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Microstructural Characterization Materials by Brandon David (32 results)
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Condition: New. pp. 550.
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Condition: New. pp. 550.
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Microstructural Characterization of Materials
Seller: World of Books (was SecondSale), Montgomery, IL, U.S.A.
Seller rating 5 out of 5 stars
Condition: Good. Item in good condition. Textbooks may not include supplemental items i.e. CDs, access codes etc.
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Microstructural Characterization of Materials
Language: English
Published by Wiley & Sons, Incorporated, John, 2008
ISBN 10: 0470027851 ISBN 13: 9780470027851
Condition: Good. Pages intact with minimal writing/highlighting. The binding may be loose and creased. Dust jackets/supplements are not included. Stock photo provided. Product includes identifying sticker. Better World Books: Buy Books. Do Good.
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Condition: New. This is a Brand-new US Edition. This Item may be shipped from US or any other country as we have multiple locations worldwide.
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Condition: New. Brand New Original US Edition. Customer service! Satisfaction Guaranteed.
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Condition: New. pp. 550.
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US$ 30.77
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Ships from United Kingdom to U.S.A.Quantity: 1 available
Add to basketCondition: Poor. This is an ex-library book and may have the usual library/used-book markings inside.This book has soft covers. In poor condition, suitable as a reading copy. Please note the Image in this listing is a stock photo and may not match the covers of the actual item,750grams, ISBN:9780471985020.
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Microstructural Characterization of Materials.
Seller: Plurabelle Books Ltd, Cambridge, United Kingdom
Association Member: GIAQ
Seller rating 5 out of 5 stars
US$ 51.85
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Ships from United Kingdom to U.S.A.Quantity: 1 available
Add to basketHardcover. Condition: Very Good. xiii 409p large hardback, appendices, index, bibliography, examples, illustrations, as new, a clean and fresh copy Language: English.
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Condition: New.
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Microstructural Characterization of Materials (Paperback)
Language: English
Published by John Wiley & Sons Inc, New York, 2008
ISBN 10: 0470027851 ISBN 13: 9780470027851
Paperback. Condition: new. Paperback. Microstructural characterization is usually achieved by allowing some form of probe to interact with a carefully prepared specimen. The most commonly used probes are visible light, X-ray radiation, a high-energy electron beam, or a sharp, flexible needle. These four types of probe form the basis for optical microscopy, X-ray diffraction, electron microscopy, and scanning probe microscopy. Microstructural Characterization of Materials, 2nd Edition is an introduction to the expertise involved in assessing the microstructure of engineering materials and to the experimental methods used for this purpose. Similar to the first edition, this 2nd edition explores the methodology of materials characterization under the three headings of crystal structure, microstructural morphology, and microanalysis. The principal methods of characterization, including diffraction analysis, optical microscopy, electron microscopy, and chemical microanalytical techniques are treated both qualitatively and quantitatively. An additional chapter has been added to the new edition to cover surface probe microscopy, and there are new sections on digital image recording and analysis, orientation imaging microscopy, focused ion-beam instruments, atom-probe microscopy, and 3-D image reconstruction. As well as being fully updated, this second edition also includes revised and expanded examples and exercises, with a solutions manual available at Microstructural Characterization of Materials, 2nd Edition will appeal to senior undergraduate and graduate students of material science, materials engineering, and materials chemistry, as well as to qualified engineers and more advanced researchers, who will find the book a useful and comprehensive general reference source. Microstructural characterization is usually achieved by allowing some form of probe to interact with a carefully prepared specimen. The most commonly used probes are visible light, X-ray radiation, a high-energy electron beam, or a sharp, flexible needle. Shipping may be from multiple locations in the US or from the UK, depending on stock availability.
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Condition: As New. Unread book in perfect condition.
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Microstructural Characterization of Materials
Seller: PBShop.store UK, Fairford, GLOS, United Kingdom
Seller rating 4 out of 5 stars
US$ 65.44
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Ships from United Kingdom to U.S.A.Quantity: 15 available
Add to basketPAP. Condition: New. New Book. Shipped from UK. Established seller since 2000.
