Language: English
Published by Wiley & Sons, Incorporated, John, 1999
ISBN 10: 0471985023 ISBN 13: 9780471985020
Seller: Better World Books, Mishawaka, IN, U.S.A.
Condition: Good. Pages intact with minimal writing/highlighting. The binding may be loose and creased. Dust jackets/supplements are not included. Stock photo provided. Product includes identifying sticker. Better World Books: Buy Books. Do Good.
Paperback. Condition: Good. Connecting readers with great books since 1972! Used textbooks may not include companion materials such as access codes, etc. May have some wear or writing/highlighting. We ship orders daily and Customer Service is our top priority!
Condition: New. pp. 550.
Condition: New. pp. 550.
Seller: Romtrade Corp., STERLING HEIGHTS, MI, U.S.A.
Condition: New. This is a Brand-new US Edition. This Item may be shipped from US or any other country as we have multiple locations worldwide.
Condition: New. Brand New Original US Edition. Customer service! Satisfaction Guaranteed.
Condition: New. pp. 550.
US$ 31.69
Quantity: 1 available
Add to basketCondition: Poor. This is an ex-library book and may have the usual library/used-book markings inside.This book has soft covers. In poor condition, suitable as a reading copy. Please note the Image in this listing is a stock photo and may not match the covers of the actual item,750grams, ISBN:9780471985020.
Paperback. Condition: Good. 2nd Edition. Ships in a BOX from Central Missouri! May not include working access code. Will not include dust jacket. Has used sticker(s) and some writing or highlighting. UPS shipping for most packages, (Priority Mail for AK/HI/APO/PO Boxes).
Brand new book. Fast ship. Please provide full street address as we are not able to ship to P O box address.
US$ 53.40
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Add to basketHardcover. Condition: Very Good. xiii 409p large hardback, appendices, index, bibliography, examples, illustrations, as new, a clean and fresh copy Language: English.
Condition: New.
Language: English
Published by John Wiley & Sons Inc, New York, 2008
ISBN 10: 0470027851 ISBN 13: 9780470027851
Seller: Grand Eagle Retail, Bensenville, IL, U.S.A.
Paperback. Condition: new. Paperback. Microstructural characterization is usually achieved by allowing some form of probe to interact with a carefully prepared specimen. The most commonly used probes are visible light, X-ray radiation, a high-energy electron beam, or a sharp, flexible needle. These four types of probe form the basis for optical microscopy, X-ray diffraction, electron microscopy, and scanning probe microscopy. Microstructural Characterization of Materials, 2nd Edition is an introduction to the expertise involved in assessing the microstructure of engineering materials and to the experimental methods used for this purpose. Similar to the first edition, this 2nd edition explores the methodology of materials characterization under the three headings of crystal structure, microstructural morphology, and microanalysis. The principal methods of characterization, including diffraction analysis, optical microscopy, electron microscopy, and chemical microanalytical techniques are treated both qualitatively and quantitatively. An additional chapter has been added to the new edition to cover surface probe microscopy, and there are new sections on digital image recording and analysis, orientation imaging microscopy, focused ion-beam instruments, atom-probe microscopy, and 3-D image reconstruction. As well as being fully updated, this second edition also includes revised and expanded examples and exercises, with a solutions manual available at Microstructural Characterization of Materials, 2nd Edition will appeal to senior undergraduate and graduate students of material science, materials engineering, and materials chemistry, as well as to qualified engineers and more advanced researchers, who will find the book a useful and comprehensive general reference source. Microstructural characterization is usually achieved by allowing some form of probe to interact with a carefully prepared specimen. The most commonly used probes are visible light, X-ray radiation, a high-energy electron beam, or a sharp, flexible needle. Shipping may be from multiple locations in the US or from the UK, depending on stock availability.
Condition: good. May show signs of wear, highlighting, writing, and previous use. This item may be a former library book with typical markings. No guarantee on products that contain supplements Your satisfaction is 100% guaranteed. Twenty-five year bookseller with shipments to over fifty million happy customers.
Seller: PBShop.store UK, Fairford, GLOS, United Kingdom
US$ 67.14
Quantity: 15 available
Add to basketPAP. Condition: New. New Book. Shipped from UK. Established seller since 2000.
Condition: As New. Unread book in perfect condition.
hardcover. Condition: Good. Connecting readers with great books since 1972! Used textbooks may not include companion materials such as access codes, etc. May have some wear or writing/highlighting. We ship orders daily and Customer Service is our top priority!
Seller: Ria Christie Collections, Uxbridge, United Kingdom
US$ 70.39
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Seller: GreatBookPricesUK, Woodford Green, United Kingdom
US$ 67.13
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Condition: New.
Seller: GreatBookPricesUK, Woodford Green, United Kingdom
US$ 74.20
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Add to basketCondition: As New. Unread book in perfect condition.
Seller: GreatBookPricesUK, Woodford Green, United Kingdom
US$ 80.88
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Add to basketCondition: good. May show signs of wear, highlighting, writing, and previous use. This item may be a former library book with typical markings. No guarantee on products that contain supplements Your satisfaction is 100% guaranteed. Twenty-five year bookseller with shipments to over fifty million happy customers.
Language: English
Published by John Wiley & Sons Inc, 2008
ISBN 10: 0470027851 ISBN 13: 9780470027851
Seller: Kennys Bookshop and Art Galleries Ltd., Galway, GY, Ireland
Condition: New. Microstructural characterization is usually achieved by allowing some form of probe to interact with a carefully prepared specimen. The most commonly used probes are visible light, X-ray radiation, a high-energy electron beam, or a sharp, flexible needle. Num Pages: 550 pages, black & white illustrations, colour illustrations, black & white tables, figures. BIC Classification: TGM. Category: (P) Professional & Vocational. Dimension: 245 x 169 x 30. Weight in Grams: 914. . 2008. 2nd Edition. Paperback. . . . .
