application to Rough and Natural Surfaces
Language: English
Published by Springer, Springer Berlin Heidelberg, 2010
ISBN 10: 3642066631 ISBN 13: 9783642066634
Taschenbuch. Condition: Neu. Druck auf Anfrage Neuware - Printed after ordering - Making a clear distinction is made between nano- and micro-mechanical testing for physical reasons, this monograph describes the basics and applications of the supermicroscopies AFM and SNOM, and of the nanomechanical testing on rough and technical natural surfaces in the submicron range down to a lateral resolution of a few nm. New or improved instrumentation, new physical laws and unforeseen new applications in all branches of natural sciences (around physics, chemistry, mineralogy, materials science, biology and medicine) and nanotechnology are covered as well as the sources for pitfalls and errors. It outlines the handling of natural and technical samples in relation to those of flat standard samples and emphasizes new special features. Pitfalls and sources of errors are clearly demonstrated as well as their efficient remedy when going from molecularly flat to rough surfaces. The academic or industrial scientist learns how to apply the principles for tackling their scientific or manufacturing tasks that include roughness far away from standard samples.
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Atomic Force Microscopy, Scanning Nearfield Optical Microscopy and Nanoscratching
Language: English
Published by Springer Berlin Heidelberg, 2006
ISBN 10: 3540284052 ISBN 13: 9783540284055
US$ 266.94
US$ 55.75 shipping
Ships from Germany to U.S.A.Quantity: Over 20 available
Add to basketCondition: New. Presents the full range of application of nano-optic methods to studies in physics, chemistry, materials science, biology and medicineMaking a clear distinction is made between nano- and micro-mechanical testing for physical reasons, this monograph d.
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Atomic Force Microscopy, Scanning Nearfield Optical Microscopy and Nanoscratching : Application to Rough and Natural Surfaces
Language: English
Published by Springer, Berlin, Springer Berlin Heidelberg, Springer, 2006
ISBN 10: 3540284052 ISBN 13: 9783540284055
Buch. Condition: Neu. Druck auf Anfrage Neuware - Printed after ordering - Making a clear distinction is made between nano- and micro-mechanical testing for physical reasons, this monograph describes the basics and applications of the supermicroscopies AFM and SNOM, and of the nanomechanical testing on rough and technical natural surfaces in the submicron range down to a lateral resolution of a few nm. New or improved instrumentation, new physical laws and unforeseen new applications in all branches of natural sciences (around physics, chemistry, mineralogy, materials science, biology and medicine) and nanotechnology are covered as well as the sources for pitfalls and errors. It outlines the handling of natural and technical samples in relation to those of flat standard samples and emphasizes new special features. Pitfalls and sources of errors are clearly demonstrated as well as their efficient remedy when going from molecularly flat to rough surfaces. The academic or industrial scientist learns how to apply the principles for tackling their scientific or manufacturing tasks that include roughness far away from standard samples.
-
Atomic Force Microscopy, Scanning Nearfield Optical Microscopy and Nanoscratching
Language: English
Published by Springer-Verlag Berlin and Heidelberg GmbH and Co. KG, DE, 2010
ISBN 10: 3642066631 ISBN 13: 9783642066634
US$ 260.34
US$ 85.80 shipping
Ships from United Kingdom to U.S.A.Quantity: 1 available
Add to basketPaperback. Condition: New. 1st ed. Softcover of orig. ed. 2006. Making a clear distinction is made between nano- and micro-mechanical testing for physical reasons, this monograph describes the basics and applications of the supermicroscopies AFM and SNOM, and of the nanomechanical testing on rough and technical natural surfaces in the submicron range down to a lateral resolution of a few nm. New or improved instrumentation, new physical laws and unforeseen new applications in all branches of natural sciences (around physics, chemistry, mineralogy, materials science, biology and medicine) and nanotechnology are covered as well as the sources for pitfalls and errors. It outlines the handling of natural and technical samples in relation to those of flat standard samples and emphasizes new special features. Pitfalls and sources of errors are clearly demonstrated as well as their efficient remedy when going from molecularly flat to rough surfaces. The academic or industrial scientist learns how to apply the principles for tackling their scientific or manufacturing tasks that include roughness far away from standard samples.
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US$ 348.53
US$ 13.20 shipping
Ships from United Kingdom to U.S.A.Quantity: 2 available
Add to basketPaperback. Condition: Brand New. 304 pages. 9.25x6.10x0.70 inches. In Stock.
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US$ 363.01
US$ 33.00 shipping
Ships from United Kingdom to U.S.A.Quantity: 1 available
Add to basketPaperback. Condition: Like New. Like New. book.
