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hardcover. Condition: As New. Ships Out Tomorrow!
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CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies: Process-Aware SRAM Design and Test (Frontiers in Electronic Testing, 40)
Book 21 of 40: Frontiers in Electronic TestingSeller: Ria Christie Collections, Uxbridge, United Kingdom
Seller rating 5 out of 5 stars
US$ 181.79
US$ 15.76 shipping from United Kingdom to U.S.A.Quantity: Over 20 available
Add to basketCondition: New. In.
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CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies : Process-Aware SRAM Design and Test
Book 21 of 40: Frontiers in Electronic TestingSeller: GreatBookPricesUK, Woodford Green, United Kingdom
Seller rating 5 out of 5 stars
US$ 181.78
US$ 19.74 shipping from United Kingdom to U.S.A.Quantity: Over 20 available
Add to basketCondition: New.
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CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies : Process-Aware SRAM Design and Test
Book 21 of 40: Frontiers in Electronic TestingSeller: GreatBookPricesUK, Woodford Green, United Kingdom
Seller rating 5 out of 5 stars
US$ 202.37
US$ 19.74 shipping from United Kingdom to U.S.A.Quantity: Over 20 available
Add to basketCondition: As New. Unread book in perfect condition.
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Condition: Sehr gut. Zustand: Sehr gut | Sprache: Englisch | Produktart: Bücher.
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Condition: Hervorragend. Zustand: Hervorragend | Sprache: Englisch | Produktart: Bücher.
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Paperback. Condition: Like New. Like New. book.
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Hardcover. Condition: Like New. Like New. book.
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Condition: As New. Unread book in perfect condition.
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CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies
Book 21 of 40: Frontiers in Electronic TestingPublished by Springer Netherlands, 2010
ISBN 10: 904817855X ISBN 13: 9789048178551
Language: English
Condition: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Gives a process-aware perspective on SRAM circuit design and testProvides detailed coverage of SRAM cell stability, stability sensitivity and analytical evaluation of Static Noise MarginIntroduces the concept of stability fault modelling.
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CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies
Book 21 of 40: Frontiers in Electronic TestingPublished by Springer Netherlands, 2008
ISBN 10: 1402083629 ISBN 13: 9781402083624
Language: English
Gebunden. Condition: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Gives a process-aware perspective on SRAM circuit design and testProvides detailed coverage of SRAM cell stability, stability sensitivity and analytical evaluation of Static Noise MarginIntroduces the concept of stability fault modelling.
