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Vlsi Test Principles Architectures by Wang Laung Terng (13 results)
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Hardcover. Condition: Acceptable. Connecting readers with great books since 1972. Used textbooks may not include companion materials such as access codes, etc. May have condition issues including wear and notes/highlighting. We ship orders daily and Customer Service is our top priority!
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VLSI Test Principles and Architectures: Design for Testability (Morgan Kaufmann Series in Systems on Silicon (Hardcover)).
Seller: Universitätsbuchhandlung Herta Hold GmbH, Berlin, Germany
Association Member: GIAQ ILAB VDA
Seller rating 5 out of 5 stars
First Edition
US$ 19.17
Convert currencyUS$ 34.90 shipping from Germany to U.S.A.Quantity: 1 available
Add to basket1st ed. 21 x 24 cm. 808 pages. Hardcover. Versand aus Deutschland / We dispatch from Germany via Air Mail. Einband bestoßen, daher Mängelexemplar gestempelt, sonst sehr guter Zustand. Imperfect copy due to slightly bumped cover, apart from this in very good condition. Stamped. Sprache: Englisch.
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US$ 48.72
Convert currencyUS$ 29.08 shipping from Germany to U.S.A.Quantity: 1 available
Add to basketCondition: Gut. 777 S. Einband hinten leicht eingedrückt. Schnitt unten dezent fleckig. Mit Bibliothek-Stempel. 518 Sprache: Englisch Gewicht in Gramm: 1800 Gebundene Ausgabe, Maße: 20.62 cm x 5.23 cm x 23.83 cm.
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VLSI Test Principles and Architectures,: Design for Testability (Systems on Silicon)
Published by Morgan Kaufmann 2006-08-14, 2006
ISBN 10: 0123705975 ISBN 13: 9780123705976
Language: English
US$ 78.85
Convert currencyUS$ 20.73 shipping from United Kingdom to U.S.A.Quantity: Over 20 available
Add to basketHardcover. Condition: New.
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US$ 89.85
Convert currencyUS$ 8.70 shipping from United Kingdom to U.S.A.Quantity: 3 available
Add to basketCondition: New. pp. xxx + 777 Illus.
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Condition: New. pp. xxx + 777.
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US$ 93.06
Convert currencyUS$ 33.46 shipping from United Kingdom to U.S.A.Quantity: 2 available
Add to basketHardcover. Condition: Brand New. 1st edition. 777 pages. 9.25x7.50x2.00 inches. In Stock.
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US$ 119.51
Convert currencyUS$ 11.58 shipping from Germany to U.S.A.Quantity: 3 available
Add to basketCondition: New. pp. xxx + 777.
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Hardcover. Condition: new. Excellent Condition.Excels in customer satisfaction, prompt replies, and quality checks.
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hardcover. Condition: New. In shrink wrap. Looks like an interesting title!
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US$ 134.01
Convert currencyUS$ 33.46 shipping from United Kingdom to U.S.A.Quantity: 1 available
Add to basketPaperback. Condition: Brand New. 1st edition. 808 pages. 9.35x7.50x1.83 inches. In Stock.
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VLSI Test Principles and Architectures: Design for Testability
Published by Morgan Kaufmann Publishers, 2006
ISBN 10: 1493300865 ISBN 13: 9781493300860
Language: English
US$ 271.55
Convert currencyUS$ 33.46 shipping from United Kingdom to U.S.A.Quantity: 1 available
Add to basketPaperback. Condition: New. New. book.
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US$ 82.09
Convert currencyUS$ 15.71 shipping from Italy to U.S.A.Quantity: Over 20 available
Add to basketCondition: new. Questo è un articolo print on demand.
