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Frontiers in Electronic Testing (973 results)
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Hardcover. Condition: Good. Connecting readers with great books since 1972! Used textbooks may not include companion materials such as access codes, etc. May have some wear or writing/highlighting. We ship orders daily and Customer Service is our top priority!
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hardcover. Condition: Good. Cover has a few edge scuffs and light wear. Used sticker on spine and rear. Text unmarked. Ships Next Business Day.
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Hardcover. Condition: Good. Connecting readers with great books since 1972! Used textbooks may not include companion materials such as access codes, etc. May have some wear or writing/highlighting. We ship orders daily and Customer Service is our top priority!
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Hardcover. Condition: Very Good. No Jacket. May have limited writing in cover pages. Pages are unmarked. ~ ThriftBooks: Read More, Spend Less.
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Condition: Fine. Used book that is in almost brand-new condition.
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Condition: Good. Former library book; may include library markings. Used book that is in clean, average condition without any missing pages.
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Design for AT-Speed Test, Diagnosis and Measurement (Frontiers in Electronic Testing, 15)
Book 37 of 40: Frontiers in Electronic TestingSeller: Bay State Book Company, North Smithfield, RI, U.S.A.
Seller rating 5 out of 5 stars
Condition: good. The book is in good condition with all pages and cover intact, including the dust jacket if originally issued. The spine may show light wear. Pages may contain some notes or highlighting, and there might be a "From the library of" label. Boxed set packaging, shrink wrap, or included media like CDs may be missing.
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Design for AT-Speed Test, Diagnosis and Measurement (Frontiers in Electronic Testing, 15)
Book 37 of 40: Frontiers in Electronic TestingSeller: Goodwill of Silicon Valley, SAN JOSE, CA, U.S.A.
Seller rating 4 out of 5 stars
Condition: good. Supports Goodwill of Silicon Valley job training programs. The cover and pages are in Good condition! Any other included accessories are also in Good condition showing use. Use can include some highlighting and writing, page and cover creases as well as other types visible wear.
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Design for AT-Speed Test, Diagnosis and Measurement (Frontiers in Electronic Testing, 15)
Book 37 of 40: Frontiers in Electronic TestingSeller: Goodwill of Silicon Valley, SAN JOSE, CA, U.S.A.
Seller rating 4 out of 5 stars
Condition: acceptable. Supports Goodwill of Silicon Valley job training programs. The cover and pages are in Acceptable condition! Any other included accessories are also in Acceptable condition showing use. Use can include some highlighting and writing, page and cover creases as well as other types visible wear such as cover tears discoloration, staining, marks, scuffs, etc. All pages intact.
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hardcover. Condition: As New. 2nd. Ships Out Tomorrow!
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Soft cover. Condition: New. ISBN:9788184892321,Territorial restriction maybe printed on the book. This is an Int'l edition, ISBN and cover may differ from US edition, Contents same as US edition.
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Soft cover. Condition: New. ISBN:9788184894295,Territorial restriction maybe printed on the book. This is an Int'l edition, ISBN and cover may differ from US edition, Contents same as US edition.
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International EditionDEFECT ORIENTED TESTING FOR NANO METRIC CMOS VLSI CIRCUITS
Book 18 of 40: Frontiers in Electronic TestingPublished by New Age International Publisher, 2010
ISBN 10: 8184894295 ISBN 13: 9788184894295
Language: English
Condition: New. Brand New. Soft Cover International Edition. Different ISBN and Cover Image. Priced lower than the standard editions which is usually intended to make them more affordable for students abroad. The core content of the book is generally the same as the standard edition. The country selling restrictions may be printed on the book but is no problem for the self-use. This Item maybe shipped from US or any other country as we have multiple locations worldwide.
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International Edition
EMBEDDED PROCESSOR BASED SELF TEST
Book 34 of 40: Frontiers in Electronic TestingPublished by New Age International Publisher, 2009
ISBN 10: 8184892322 ISBN 13: 9788184892321
Language: English
Condition: New. Brand New. Soft Cover International Edition. Different ISBN and Cover Image. Priced lower than the standard editions which is usually intended to make them more affordable for students abroad. The core content of the book is generally the same as the standard edition. The country selling restrictions may be printed on the book but is no problem for the self-use. This Item maybe shipped from US or any other country as we have multiple locations worldwide.
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DEFECT ORIENTED TESTING FOR NANO METRIC CMOS VLSI CIRCUITS
Book 18 of 40: Frontiers in Electronic TestingPublished by New Age International Publisher, 2010
ISBN 10: 8184894295 ISBN 13: 9788184894295
Language: English
Condition: New. Brand New, Softcover edition. This item may ship from the US or our Overseas warehouse depending on your location and stock availability.
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From Contamination to Defects, Faults and Yield Loss: Simulation and Applications (Frontiers in Electronic Testing)
Book 28 of 40: Frontiers in Electronic TestingSeller: Zubal-Books, Since 1961, Cleveland, OH, U.S.A.
