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Gone Fishing: A Novel of Old Florida and Her Tragic Seas
Seller: Ria Christie Collections, Uxbridge, United Kingdom
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CMOS Gate-Stack Scaling ? Materials, Interfaces and Reliability Implications: Volume 1155 (MRS Proceedings)
Language: English
Published by Cambridge University Press, 2014
ISBN 10: 1107408326 ISBN 13: 9781107408326
Condition: New.
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CMOS Gate-Stack Scaling ? Materials, Interfaces and Reliability Implications: Volume 1155 (MRS Proceedings)
Language: English
Published by Cambridge University Press, 2014
ISBN 10: 1107408326 ISBN 13: 9781107408326
Seller: Ria Christie Collections, Uxbridge, United Kingdom
Seller rating 5 out of 5 stars
US$ 41.43
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Cmos GateStack Scaling - Materials, Interfaces and Reliability Implications: Volume 1155 (MRS Proceedings)
Language: English
Published by Cambridge University Press 2014-06-05, 2014
ISBN 10: 1107408326 ISBN 13: 9781107408326
US$ 38.48
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Cmos GateStack Scaling - Materials, Interfaces and Reliability Implications: Volume 1155 (MRS Proceedings)
Language: English
Published by Cambridge University Press, 2014
ISBN 10: 1107408326 ISBN 13: 9781107408326
Seller: Kennys Bookshop and Art Galleries Ltd., Galway, GY, Ireland
Seller rating 5 out of 5 stars
Condition: New.
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Cmos Gate-Stack Scaling Materials, Interfaces and Reliability Implications
Language: English
Published by Cambridge University Press CUP, 2014
ISBN 10: 1107408326 ISBN 13: 9781107408326
Condition: New. pp. 194.
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Cmos GateStack Scaling - Materials, Interfaces and Reliability Implications: Volume 1155 (MRS Proceedings)
Language: English
Published by Cambridge University Press, 2014
ISBN 10: 1107408326 ISBN 13: 9781107408326
Condition: New.
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PAP. Condition: New. New Book. Shipped from UK. THIS BOOK IS PRINTED ON DEMAND. Established seller since 2000.
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Gone Fishing A Novel of Old Florida and Her Tragic Seas
Seller: PBShop.store UK, Fairford, GLOS, United Kingdom
Seller rating 4 out of 5 stars
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Add to basketPAP. Condition: New. New Book. Delivered from our UK warehouse in 4 to 14 business days. THIS BOOK IS PRINTED ON DEMAND. Established seller since 2000.
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Condition: New. Print on Demand pp. 168 2:B&W 6 x 9 in or 229 x 152 mm Perfect Bound on Creme w/Gloss Lam.
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CMOS Gate-Stack Scaling Materials, Interfaces and Reliability Implications : Volume 1155
Language: English
Published by Cambridge University Press, 2014
ISBN 10: 1107408326 ISBN 13: 9781107408326
Taschenbuch. Condition: Neu. Druck auf Anfrage Neuware - Printed after ordering - To address the increasing demands of device scaling, new materials are being introduced into conventional Si CMOS processing at an unprecedented rate. Presentations collected here focus on understanding, from a chemistry and materials perspective, the mechanism of interface formation and defects at interfaces, for both conventional Si and alternative channel (Ge or III-V) systems. Several papers address reliability concerns for high-k/metal gate (basic physical models, charge trapping, etc.), while others cover characterization of the thin films and interfaces which comprise the gate stack. Topics include: advanced Si-based gate stacks; and alternate channel materials.
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Condition: New. Print on Demand pp. 168.
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Cmos Gate-stack Scaling Materials, Interfaces and Reliability Implications : Symposium Held April 14-16, 2009, San Francisco, California, U.s.a.
Language: English
Published by Cambridge University Press, 2009
ISBN 10: 1605111287 ISBN 13: 9781605111285
Condition: New.
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CMOS Gate-Stack Scaling ? Materials, Interfaces and Reliability Implications: Volume 1155 (MRS Proceedings)
Language: English
Published by Cambridge University Press, 2009
ISBN 10: 1605111287 ISBN 13: 9781605111285
Condition: New.
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Gardens of Georgia [Savannah and the Coast --- Coastal Georgia -- The Piedmont plateau -- South Georgia -- Atlanta and North Georgia -- Index of Gardens -- Sources for quoted material -- Bibliography
Language: English
Published by Atlanta : Peachtree Publishers : Garden Club of Georgia, c1989., 1989
ISBN 10: 0934601763 ISBN 13: 9780934601764
Seller: Joseph Valles - Books, Stockbridge, GA, U.S.A.
