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Design Analysis Test Logic by Krishnaswamy Smita (25 results)
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Design, Analysis and Test of Logic Circuits Under Uncertainty.
Published by Dordrecht, Springer., 2013
ISBN 10: 9048196434 ISBN 13: 9789048196432
Language: English
Seller: Universitätsbuchhandlung Herta Hold GmbH, Berlin, Germany
Association Member: GIAQ ILAB VDA
Seller rating 5 out of 5 stars
XI, 123 p. 71 illus. Hardcover. Versand aus Deutschland / We dispatch from Germany via Air Mail. Einband bestoßen, daher Mängelexemplar gestempelt, sonst sehr guter Zustand. Imperfect copy due to slightly bumped cover, apart from this in very good condition. Stamped. Stamped. Lecture Notes in Electrical Engineering Bd. 115. Sprache: Englisch.
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Condition: New. pp. 136.
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Design, Analysis and Test of Logic Circuits Under Uncertainty (Lecture Notes in Electrical Engineering, 115)
Seller: Ria Christie Collections, Uxbridge, United Kingdom
Seller rating 5 out of 5 stars
US$ 125.90
US$ 15.77 shipping from United Kingdom to U.S.A.Quantity: Over 20 available
Add to basketCondition: New. In.
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Design, Analysis and Test of Logic Circuits Under Uncertainty
Published by Springer Netherlands, 2012
ISBN 10: 9048196434 ISBN 13: 9789048196432
Language: English
Condition: Sehr gut. Zustand: Sehr gut | Sprache: Englisch | Produktart: Bücher.
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Design, Analysis and Test of Logic Circuits Under Uncertainty (Lecture Notes in Electrical Engineering, 115)
Seller: Ria Christie Collections, Uxbridge, United Kingdom
Seller rating 5 out of 5 stars
US$ 132.34
US$ 15.77 shipping from United Kingdom to U.S.A.Quantity: Over 20 available
Add to basketCondition: New. In.
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Condition: New. pp. 136.
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Hardcover. Condition: Brand New. 2013 edition. 134 pages. 9.25x6.25x0.50 inches. In Stock.
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Taschenbuch. Condition: Neu. Design, Analysis and Test of Logic Circuits Under Uncertainty | Smita Krishnaswamy (u. a.) | Taschenbuch | xii | Englisch | 2014 | Springer Netherland | EAN 9789400797987 | Verantwortliche Person für die EU: Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg, juergen[dot]hartmann[at]springer[dot]com | Anbieter: preigu.
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Design, Analysis and Test of Logic Circuits Under Uncertainty
Published by Springer Netherlands, Springer Netherlands Sep 2012, 2012
ISBN 10: 9048196434 ISBN 13: 9789048196432
Language: English
Seller: buchversandmimpf2000, Emtmannsberg, BAYE, Germany
Seller rating 5 out of 5 stars
Buch. Condition: Neu. Neuware -Logic circuits are becoming increasingly susceptible to probabilistic behavior caused by external radiation and process variation. In addition, inherently probabilistic quantum- and nano-technologies are on the horizon as we approach the limits of CMOS scaling. Ensuring the reliability of such circuits despite the probabilistic behavior is a key challenge in IC design---one that necessitates a fundamental, probabilistic reformulation of synthesis and testing techniques. This monograph will present techniques for analyzing, designing, and testing logic circuits with probabilistic behavior.Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg 136 pp. Englisch.
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Design, Analysis and Test of Logic Circuits Under Uncertainty
Published by Springer Netherlands, Springer Netherlands, 2014
ISBN 10: 9400797982 ISBN 13: 9789400797987
Language: English
Taschenbuch. Condition: Neu. Druck auf Anfrage Neuware - Printed after ordering - Logic circuits are becoming increasingly susceptible to probabilistic behavior caused by external radiation and process variation. In addition, inherently probabilistic quantum- and nano-technologies are on the horizon as we approach the limits of CMOS scaling. Ensuring the reliability of such circuits despite the probabilistic behavior is a key challenge in IC design---one that necessitates a fundamental, probabilistic reformulation of synthesis and testing techniques. This monograph will present techniques for analyzing, designing, and testing logic circuits with probabilistic behavior.
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Design, Analysis and Test of Logic Circuits Under Uncertainty
Published by Springer Netherlands, Springer Netherlands, 2012
ISBN 10: 9048196434 ISBN 13: 9789048196432
Language: English
Buch. Condition: Neu. Druck auf Anfrage Neuware - Printed after ordering - Integrated circuits (ICs) increasingly exhibit uncertain characteristics due to soft errors, inherently probabilistic devices, and manufacturing variability. As device technologies scale, these effects can be detrimental to the reliability of logic circuits. To improve future semiconductor designs, this book describes methods for analyzing, designing, and testing circuits subject to probabilistic effects. The authors first develop techniques to model inherently probabilistic methods in logic circuits and to test circuits for determining their reliability after they are manufactured. Then, they study error-masking mechanisms intrinsic to digital circuits and show how to leverage them to design more reliable circuits. The book describes techniques for: Modeling and reasoning about probabilistic behavior in logic circuits, including a matrix-based reliability-analysis framework; Accurate analysis of soft-error rate (SER) based on functional-simulation, sufficiently scalable for use in gate-level optimizations; Logic synthesis for greater resilience against soft errors, which improves reliability using moderate overhead in area and performance; Test-generation and test-compaction methods aimed at probabilistic faults in logic circuits that facilitate accurate and efficient post-manufacture measurement of soft-error susceptibility.