Language: English
Published by John Wiley & Sons Inc, 2008
ISBN 10: 0470027851 ISBN 13: 9780470027851
Seller: THE SAINT BOOKSTORE, Southport, United Kingdom
US$ 79.64
Quantity: Over 20 available
Add to basketPaperback / softback. Condition: New. New copy - Usually dispatched within 4 working days.
Language: English
Published by John Wiley & Sons Inc, New York, 2008
ISBN 10: 0470027851 ISBN 13: 9780470027851
Seller: AussieBookSeller, Truganina, VIC, Australia
Paperback. Condition: new. Paperback. Microstructural characterization is usually achieved by allowing some form of probe to interact with a carefully prepared specimen. The most commonly used probes are visible light, X-ray radiation, a high-energy electron beam, or a sharp, flexible needle. These four types of probe form the basis for optical microscopy, X-ray diffraction, electron microscopy, and scanning probe microscopy. Microstructural Characterization of Materials, 2nd Edition is an introduction to the expertise involved in assessing the microstructure of engineering materials and to the experimental methods used for this purpose. Similar to the first edition, this 2nd edition explores the methodology of materials characterization under the three headings of crystal structure, microstructural morphology, and microanalysis. The principal methods of characterization, including diffraction analysis, optical microscopy, electron microscopy, and chemical microanalytical techniques are treated both qualitatively and quantitatively. An additional chapter has been added to the new edition to cover surface probe microscopy, and there are new sections on digital image recording and analysis, orientation imaging microscopy, focused ion-beam instruments, atom-probe microscopy, and 3-D image reconstruction. As well as being fully updated, this second edition also includes revised and expanded examples and exercises, with a solutions manual available at Microstructural Characterization of Materials, 2nd Edition will appeal to senior undergraduate and graduate students of material science, materials engineering, and materials chemistry, as well as to qualified engineers and more advanced researchers, who will find the book a useful and comprehensive general reference source. Microstructural characterization is usually achieved by allowing some form of probe to interact with a carefully prepared specimen. The most commonly used probes are visible light, X-ray radiation, a high-energy electron beam, or a sharp, flexible needle. Shipping may be from our Sydney, NSW warehouse or from our UK or US warehouse, depending on stock availability.
Language: English
Published by John Wiley & Sons Inc, 2008
ISBN 10: 0470027851 ISBN 13: 9780470027851
Seller: Kennys Bookstore, Olney, MD, U.S.A.
Condition: New. Microstructural characterization is usually achieved by allowing some form of probe to interact with a carefully prepared specimen. The most commonly used probes are visible light, X-ray radiation, a high-energy electron beam, or a sharp, flexible needle. Num Pages: 550 pages, black & white illustrations, colour illustrations, black & white tables, figures. BIC Classification: TGM. Category: (P) Professional & Vocational. Dimension: 245 x 169 x 30. Weight in Grams: 914. . 2008. 2nd Edition. Paperback. . . . . Books ship from the US and Ireland.
Language: English
Published by John Wiley & Sons Inc, New York, 2008
ISBN 10: 0470027851 ISBN 13: 9780470027851
Seller: CitiRetail, Stevenage, United Kingdom
US$ 68.85
Quantity: 1 available
Add to basketPaperback. Condition: new. Paperback. Microstructural characterization is usually achieved by allowing some form of probe to interact with a carefully prepared specimen. The most commonly used probes are visible light, X-ray radiation, a high-energy electron beam, or a sharp, flexible needle. These four types of probe form the basis for optical microscopy, X-ray diffraction, electron microscopy, and scanning probe microscopy. Microstructural Characterization of Materials, 2nd Edition is an introduction to the expertise involved in assessing the microstructure of engineering materials and to the experimental methods used for this purpose. Similar to the first edition, this 2nd edition explores the methodology of materials characterization under the three headings of crystal structure, microstructural morphology, and microanalysis. The principal methods of characterization, including diffraction analysis, optical microscopy, electron microscopy, and chemical microanalytical techniques are treated both qualitatively and quantitatively. An additional chapter has been added to the new edition to cover surface probe microscopy, and there are new sections on digital image recording and analysis, orientation imaging microscopy, focused ion-beam instruments, atom-probe microscopy, and 3-D image reconstruction. As well as being fully updated, this second edition also includes revised and expanded examples and exercises, with a solutions manual available at Microstructural Characterization of Materials, 2nd Edition will appeal to senior undergraduate and graduate students of material science, materials engineering, and materials chemistry, as well as to qualified engineers and more advanced researchers, who will find the book a useful and comprehensive general reference source. Microstructural characterization is usually achieved by allowing some form of probe to interact with a carefully prepared specimen. The most commonly used probes are visible light, X-ray radiation, a high-energy electron beam, or a sharp, flexible needle. Shipping may be from our UK warehouse or from our Australian or US warehouses, depending on stock availability.
paperback. Condition: New. In shrink wrap. Looks like an interesting title!
Brand new book. Fast ship. Please provide full street address as we are not able to ship to P O box address.
Language: English
Published by John Wiley & Sons Inc, 2008
ISBN 10: 0470027851 ISBN 13: 9780470027851
Seller: Revaluation Books, Exeter, United Kingdom
US$ 138.24
Quantity: 2 available
Add to basketPaperback. Condition: Brand New. 2nd edition. 536 pages. 10.00x6.50x1.25 inches. In Stock.