Seller rating 5 out of 5 stars
First Edition
Hardcover. Condition: Fine. Dust Jacket Condition: Fine. 1st Edition. [1st edition, 1st printing; trade edition ] ; ix, 214 p. : ill. (chiefly col.) ; 31 cm. ; ISBN 9780934601764, 9780934601771, 0934601763, 0934601771 ; OCLC 20012286 ; LCCN 89016100 ; LC SB466.U65 G46 1989 ; Dewey 712/.09758 ; sand-colored cloth in color photographic dustjacket ; Contents: Savannah and the Coast --- Coastal Georgia -- The Piedmont plateau -- South Georgia -- Atlanta and North Georgia -- Index of Gardens -- Sources for quoted material -- Bibliography ; Graced with one of the longest growing seasons in North America, Georgia has a rich and interesting tradition of gardens and gardening. That tradition is vividly portrayed in Gardens of Georgia, commissioned by the Garden Club of Georgia, Inc., to commemorate its sixtieth anniversary and to celebrate the heritage and beauty of Georgia's gardens.As noted by Georgia founder James Oglethorpe in 1732, Georgia has a happy climate. From the broad-shouldered mountains of the Blue Ridge, through the red clay of the rolling piedmont, across the sprawling piney coastal plain, and on to the subtropical islands on the Atlantic, Georgia is blessed with four regions of gardening opportunities, distinctly defined by differences in elevation, climate, soil, and natural vegetation.Writer William Mitchell and photographer Richard Moore have portrayed the wonders of gardens historic and contemporary, public and private, and urban, suburban, and rural from each of these regions. Whether illustrating overall gardenscapes or capturing intimate vignettes and individual blossoms, Richard Moore's photographs have a depth of color and clarity of detail that immerse the reader into a world of delightful splendor. The text by Willaim Mitchell not only describes the settings as they are today, but also spins a rich background of history in the context of the botanical Eden observed by early explorers.The richest legacy of each generation is to preserve and protect an always vulnerable natural environment and help nature bring forth its green and glowing cycles of rebirth. Gardens of Georgia celebrates that legacy, sharing the ongoing dream of paradise--a new Eden--whether it is in a grand formal garden from an earlier era or a small plot of perennials in a Georgia yard. ; FINE/FINE. Book.
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CMOS Gate-Stack Scaling ? Materials, Interfaces and Reliability Implications: Volume 1155 (MRS Proceedings)
Language: English
Published by Cambridge University Press, 2009
ISBN 10: 1605111287 ISBN 13: 9781605111285
Seller: Ria Christie Collections, Uxbridge, United Kingdom
Seller rating 5 out of 5 stars
US$ 139.96
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Cmos Gate-stack Scaling Materials, Interfaces and Reliability Implications : Symposium Held April 14-16, 2009, San Francisco, California, U.s.a.
Language: English
Published by Cambridge University Press, 2009
ISBN 10: 1605111287 ISBN 13: 9781605111285
Seller: GreatBookPricesUK, Woodford Green, United Kingdom
Seller rating 5 out of 5 stars
US$ 139.95
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Condition: New. PRINT ON DEMAND pp. 168.
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Cmos Gate-stack Scaling - Materials, Interfaces and Reliability Implications: Volume 1155
Language: English
Published by Materials Research Society, 2009
ISBN 10: 1605111287 ISBN 13: 9781605111285
Seller: Kennys Bookshop and Art Galleries Ltd., Galway, GY, Ireland
Seller rating 5 out of 5 stars
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Add to basketCondition: New. The MRS Symposium Proceeding series is an internationally recognised reference suitable for researchers and practitioners. Editor(s): Demkov, Alexander A. (Freescale Semiconductor Inc., Austin, Texas); Taylor, Bill; Harris, H. Rusty; Butterbaugh, Jeffery W.; Rachmady, Willy. Series: MRS Proceedings. Num Pages: 194 pages, Illustrations. BIC Classification: TGM. Category: (U) Tertiary Education (US: College). Dimension: 228 x 152 x 13. Weight in Grams: 430. . 2009. Hardback. . . . .
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Cmos Gate-Stack Scaling-- Materials, Interfaces and Reliability Implications
Language: English
Published by Materials Research Society, 2009
ISBN 10: 1605111287 ISBN 13: 9781605111285
Condition: New. pp. viii + 179.
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Cmos Gate-stack Scaling Materials, Interfaces and Reliability Implications: Symposium Held April 14-16, 2009, San Francisco, California, U.s.a.: Vol 1155
Language: English
Published by Materials Research Society, 2009
ISBN 10: 1605111287 ISBN 13: 9781605111285
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Add to basketHardcover. Condition: Brand New. 194 pages. 9.13x6.30x0.79 inches. In Stock.
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Cmos Gate-stack Scaling Materials, Interfaces and Reliability Implications : Symposium Held April 14-16, 2009, San Francisco, California, U.s.a.