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Hardcover. Condition: Like New. Like New. book.
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Paperback. Condition: Like New. Like New. book.
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Condition: New. Print on Demand pp. 136 71 Illus.
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Design, Analysis and Test of Logic Circuits Under Uncertainty
Published by Springer Netherlands Sep 2012, 2012
ISBN 10: 9048196434 ISBN 13: 9789048196432
Language: English
Seller: BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, Germany
Seller rating 5 out of 5 stars
Buch. Condition: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -Integrated circuits (ICs) increasingly exhibit uncertain characteristics due to soft errors, inherently probabilistic devices, and manufacturing variability. As device technologies scale, these effects can be detrimental to the reliability of logic circuits. To improve future semiconductor designs, this book describes methods for analyzing, designing, and testing circuits subject to probabilistic effects. The authors first develop techniques to model inherently probabilistic methods in logic circuits and to test circuits for determining their reliability after they are manufactured. Then, they study error-masking mechanisms intrinsic to digital circuits and show how to leverage them to design more reliable circuits. The book describes techniques for: Modeling and reasoning about probabilistic behavior in logic circuits, including a matrix-based reliability-analysis framework; Accurate analysis of soft-error rate (SER) based on functional-simulation, sufficiently scalable for use in gate-level optimizations; Logic synthesis for greater resilience against soft errors, which improves reliability using moderate overhead in area and performance; Test-generation and test-compaction methods aimed at probabilistic faults in logic circuits that facilitate accurate and efficient post-manufacture measurement of soft-error susceptibility. 136 pp. Englisch.
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Design, Analysis and Test of Logic Circuits Under Uncertainty
Published by Springer Netherlands Okt 2014, 2014
ISBN 10: 9400797982 ISBN 13: 9789400797987
Language: English
Seller: BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, Germany
Seller rating 5 out of 5 stars
Taschenbuch. Condition: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -Logic circuits are becoming increasingly susceptible to probabilistic behavior caused by external radiation and process variation. In addition, inherently probabilistic quantum- and nano-technologies are on the horizon as we approach the limits of CMOS scaling. Ensuring the reliability of such circuits despite the probabilistic behavior is a key challenge in IC design---one that necessitates a fundamental, probabilistic reformulation of synthesis and testing techniques. This monograph will present techniques for analyzing, designing, and testing logic circuits with probabilistic behavior. 136 pp. Englisch.
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Condition: New. PRINT ON DEMAND pp. 136.
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Design, Analysis and Test of Logic Circuits Under Uncertainty
Published by Springer Netherlands, 2014
ISBN 10: 9400797982 ISBN 13: 9789400797987
Language: English
Condition: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Presents a comprehensive overview of Logic CircuitsCombines theory with practical examplesMulti-discipline approach to the hot topic of uncertaintyLogic circuits are becoming increasingly susceptible to probabilistic behavior caus.
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Design, Analysis and Test of Logic Circuits under Uncertainty
Published by Springer Netherlands, 2012
ISBN 10: 9048196434 ISBN 13: 9789048196432
Language: English
Gebunden. Condition: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Presents a comprehensive overview of Logic CircuitsCombines theory with practical examplesMulti-discipline approach to the hot topic of uncertaintyLogic circuits are becoming increasingly susceptible to probabilistic behavior caus.
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Condition: New. Print on Demand pp. 136.
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Buch. Condition: Neu. Design, Analysis and Test of Logic Circuits Under Uncertainty | Smita Krishnaswamy (u. a.) | Buch | xii | Englisch | 2012 | Springer | EAN 9789048196432 | Verantwortliche Person für die EU: Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg, juergen[dot]hartmann[at]springer[dot]com | Anbieter: preigu Print on Demand.
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Design, Analysis and Test of Logic Circuits Under Uncertainty
Published by Springer Netherlands, Springer Netherlands Okt 2014, 2014
ISBN 10: 9400797982 ISBN 13: 9789400797987
Language: English
Seller: buchversandmimpf2000, Emtmannsberg, BAYE, Germany
Seller rating 5 out of 5 stars
Taschenbuch. Condition: Neu. This item is printed on demand - Print on Demand Titel. Neuware -Logic circuits are becoming increasingly susceptible to probabilistic behavior caused by external radiation and process variation. In addition, inherently probabilistic quantum- and nano-technologies are on the horizon as we approach the limits of CMOS scaling. Ensuring the reliability of such circuits despite the probabilistic behavior is a key challenge in IC design---one that necessitates a fundamental, probabilistic reformulation of synthesis and testing techniques. This monograph will present techniques for analyzing, designing, and testing logic circuits with probabilistic behavior.Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg 136 pp. Englisch.
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Condition: New. PRINT ON DEMAND pp. 136.