Seller rating 5 out of 5 stars
Condition: Good. 150 pp., Hardcover, ex library else text clean and binding tight. - If you are reading this, this item is actually (physically) in our stock and ready for shipment once ordered. We are not bookjackers. Buyer is responsible for any additional duties, taxes, or fees required by recipient's country.
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EMBEDDED PROCESSOR BASED SELF TEST
Book 34 of 40: Frontiers in Electronic TestingPublished by New Age International Publisher, 2009
ISBN 10: 8184892322 ISBN 13: 9788184892321
Language: English
Condition: New. Brand New, Softcover edition. This item may ship from the US or our Overseas warehouse depending on your location and stock availability.
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Hardcover. Condition: Good. No Jacket. Pages can have notes/highlighting. Spine may show signs of wear. ~ ThriftBooks: Read More, Spend Less 0.85.
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Cmos Sram: Circuit Design And Parametric Test In Nano Scaled Technologies Process Aware Sram Design And Test
Book 21 of 40: Frontiers in Electronic TestingPublished by Springer Nature (Sie), 2011
ISBN 10: 8132202325 ISBN 13: 9788132202325
Language: English
Soft cover. Condition: New. ISBN:9788132202325.
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Hardcover. Condition: Good. Connecting readers with great books since 1972! Used textbooks may not include companion materials such as access codes, etc. May have some wear or writing/highlighting. We ship orders daily and Customer Service is our top priority!
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Hardcover. Condition: As New. Hardcover, no DJ as issued Free of any markings and no writing. Minor shelf-wear. For Additional Information or pictures, Please Inquire.
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Fault Diagnosis of Analog Integrated Circuits
Book 5 of 40: Frontiers in Electronic TestingPublished by Springer Nature (Sie), 2008
ISBN 10: 8181288629 ISBN 13: 9788181288622
Language: English
Soft cover. Condition: New. ISBN:9788181288622.
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Hardcover. Condition: Used: Good. 2003 hardcover no dj as issued xlibrary copy withdrawn stamp on edge of pages/ in book clean text 178 pages::: J-10.
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Delay Fault Testing for VLSI Circuits
Book 31 of 40: Frontiers in Electronic TestingPublished by Kluwer Academic Pub, Boston, 1998
ISBN 10: 0792382951 ISBN 13: 9780792382959
Language: English
Hardcover. Condition: Very Fine. First Edition. A very clean, unmarked copy.
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International Edition
Paperback. Condition: New. Brand New! Fast Delivery This is an International Edition and ship within 24-48 hours. Deliver by FedEx and Dhl, & Aramex, UPS, & USPS and we do accept APO and PO BOX Addresses. Order can be delivered worldwide within 7-10 days and we do have flat rate for up to 2LB. Extra shipping charges will be requested if the Book weight is more than 5 LB. This Item May be shipped from India, United states & United Kingdom. Depending on your location and availability.
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International Edition
Paperback. Condition: New. Brand New! Fast Delivery This is an International Edition and ship within 24-48 hours. Deliver by FedEx and Dhl, & Aramex, UPS, & USPS and we do accept APO and PO BOX Addresses. Order can be delivered worldwide within 7-10 days and we do have flat rate for up to 2LB. Extra shipping charges will be requested if the Book weight is more than 5 LB. This Item May be shipped from India, United states & United Kingdom. Depending on your location and availability.
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Fault-Tolerance Techniques for SRAM-Based FPGAs
Book 16 of 40: Frontiers in Electronic TestingSeller: PBShop.store UK, Fairford, GLOS, United Kingdom
Seller rating 5 out of 5 stars
HRD. Condition: Used - Very Good. Used - Like New Book. Shipped from UK. Established seller since 2000.
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Introduction to Advanced System-on-Chip Test Design and Optimization.
Book 7 of 40: Frontiers in Electronic TestingSeller: books4less (Versandantiquariat Petra Gros GmbH & Co. KG), Welling, Germany
Seller rating 5 out of 5 stars
gebundene Ausgabe. Condition: Gut. 388 Seiten; Das hier angebotene Buch stammt aus einer teilaufgelösten wissenschaftlichen Bibliothek und trägt die entsprechenden Kennzeichnungen (Rückenschild, Instituts-Stempel.); Schnitt und Einband sind etwas staubschmutzig; der Buchzustand ist ansonsten ordentlich und dem Alter entsprechend gut. Text in ENGLISCHER Sprache! Sprache: Englisch Gewicht in Gramm: 860.
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hardcover. Condition: Very Good. Pages are crisp and clean, no marking. Cover is verygood. Binding is tight/good.
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Power-Constrained Testing of VLSI Circuits (Frontiers in Electronic Testing)
Book 11 of 40: Frontiers in Electronic TestingSeller: Zubal-Books, Since 1961, Cleveland, OH, U.S.A.
Seller rating 5 out of 5 stars
Condition: Good. 178 pp., Hardcover, ex library else text clean and binding tight. - If you are reading this, this item is actually (physically) in our stock and ready for shipment once ordered. We are not bookjackers. Buyer is responsible for any additional duties, taxes, or fees required by recipient's country.