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Condition: new. Questo è un articolo print on demand.
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Atomic Force Microscopy, Scanning Nearfield Optical Microscopy and Nanoscratching
Language: English
Published by Springer, Berlin, Springer Berlin Heidelberg, Springer, 2006
ISBN 10: 3540284052 ISBN 13: 9783540284055
Seller: BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, Germany
Seller rating 5 out of 5 stars
Buch. Condition: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -Making a clear distinction is made between nano- and micro-mechanical testing for physical reasons, this monograph describes the basics and applications of the supermicroscopies AFM and SNOM, and of the nanomechanical testing on rough and technical natural surfaces in the submicron range down to a lateral resolution of a few nm. New or improved instrumentation, new physical laws and unforeseen new applications in all branches of natural sciences (around physics, chemistry, mineralogy, materials science, biology and medicine) and nanotechnology are covered as well as the sources for pitfalls and errors. It outlines the handling of natural and technical samples in relation to those of flat standard samples and emphasizes new special features. Pitfalls and sources of errors are clearly demonstrated as well as their efficient remedy when going from molecularly flat to rough surfaces. The academic or industrial scientist learns how to apply the principles for tackling their scientific or manufacturing tasks that include roughness far away from standard samples. 292 pp. Englisch.
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Atomic Force Microscopy, Scanning Nearfield Optical Microscopy and Nanoscratching
Language: English
Published by Springer Berlin Heidelberg, Springer Berlin Heidelberg Feb 2010, 2010
ISBN 10: 3642066631 ISBN 13: 9783642066634
Seller: BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, Germany
Seller rating 5 out of 5 stars
Taschenbuch. Condition: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -Making a clear distinction is made between nano- and micro-mechanical testing for physical reasons, this monograph describes the basics and applications of the supermicroscopies AFM and SNOM, and of the nanomechanical testing on rough and technical natural surfaces in the submicron range down to a lateral resolution of a few nm. New or improved instrumentation, new physical laws and unforeseen new applications in all branches of natural sciences (around physics, chemistry, mineralogy, materials science, biology and medicine) and nanotechnology are covered as well as the sources for pitfalls and errors. It outlines the handling of natural and technical samples in relation to those of flat standard samples and emphasizes new special features. Pitfalls and sources of errors are clearly demonstrated as well as their efficient remedy when going from molecularly flat to rough surfaces. The academic or industrial scientist learns how to apply the principles for tackling their scientific or manufacturing tasks that include roughness far away from standard samples. 308 pp. Englisch.
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US$ 268.96
US$ 13.20 shipping
Ships from United Kingdom to U.S.A.Quantity: 1 available
Add to basketPaperback. Condition: Brand New. 304 pages. 9.25x6.10x0.70 inches. In Stock. This item is printed on demand.
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Atomic Force Microscopy, Scanning Nearfield Optical Microscopy and Nanoscratching
Language: English
Published by Springer, Springer Berlin Heidelberg Feb 2010, 2010
ISBN 10: 3642066631 ISBN 13: 9783642066634
Seller: buchversandmimpf2000, Emtmannsberg, BAYE, Germany
Seller rating 5 out of 5 stars
Taschenbuch. Condition: Neu. This item is printed on demand - Print on Demand Titel. Neuware -Making a clear distinction is made between nano- and micro-mechanical testing for physical reasons, this monograph describes the basics and applications of the supermicroscopies AFM and SNOM, and of the nanomechanical testing on rough and technical natural surfaces in the submicron range down to a lateral resolution of a few nm. New or improved instrumentation, new physical laws and unforeseen new applications in all branches of natural sciences (around physics, chemistry, mineralogy, materials science, biology and medicine) and nanotechnology are covered as well as the sources for pitfalls and errors. It outlines the handling of natural and technical samples in relation to those of flat standard samples and emphasizes new special features. Pitfalls and sources of errors are clearly demonstrated as well as their efficient remedy when going from molecularly flat to rough surfaces. The academic or industrial scientist learns how to apply the principles for tackling their scientific or manufacturing tasks that include roughness far away from standard samples.Springer-Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg 308 pp. Englisch.
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US$ 329.91
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Add to basketCondition: New. Print on Demand pp. 308 239 Illus.
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US$ 330.58
US$ 8.58 shipping
Ships from United Kingdom to U.S.A.Quantity: 4 available
Add to basketCondition: New. Print on Demand pp. 308 Illus.
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Condition: New. PRINT ON DEMAND pp. 308.
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Condition: New. PRINT ON DEMAND pp. 308.