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Condition: new.
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Microstructural Characterization of Materials
Seller: Ria Christie Collections, Uxbridge, United Kingdom
Seller rating 5 out of 5 stars
US$ 68.31
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Microstructural Characterization of Materials
Seller: GreatBookPricesUK, Woodford Green, United Kingdom
Seller rating 5 out of 5 stars
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Microstructural Characterization of Materials
Seller: GreatBookPricesUK, Woodford Green, United Kingdom
Seller rating 5 out of 5 stars
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Add to basketCondition: As New. Unread book in perfect condition.
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Microstructural Characterization of Materials
Language: English
Published by John Wiley & Sons Inc, 2008
ISBN 10: 0470027851 ISBN 13: 9780470027851
Seller: Kennys Bookshop and Art Galleries Ltd., Galway, GY, Ireland
Seller rating 5 out of 5 stars
Condition: New. Microstructural characterization is usually achieved by allowing some form of probe to interact with a carefully prepared specimen. The most commonly used probes are visible light, X-ray radiation, a high-energy electron beam, or a sharp, flexible needle. Num Pages: 550 pages, black & white illustrations, colour illustrations, black & white tables, figures. BIC Classification: TGM. Category: (P) Professional & Vocational. Dimension: 245 x 169 x 30. Weight in Grams: 914. . 2008. 2nd Edition. Paperback. . . . .
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Microstructural Characterization of Materials
Language: English
Published by John Wiley & Sons Inc, 2008
ISBN 10: 0470027851 ISBN 13: 9780470027851
Seller: THE SAINT BOOKSTORE, Southport, United Kingdom
Seller rating 5 out of 5 stars
US$ 77.36
US$ 26.64 shipping
Ships from United Kingdom to U.S.A.Quantity: Over 20 available
Add to basketPaperback / softback. Condition: New. New copy - Usually dispatched within 4 working days.
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Microstructural Characterization of Materials (Paperback)
Language: English
Published by John Wiley & Sons Inc, New York, 2008
ISBN 10: 0470027851 ISBN 13: 9780470027851
Paperback. Condition: new. Paperback. Microstructural characterization is usually achieved by allowing some form of probe to interact with a carefully prepared specimen. The most commonly used probes are visible light, X-ray radiation, a high-energy electron beam, or a sharp, flexible needle. These four types of probe form the basis for optical microscopy, X-ray diffraction, electron microscopy, and scanning probe microscopy. Microstructural Characterization of Materials, 2nd Edition is an introduction to the expertise involved in assessing the microstructure of engineering materials and to the experimental methods used for this purpose. Similar to the first edition, this 2nd edition explores the methodology of materials characterization under the three headings of crystal structure, microstructural morphology, and microanalysis. The principal methods of characterization, including diffraction analysis, optical microscopy, electron microscopy, and chemical microanalytical techniques are treated both qualitatively and quantitatively. An additional chapter has been added to the new edition to cover surface probe microscopy, and there are new sections on digital image recording and analysis, orientation imaging microscopy, focused ion-beam instruments, atom-probe microscopy, and 3-D image reconstruction. As well as being fully updated, this second edition also includes revised and expanded examples and exercises, with a solutions manual available at Microstructural Characterization of Materials, 2nd Edition will appeal to senior undergraduate and graduate students of material science, materials engineering, and materials chemistry, as well as to qualified engineers and more advanced researchers, who will find the book a useful and comprehensive general reference source. Microstructural characterization is usually achieved by allowing some form of probe to interact with a carefully prepared specimen. The most commonly used probes are visible light, X-ray radiation, a high-energy electron beam, or a sharp, flexible needle. Shipping may be from our Sydney, NSW warehouse or from our UK or US warehouse, depending on stock availability.
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Microstructural Characterization of Materials
Language: English
Published by John Wiley & Sons Inc, 2008
ISBN 10: 0470027851 ISBN 13: 9780470027851
Condition: New. Microstructural characterization is usually achieved by allowing some form of probe to interact with a carefully prepared specimen. The most commonly used probes are visible light, X-ray radiation, a high-energy electron beam, or a sharp, flexible needle. Num Pages: 550 pages, black & white illustrations, colour illustrations, black & white tables, figures. BIC Classification: TGM. Category: (P) Professional & Vocational. Dimension: 245 x 169 x 30. Weight in Grams: 914. . 2008. 2nd Edition. Paperback. . . . . Books ship from the US and Ireland.
