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Computed Electron Micrographs Defect by Head (8 results)
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Computed Electron Micrographs and Defect Indentification
Seller: Better World Books Ltd, Dunfermline, United Kingdom
Seller rating 5 out of 5 stars
US$ 13.46
US$ 10.93 shipping
Ships from United Kingdom to U.S.A.Quantity: 1 available
Add to basketCondition: Good. Ships from the UK. Used book that is in clean, average condition without any missing pages.
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Computed Electron Micrographs and Defect Identification (Defects in Crystalline Solids S.)
Language: English
Published by Elsevier Science Publishing Co Inc.,U.S., 1973
ISBN 10: 0720417570 ISBN 13: 9780720417579
US$ 10.34
US$ 18.31 shipping
Ships from United Kingdom to U.S.A.Quantity: 1 available
Add to basketCondition: Good. This is an ex-library book and may have the usual library/used-book markings inside.This book has hardback covers. In good all round condition. No dust jacket. Please note the Image in this listing is a stock photo and may not match the covers of the actual item,1000grams, ISBN:0720417570.
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Computed Electron Micrographs and Defect Identification
Language: English
Published by Elsevier Science Publishing Co Inc.,U.S., 1973
ISBN 10: 0720417570 ISBN 13: 9780720417579
Hardcover. Condition: Bon. Edition 1973. Ammareal reverse jusqu'à 15% du prix net de cet article à des organisations caritatives. ENGLISH DESCRIPTION Book Condition: Used, Good. Edition 1973. Ammareal gives back up to 15% of this item's net price to charity organizations.
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Computed electron micrographs and defect identification (Defects in crystalline solids, Volume 7)
Language: English
Published by North-Holland Pub. Co, 1973
ISBN 10: 0444104623 ISBN 13: 9780444104625
Hardcover. Condition: Bon. Ancien livre de bibliothèque. Edition 1973. Tome 7. Ammareal reverse jusqu'à 15% du prix net de cet article à des organisations caritatives. ENGLISH DESCRIPTION Book Condition: Used, Good. Former library book. Edition 1973. Volume 7. Ammareal gives back up to 15% of this item's net price to charity organizations.
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Computed Electron Micrographs and Defect Identification (Volume 7)
Language: English
Published by North Holland Publishing Company, 1973
ISBN 10: 0720417570 ISBN 13: 9780720417579
US$ 29.49
US$ 18.31 shipping
Ships from United Kingdom to U.S.A.Quantity: 1 available
Add to basketCondition: Fair. Volume 7. This is an ex-library book and may have the usual library/used-book markings inside.This book has hardback covers. Clean from markings. In fair condition, suitable as a study copy. No dust jacket. Please note the Image in this listing is a stock photo and may not match the covers of the actual item,1000grams, ISBN:0720417570.
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US$ 105.65
US$ 17.08 shipping
Ships from United Kingdom to U.S.A.Quantity: 1 available
Add to basketPaperback. Condition: Brand New. 412 pages. 9.00x6.00x0.93 inches. In Stock.
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Computed electron micrographs and defect identification (Defects in crystalline solids, Volume 7)
Language: English
Published by North-Holland Pub. Co, 1973
ISBN 10: 0444104623 ISBN 13: 9780444104625
US$ 108.37
US$ 34.16 shipping
Ships from United Kingdom to U.S.A.Quantity: 1 available
Add to baskethardcover. Condition: Good. Good. Dust Jacket NOT present. CD WILL BE MISSING. . SHIPS FROM MULTIPLE LOCATIONS. book.
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Computed electron micrographs and defect identification.
Published by Amsterdam, North-Holland Publ. Comp. 1973., 1973
Seller: Antiquariat Löcker, Wien, Austria
Association Member: GIAQ ILAB VDA VDAO
Seller rating 5 out of 5 stars
In Englisch. gr.-8°, 400 S., mit zahlr. Textabb., OLn. m. Klarsichtfolien-Überzug, guter Zustand, ausgeschied. Bibl.-Expl. mit den üblichen Kennzeichnungen. ISBN 0-720417570.
