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hardcover. Condition: As New. Ships Out Tomorrow!
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US$ 188.47
Convert currencyUS$ 3.99 shipping within U.S.A.Quantity: Over 20 available
Add to basketCondition: New.
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US$ 114.16
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Add to basketCondition: Sehr gut. Zustand: Sehr gut | Sprache: Englisch | Produktart: Bücher.
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US$ 114.16
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Add to basketCondition: Hervorragend. Zustand: Hervorragend | Sprache: Englisch | Produktart: Bücher.
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US$ 288.17
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Add to basketPaperback. Condition: Like New. Like New. book.
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US$ 320.04
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Add to basketHardcover. Condition: Like New. Like New. book.
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CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies
Published by Springer Netherlands, 2010
ISBN 10: 904817855X ISBN 13: 9789048178551
Language: English
US$ 175.32
Convert currencyUS$ 57.53 shipping from Germany to U.S.A.Quantity: Over 20 available
Add to basketCondition: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Gives a process-aware perspective on SRAM circuit design and testProvides detailed coverage of SRAM cell stability, stability sensitivity and analytical evaluation of Static Noise MarginIntroduces the concept of stability fault modelling.
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CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies
Published by Springer Netherlands, 2008
ISBN 10: 1402083629 ISBN 13: 9781402083624
Language: English
US$ 176.74
Convert currencyUS$ 57.53 shipping from Germany to U.S.A.Quantity: Over 20 available
Add to basketGebunden. Condition: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Gives a process-aware perspective on SRAM circuit design and testProvides detailed coverage of SRAM cell stability, stability sensitivity and analytical evaluation of Static Noise MarginIntroduces the concept of stability fault modelling.