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Microstructural Characterization of Materials (Paperback)
Language: English
Published by John Wiley & Sons Inc, New York, 2008
ISBN 10: 0470027851 ISBN 13: 9780470027851
US$ 68.88
US$ 49.01 shipping
Ships from United Kingdom to U.S.A.Quantity: 1 available
Add to basketPaperback. Condition: new. Paperback. Microstructural characterization is usually achieved by allowing some form of probe to interact with a carefully prepared specimen. The most commonly used probes are visible light, X-ray radiation, a high-energy electron beam, or a sharp, flexible needle. These four types of probe form the basis for optical microscopy, X-ray diffraction, electron microscopy, and scanning probe microscopy. Microstructural Characterization of Materials, 2nd Edition is an introduction to the expertise involved in assessing the microstructure of engineering materials and to the experimental methods used for this purpose. Similar to the first edition, this 2nd edition explores the methodology of materials characterization under the three headings of crystal structure, microstructural morphology, and microanalysis. The principal methods of characterization, including diffraction analysis, optical microscopy, electron microscopy, and chemical microanalytical techniques are treated both qualitatively and quantitatively. An additional chapter has been added to the new edition to cover surface probe microscopy, and there are new sections on digital image recording and analysis, orientation imaging microscopy, focused ion-beam instruments, atom-probe microscopy, and 3-D image reconstruction. As well as being fully updated, this second edition also includes revised and expanded examples and exercises, with a solutions manual available at Microstructural Characterization of Materials, 2nd Edition will appeal to senior undergraduate and graduate students of material science, materials engineering, and materials chemistry, as well as to qualified engineers and more advanced researchers, who will find the book a useful and comprehensive general reference source. Microstructural characterization is usually achieved by allowing some form of probe to interact with a carefully prepared specimen. The most commonly used probes are visible light, X-ray radiation, a high-energy electron beam, or a sharp, flexible needle. Shipping may be from our UK warehouse or from our Australian or US warehouses, depending on stock availability.
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paperback. Condition: New. In shrink wrap. Looks like an interesting title!
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Microstructural Characterization of Materials 2e
Language: English
Published by John Wiley & Sons Inc, 2008
ISBN 10: 0470027851 ISBN 13: 9780470027851
US$ 138.51
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Add to basketPaperback. Condition: Brand New. 2nd edition. 536 pages. 10.00x6.50x1.25 inches. In Stock.
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US$ 56.98 10% off
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Ships from Germany to U.S.A.Quantity: 1 available
Add to basketCondition: Sehr gut. Zustand: Sehr gut | Seiten: 424 | Sprache: Englisch | Produktart: Bücher | Keine Beschreibung verfügbar.
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US$ 56.98 10% off
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Add to basketCondition: Gut. Zustand: Gut | Seiten: 424 | Sprache: Englisch | Produktart: Bücher | Keine Beschreibung verfügbar.
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Taschenbuch. Condition: Neu. Neuware - Microstructural characterization is usually achieved by allowing some form of probe to interact with a carefully prepared specimen. The most commonly used probes are visible light, X-ray radiation, a high-energy electron beam, or a sharp, flexible needle. These four types of probe form the basis for optical microscopy, X-ray diffraction, electron microscopy, and scanning probe microscopy.
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US$ 211.49
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Ships from United Kingdom to U.S.A.Quantity: 1 available
Add to basketHardcover. Condition: Like New. LIKE NEW. SHIPS FROM MULTIPLE LOCATIONS. book.
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US$ 246.96
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Add to baskethardcover. Condition: Like New. LIKE NEW. SHIPS FROM MULTIPLE LOCATIONS. book.
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Condition: very_good. This books is in Very good condition. There may be a few flaws like shelf wear and some light wear.