Language: English
Published by Cambridge University Press, 2009
ISBN 10: 1605111287 ISBN 13: 9781605111285
Seller: GreatBookPricesUK, Woodford Green, United Kingdom
Seller rating 5 out of 5 stars
US$ 184.31
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Cmos Gate-stack Scaling - Materials, Interfaces and Reliability Implications: Volume 1155
Language: English
Published by Materials Research Society, 2009
ISBN 10: 1605111287 ISBN 13: 9781605111285
Condition: New. The MRS Symposium Proceeding series is an internationally recognised reference suitable for researchers and practitioners. Editor(s): Demkov, Alexander A. (Freescale Semiconductor Inc., Austin, Texas); Taylor, Bill; Harris, H. Rusty; Butterbaugh, Jeffery W.; Rachmady, Willy. Series: MRS Proceedings. Num Pages: 194 pages, Illustrations. BIC Classification: TGM. Category: (U) Tertiary Education (US: College). Dimension: 228 x 152 x 13. Weight in Grams: 430. . 2009. Hardback. . . . . Books ship from the US and Ireland.
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CMOS Gate-Stack Scaling - Materials, Interfaces and Reliability Implications: Volume 1155 (MRS Proceedings)
Language: English
Published by Cambridge University Press, 2009
ISBN 10: 1605111287 ISBN 13: 9781605111285
US$ 173.24
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Cmos Gate-stack Scaling Materials, Interfaces and Reliability Implications : Symposium Held April 14-16, 2009, San Francisco, California, U.s.a.
Language: English
Published by Cambridge University Press, 2009
ISBN 10: 1605111287 ISBN 13: 9781605111285
Condition: As New. Unread book in perfect condition.
-
CMOS Gate-Stack Scaling - Materials, Interfaces and Reliability Implications
Language: English
Published by Cambridge University Press, 2009
ISBN 10: 1605111287 ISBN 13: 9781605111285
Buch. Condition: Neu. Druck auf Anfrage Neuware - Printed after ordering - To address the increasing demands of device scaling, new materials are being introduced into conventional Si CMOS processing at an unprecedented rate. Presentations collected here focus on understanding, from a chemistry and materials perspective, the mechanism of interface formation and defects at interfaces, for both conventional Si and alternative channel (Ge or III-V) systems. Several papers address reliability concerns for high-k/metal gate (basic physical models, charge trapping, etc.), while others cover characterization of the thin films and interfaces which comprise the gate stack. Topics include: advanced Si-based gate stacks; and alternate channel materials.
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CMOS Gate-Stack Scaling Materials, Interfaces and Reliability Implications: Volume 1155 (Paperback)
Language: English
Published by Cambridge University Press, Cambridge, 2014
ISBN 10: 1107408326 ISBN 13: 9781107408326
Paperback. Condition: new. Paperback. To address the increasing demands of device scaling, new materials are being introduced into conventional Si CMOS processing at an unprecedented rate. Presentations collected here focus on understanding, from a chemistry and materials perspective, the mechanism of interface formation and defects at interfaces, for both conventional Si and alternative channel (Ge or III-V) systems. Several papers address reliability concerns for high-k/metal gate (basic physical models, charge trapping, etc.), while others cover characterization of the thin films and interfaces which comprise the gate stack. Topics include: advanced Si-based gate stacks; and alternate channel materials. The MRS Symposium Proceeding series is an internationally recognised reference suitable for researchers and practitioners. This item is printed on demand. Shipping may be from multiple locations in the US or from the UK, depending on stock availability.
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CMOS Gate-Stack Scaling â" Materials, Interfaces and Reliability Implications: Volume 1155
Language: English
Published by Cambridge University Press, 2014
ISBN 10: 1107408326 ISBN 13: 9781107408326
US$ 39.77
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Add to basketPaperback. Condition: Brand New. 1st edition. 194 pages. 9.02x5.98x0.39 inches. In Stock. This item is printed on demand.
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CMOS Gate-Stack Scaling - Materials, Interfaces and Reliability Implications: Volume 1155
Language: English
Published by Cambridge University Press, 2014
ISBN 10: 1107408326 ISBN 13: 9781107408326
Seller: THE SAINT BOOKSTORE, Southport, United Kingdom
Seller rating 5 out of 5 stars
US$ 46.39
US$ 18.10 shipping
Ships from United Kingdom to U.S.A.Quantity: Over 20 available
Add to basketPaperback / softback. Condition: New. This item is printed on demand. New copy - Usually dispatched within 5-9 working days.
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Cmos Gate-Stack Scaling Materials, Interfaces and Reliability Implications
Language: English
Published by Cambridge University Press, 2014
ISBN 10: 1107408326 ISBN 13: 9781107408326
Condition: New. Print on Demand pp. 194.
